研究者詳細 - 松嶋　徹

論文 - 松嶋　徹

分割表示117 件中 81 - 100 件目／全件表示 >>

Analysis of dispersion splitting on light line by characteristic roots of retarded circuit equation 査読有り

Nakata R., Hisakado T., Matsushima T., Wada O.

Progress in Electromagnetics Research Symposium 2017-November 2405 - 2409 2017年11月

記述言語：英語掲載種別：研究論文（国際会議プロシーディングス）

© 2018 Electromagnetics Academy. All rights reserved. To design electromagnetic phenomena in complex metallic structures such as metamaterials, it is useful to analyze them by equivalent circuit models. Although general equivalent circuit models do not have retardations of electromagnetic couplings, the model derived theoretically from Maxwell's equation includes the retardation. The retardation causes the singularity on the light line of the dispersion curve. In order to find the dispersion curve, we usually pick up the most dominant root in the infinite characteristic roots. However, considering the other characteristic roots, we find another dispersion curve and clarify the coupling between the light line and plasmonic modes.

DOI： 10.1109/PIERS-FALL.2017.8293540

Scopus

その他リンク： https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85045349759&origin=inward

Comparison of voltage sources with current sources on unbalanced differential microstrip line 査読有り

Saito H., Matsushima T., Hisakado T., Wada O.

2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE 2017, EMC Europe 2017 2017年11月

記述言語：英語掲載種別：研究論文（国際会議プロシーディングス）

© 2017 IEEE. Now voltage sources are widely used for differential signaling. However, a common mode current is excited in unbalance differential transmission line. In this paper, common-mode excitation by differential current sources is compared with that by differential voltage sources in the unbalanced differential transmission line. A equivalent circuit describing the differential transmission line are used for evaluation of common mode current generated by the differential voltage or current sources. As a result, by using the current sources, the primary common mode current can be reduced by about 15 dB at 100 MHz than that of the voltage sources.

DOI： 10.1109/EMCEurope.2017.8094707

Scopus

その他リンク： https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85040541005&origin=inward

TDR measurement with utility-pole-interval resolution of real-scale distribution system 査読有り

Oe S., Sasaoka T., Matsushima T., Hisakado T., Wada O.

CIRED - Open Access Proceedings Journal 2017 ( 1 ) 1504 - 1507 2017年10月

記述言語：英語掲載種別：研究論文（国際会議プロシーディングス）

© 2017 The Institution of Engineering and Technology. All rights reserved. A new method for locating fault point by injecting high-frequency short pulse into overhead distribution line is attempted in this study. This method, which is called as time-domain reflectometry (TDR) measurement, enables to find the fault point easily by measuring propagation time of the pulse reflected due to the impedance change at the fault point. In a prior research, propagation characteristics of injected pulse through the experiment in test circuit have been confirmed. In this study, the result of the experiment on TDR measurement in real-scale distribution system has been explained. As a result, application of the method in real-scale distribution system has been confirmed. Moreover, different characteristics based on fault type for reflected waves at fault points, such as short circuit, grounding, or broken wire, have been confirmed.

DOI： 10.1049/oap-cired.2017.0195

Scopus

その他リンク： https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85046949568&origin=inward

Equivalent circuit model with nonlinear characteristics of zener diode extracted from SPICE model for ESD simulation 査読有り

Matsushima T., Aoki M., Hisakado T., Wada O.

Proceedings of the 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMCCompo 2017 152 - 155 2017年07月

記述言語：英語掲載種別：研究論文（国際会議プロシーディングス）

© 2017 IEEE. Transient analysis of an electrostatic discharge (ESD) is important for development of a highly immune device and an IC. High nonlinearity of an ESD protection circuit makes it difficult to simulate transient waveform of ESD. In this manuscript, a nonlinear model of a zener diode as ESD protection device is proposed for transient simulation of ESD. In the proposed model, voltage-dependence of a series resistance and a diffusion capacitance are represented by approximation formulae. In order to evaluate the proposed model, transient waveforms are calculated using SPICE model and the proposed model when ESD current specified by IEC 61000-4-2 is injected into the zener diode. By comparison with these waveforms, the calculation results by the proposed model is in good agreement with that by SPICE model.

DOI： 10.1109/EMCCompo.2017.7998101

Scopus

その他リンク： https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85028516758&origin=inward

Equivalent-circuit model for meta-atoms consisting of wired metallic spheres 査読有り

Hisakado T., Yoshida K., Matsushima T., Wada O.

