Faculty Profiles - HASEGAWA, Kazunori

Papers - HASEGAWA, Kazunori

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A testing method for evaluating shoot-through immunity of IGBTs in an inverter Reviewed

Hasegawa K., Abe S., Tsukuda M., Omura I., Ninomiya T.

Microelectronics Reliability 126 2021.11

Evaluation Techniques of Aluminum Electrolytic Capacitors for High-Frequency-Switching Power Converters

HASEGAWA Kazunori

The Journal of The Institute of Electrical Engineers of Japan ( The Institute of Electrical Engineers of Japan ) 141 ( 10 ) 630 - 632 2021.10

Shoot-through protection for an inverter consisting of the next-generation IGBTs with gate impedance reduction Reviewed

Hasegawa K., Abe S., Tsukuda M., Omura I., Ninomiya T.

Microelectronics Reliability 114 2020.11

Output-Current Measurement of a PWM Inverter with a Tiny PCB Rogowski Sensor Integrated into an IGBT Module Reviewed

Hasegawa K., Sho S., Tsukuda M., Omura I., Ichiki M., Kato T.

2019 IEEE Energy Conversion Congress and Exposition, ECCE 2019 5707 - 5711 2019.09

Self-Turn-on-Free 5V Gate Driving for 1200V Scaled IGBT Reviewed

Tsukuda M., Sudo M., Hasegawa K., Abe S., Saraya T., Takakura T., Fukui M., Itou K., Suzuki S., Takeuchi K., Ninomiya T., Hiramoto T., Omura I.

Proceedings of the International Symposium on Power Semiconductor Devices and ICs 2019-May 339 - 342 2019.05

Mutual inductance influence to switching speed and TDR measurements for separating self- and mutual inductances in the package Reviewed

Iida H., Hasegawa K., Omura I.

Proceedings of the International Symposium on Power Semiconductor Devices and ICs 2019-May 503 - 506 2019.05

Analog Basis, Low-Cost Inverter Output Current Sensing with Tiny PCB Coil Implemented inside IPM Reviewed

Bayarkhuu B., Bat-Ochir B., Hasegawa K., Tsukuda M., Dugarjav B., Omura I.

Proceedings of the International Symposium on Power Semiconductor Devices and ICs 2019-May 251 - 254 2019.05

A Condition-Monitoring Method of DC-Link Capacitors Used in a High-Power Three-Phase PWM Inverter with an Evaluation Circuit Reviewed International journal

Hasegawa Kazunori, Nishizawa Shin-ichi, Omura Ichiro

IEEJ Journal of Industry Applications ( The Institute of Electrical Engineers of Japan ) 8 ( 3 ) 480 - 487 2019.01

Authorship：Lead author,　Corresponding author Language：English Publishing type：Research paper (scientific journal)

<p>This paper presents a condition-monitoring method of dc-link capacitors used in a high-power three-phase PWM inverter with an evaluation circuit intended for ageing tests. Although its power rating is 1/25 of the inverter, the evaluation circuit provides the equivalent ripple current waveform and dc-bias voltage to the high-power inverter. The monitoring method independently extracts the capacitance and ESR of the dc-link capacitor, where the fast Fourier transform is introduced to the ripple current waveform and the dc-link voltage of the evaluation circuit. Experimental results verify that the monitoring method obtains both the ESR and capacitance changes of a capacitor under test.</p>

DOI： 10.1541/ieejjia.8.480

Scopus

CiNii Article

CiNii Research

Other Link： https://ci.nii.ac.jp/naid/130007641615

Calorimetric Power-Loss Measurement of a High-Power Film Capacitor with Actual Ripple Current Generated by a PWM Inverter Reviewed

Hasegawa K., Omura I.

2018 IEEE Energy Conversion Congress and Exposition, ECCE 2018 4688 - 4691 2018.12

An Evaluation Circuit for DC-Link Capacitors Used in a High-Power Three-Phase Inverter with Condition Monitoring Invited Reviewed

Hasegawa K., Omura I., Nishizawa S.I.

2018 International Power Electronics Conference, IPEC-Niigata - ECCE Asia 2018 1938 - 1942 2018.10

Bias voltage criteria of gate shielding effect for protecting IGBTs from shoot-through phenomena Reviewed

Tsukuda M., Abe S., Hasegawa K., Ninomiya T., Omura I.

Microelectronics Reliability 88-90 482 - 485 2018.09

ESR and capacitance monitoring of a dc-link capacitor used in a three-phase PWM inverter with a front-end diode rectifier Reviewed International journal

Hasegawa K., Nishizawa S., Omura I.

Microelectronics Reliability 88-90 433 - 437 2018.09

Envelop tracking based embedded current measurement for monitoring of IGBT and power converter system Reviewed

Bat-Ochir B.O., Bayarkhuu B., Hasegawa K., Tsukuda M., Dugarjav B., Omura I.

Microelectronics Reliability 88-90 500 - 504 2018.09

DC-bias-voltage dependence of degradation of aluminum electrolytic capacitors Reviewed International journal

Hasegawa K., Tsuzaki K., Nishizawa S.

Microelectronics Reliability 83 115 - 118 2018.04

Modelling of the shoot-through phenomenon introduced by the next generation IGBT in inverter applications Reviewed

Abe S., Hasegawa K., Tsukuda M., Wada K., Omura I., Ninomiya T.

Microelectronics Reliability 76-77 465 - 469 2017.09

Clamp type built-in current sensor using PCB in high-voltage power modules Reviewed

Tsukuda M., Nakashima K., Tabata S., Hasegawa K., Omura I.

Microelectronics Reliability 76-77 517 - 521 2017.09

A new output current measurement method with tiny PCB sensors capable of being embedded in an IGBT module Reviewed

32 ( 3 ) 1707 - 1712 2017.03

New power module integrating output current measurement function Reviewed

Tabata S., Hasegawa K., Tsukuda M., Omura I.

Proceedings of the International Symposium on Power Semiconductor Devices and ICs 267 - 270 2017.01

An evaluation circuit for DC-link capacitors used in a single- phase PWM inverter Reviewed

Hasegawa K., Omura I., Nishizawa S.

PCIM Europe 2017 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management 2017.01

Temperature rise measurement for power-loss comparison of an aluminum electrolytic capacitor between sinusoidal and square-wave current injections Reviewed

64 98 - 100 2016.09

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Papers - HASEGAWA, Kazunori