IEICE Transactions on Electronics ( 一般社団法人電子情報通信学会 ) E100C ( 3 ) 305 - 312 2017年03月

記述言語：英語掲載種別：研究論文（学術雑誌）

© 2017 The Institute of Electronics, Information and Communication Engineers. An equivalent-circuit model is an effective tool for the analysis and design of metamaterials. This paper describes a systematic and theoretical method for the circuit modeling of meta-atoms. We focus on the structures of wired metallic spheres and propose a method for deriving a sophisticated equivalent circuit that has the same topology as the wires using the partial element equivalent circuit (PEEC) method. Our model contains the effect of external electromagnetic coupling: excitation by an external field modeled by voltage sources and radiation modeled by the radiation resistances for each mode. The equivalent-circuit model provides the characteristics of meta-atoms such as the resonant frequencies and the resonant modes induced by the current distribution in the wires by an external excitation. Although the model is obtained by a very coarse discretization, it provides a good agreement with an electromagnetic simulation.

DOI： 10.1587/transele.E100.C.305

Scopus

CiNii Article

CiNii Research

その他リンク： https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85015997349&origin=inward

妨害パルスとパケットの衝突確率を考慮したパケット誤り率解析査読有り

高谷和宏, 富田大將, 梅田康希, 小川将克, 松嶋徹, 久門尚史, 和田修己

電子情報通信学会論文誌B 通信 ( 電子情報通信学会 ) J100-B ( 3 ) 166 - 175 2017年03月

記述言語：日本語掲載種別：研究論文（学術雑誌）

IoT時代の到来や5G構想により，利用する通信環境やアプリケーションに応じて，最適な通信方式や通信パラメータを選択する利便性の高いアクセス制御が求められており，最適な通信方式や通信パラメータの選択には，通信環境に応じて実現できる通信品質をあらかじめ推定できることが重要となる．通信環境を決定する要因の一つに妨害波があり，ディジタル無線通信の通信品質劣化と相関の高い振幅確率分布（APD）や信号と妨害波の電力比（SIR）を用いて，妨害波の存在する通信環境における通信品質を推定する手法が提案されている．一方，人工的な妨害波の多くはパルス性妨害波であるが，APDには，妨害パルスの持続時間や妨害パルス間のインターバルを考慮することができない等の課題があり，SIRを用いる場合も，複数の妨害源が混在し，妨害パルスごとに妨害波電力が異なる状況においては必ずしも有効とは言えない．本論文では，様々なディジタル無線変調方式に適用可能なパケット通信を想定し，妨害パルスごとに，パルス持続時間，パルス間インターバル，及び妨害波電力の異なる通信環境において，妨害パルスとパケットの衝突確率を考慮したパケット誤り率（PER）解析方法を提案する．更に，提案手法を用いたケーススタディにより，パルス持続時間及び妨害波電力の異なる妨害パルスが一定間隔でランダムに存在する通信環境において，PERへの影響を推定する際に必要な妨害波のパラメータについても考察する．

DOI： 10.14923/transcomj.2016pep0008

CiNii Research

Experimental evaluation of communication quality of Ethernet in relation to parameters of pulse disturbances 査読有り

Matsushima Sayaka, Matsushima Tohlu, Hisakado Takashi, Wada Osami

IEICE Communications Express ( 一般社団法人電子情報通信学会 ) 6 ( 12 ) 639 - 644 2017年01月

記述言語：英語掲載種別：研究論文（学術雑誌）

<p>In this paper, in order to improve the reliability of Ethernet communication, the effect of pulse disturbances on the communication quality of 100BASE-TX was evaluated experimentally. A relationship between the threshold level of Ethernet and disturbances affecting communication quality was revealed when the amplitude and width of the pulse disturbance were changed. A disturbance in which the pulse width was the same as 1 bit time of the signal degraded the communication quality the most. These findings should help in the effort to apply Ethernet to automotive area network.</p>

DOI： 10.1587/comex.2017XBL0116

CiNii Article

CiNii Research

その他リンク： https://ci.nii.ac.jp/naid/130006236019

コモンモードノイズ低減のための降圧コンバータ近傍に存在する寄生容量の位置調整査読有り

松嶋徹, 黒柳貴夫, 久門尚史, 和田修己

エレクトロニクス実装学術講演大会講演論文集 ( 一般社団法人エレクトロニクス実装学会 ) 31 ( 0 ) 320 - 321 2017年01月

Time domain model for reaction of radiation on thin cut wires 査読有り

Kimura T., Hisakado T., Matsushima T., Wada O.

2016 10th International Congress on Advanced Electromagnetic Materials in Microwaves and Optics, METAMATERIALS 2016 181 - 183 2016年11月

記述言語：英語掲載種別：研究論文（国際会議プロシーディングス）

© 2016 IEEE. This paper describes a time domain model for current and charge density on thin cut wire structures. The model represents the reaction of radiation from the cut wires with retarded couples which express the loss, and the validity of the model is confirmed by comparing it with electromagnetic simulations. Since the model gives the reaction of the radiation only by near field coupling in time domain and provides a physical insight of the radiation, we can easily estimate the reactions of the radiation from thin-wire structures.

DOI： 10.1109/MetaMaterials.2016.7746480

Scopus

その他リンク： https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85006004234&origin=inward

Immunity macro model for linear regulator considering internal terminal voltage 査読有り

Matsushima T., Miyahara H., Hisakado T., Wada O.

IEEE International Symposium on Electromagnetic Compatibility 2016-November 532 - 535 2016年11月

記述言語：英語掲載種別：研究論文（国際会議プロシーディングス）

© 2016 IEEE. In order to estimate undesired behaviors in ICs due to RF conducted electromagnetic disturbances, immunity macro models are necessary for prediction of malfunction at front-loading of the design process. In this paper, a mechanism of malfunction of an LDO (low dropout) voltage regulator is investigated from the aspect of the internal terminal in a circuit. Measurement results show that the DC drift of the internal reference voltage is the dominant factor in malfunction of the LDO voltage regulator used in this study. In addition, an immunity macro model called ICIM-CI considering internal functional blocks is proposed. The model consists of PDN (passive distribution networks) for representing the transmission and reflection characteristics of RF disturbance and IB (immunity behavior) describing relation between malfunction of IC and the reference voltage (an internal terminal voltage of the LDO voltage regulator). The proposed model can predict variation of immunity behavior when a bypass capacitor is added near the injection terminal of RF disturbance. The simulation results using the proposed model is in good agreement with measurement results.

DOI： 10.1109/EMCEurope.2016.7739228

Scopus

その他リンク： https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85001115565&origin=inward

B-4-71 Sパラメータ測定値からLCL値の推定(B-4. 環境電磁工学,一般セッション)

松嶋徹, 高谷和宏, 奥川雄一郎, 杉浦行, 和田修己

電子情報通信学会総合大会講演論文集 ( 一般社団法人電子情報通信学会 ) 2016 ( 1 ) 391 2016年03月

C-1-7 単導体線路における外部励振の理論的表現(C-1.電磁界理論,一般セッション) 査読有り

木村琢也, 久門尚史, 松嶋徹, 和田修己

電子情報通信学会総合大会講演論文集 ( 一般社団法人電子情報通信学会 ) 2016 ( 1 ) 7 2016年03月

C-2-28 遅延を考慮した電磁結合の集中定数回路モデルによる表現(C-2.マイクロ波B(マイクロ波・ミリ波受動デバイス),一般セッション) 査読有り

大石克哉, 久門尚史, 松嶋徹, 和田修巳

電子情報通信学会総合大会講演論文集 ( 一般社団法人電子情報通信学会 ) 2016 ( 1 ) 57 2016年03月

大振幅Sパラメータ測定によるLDO電圧レギュレータのイミュニティマクロモデル構築査読有り

松嶋徹, 宮原秀敏, 久門尚史, 和田修己

エレクトロニクス実装学術講演大会講演論文集 ( 一般社団法人エレクトロニクス実装学会 ) 30 ( 0 ) 338 - 340 2016年01月

Reduction method of common-mode noise on power supply cable using floating conductor 査読有り

Matsushima T., Mabuchi Y., Hisakado T., Wada O.

2013 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2013 2015年12月

記述言語：英語掲載種別：研究論文（国際会議プロシーディングス）

© 2013 IEEE. A method to reduce common-mode current flowing on a wire harness attached to a printed circuit board is proposed in this paper. In this method, SMD inductors are placed on a power supply line and/or a ground line on a LSI package with floating conductor to control balance of impedance of the power distribution network, and the common-mode current can be reduced. The common-mode voltage is reduced about 20 dB with the package proposed in this paper.

DOI： 10.1109/APEMC.2013.7360608

Scopus

その他リンク： https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85002142063&origin=inward

Relation between internal terminal voltage and immunity behavior of LDO regulator circuits 査読有り

Miyahara H., Ikehara N., Matsushima T., Hisakado T., Wada O.

EMC Compo 2015 - 2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits 143 - 146 2015年12月

記述言語：英語掲載種別：研究論文（国際会議プロシーディングス）

© 2015 IEEE. Because predicting undesired behaviors in IC (Integrated Circuit) due to conducted electromagnetic disturbances is necessary for front-loading the design process, immunity models are becoming more important to predict a malfunction at the design stage of electronic products. In this paper, the failure to function mechanism in a LDO (Low Dropout) voltage regulator is investigated from the aspect of the internal terminal in a circuit. Simulations confirm a relation between the internal reference voltage and the DC shift error at certain frequencies. Thus, monitoring the voltage or current at an internal terminal between functional blocks gives useful information about an IC model to predict immunity.

DOI： 10.1109/EMCCompo.2015.7358346

Scopus

その他リンク： https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84964054512&origin=inward

Mode conversion and transfer characteristics of conducted disturbance to Ethernet device from power supply cable 査読有り

Matsushima T., Wada O., Takaya K., Okugawa Y.

IEEE International Symposium on Electromagnetic Compatibility 2015-Septmber 378 - 381 2015年09月

記述言語：英語掲載種別：研究論文（国際会議プロシーディングス）

© 2015 IEEE. Conducted disturbances from communication or power supply cables affect Ethernet devices. A conducted disturbance, which is generated when several switching power devices reach a communication device, degrades the quality of signal communications. In addition, a disturbance passing through an Ethernet device influences neighboring devices connected by the communication cables. Herein we propose a system to measure the propagation modes of conducted disturbances in power supply cables and Ethernet cables. The results indicate that mode conversion occurs in not only an Ethernet hub but also an AC adapter supplying DC voltage to Ethernet devices. The conducted disturbance to the AC and DC power supply cable is strongly transmitted to the Ethernet cable as the primary common mode and the differential mode. Conversion from the common mode in the power supply cable to the primary common mode in the Ethernet cable is dominant in the measured frequency range.

DOI： 10.1109/ISEMC.2015.7256190

Scopus

その他リンク： https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84953867542&origin=inward

Impedance balance control for reduction of common mode noise in full bridge converter 査読有り

Maeda M., Matsushima T., Hisakado T., Wada O.

ICEP-IAAC 2015 - 2015 International Conference on Electronic Packaging and iMAPS All Asia Conference 695 - 699 2015年01月

記述言語：英語掲載種別：研究論文（国際会議プロシーディングス）

© 2015 The Japan Institute of Electronics Packaging. In this paper, a mechanism of common mode noise generation in a full bridge converter is discussed, and a reduction method is proposed. Common mode noise is generated due to parasitic capacitors around power MOSFETs. In order to explain the mechanism of common mode generation, an equivalent circuit with the parasitic capacitors is proposed. When the circuit satisfies the impedance balance condition, the common mode noise can be eliminated. However, the impedance balance condition is time-varying because a full bridge converter changes the circuit topology during the operation of the circuit. Therefore, large capacitors are inserted for keeping the current paths dominant, and making input impedance of AC side high is applied in order to form the topology satisfying the impedance balance condition. The effectiveness of this method is verified by measurement, and the common mode current in DC side is reduced about 26 dB.

DOI： 10.1109/ICEP-IAAC.2015.7111100

Scopus

その他リンク： https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84936136013&origin=inward

Reduction method of common mode in high speed differential transmission line

Matsushima T.

Journal of Japan Institute of Electronics Packaging ( Journal of Japan Institute of Electronics Packaging ) 18 ( 5 ) 348 - 352 2015年01月

Power and ground phase relation in LSI power distribution network at common-mode noise reduction 査読有り

Murakami T., Maeda M., Mabuchi Y., Matsushima T., Hisakado T., Wada O.

IEEE International Symposium on Electromagnetic Compatibility 2014-December 561 - 564 2014年01月

記述言語：英語掲載種別：研究論文（国際会議プロシーディングス）

© 2014 The Institute of Electronics, Information and Communication Engineer. We derived expressions of power and ground voltage noises for reducing common-mode voltage in a power distribution network of an LSI and found that they have the same amplitude and a phase difference approaching 180°. To confirm this, we performed an experiment using a test board with a cover-metal structure-essentially, a floating conductor in an LSI package to reduce common-mode voltage. The evaluation was performed using an instrument that can measure the amplitude and phase difference of two channels in synchronization and calculate common-mode and differential-mode voltages. Results demonstrated phenomena similar to the expressions we derived.

Scopus

その他リンク： https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84942571473&origin=inward

　前のページ - 次のページ　

<松嶋 徹>

論文 - 松嶋 徹

<松嶋　徹>

論文 - 松嶋　徹