論文 - 松嶋 徹
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Imbalance control by open stub for reduction of common-mode conversion at differential transmission line bend 査読有り
Matsushima T., Wada O.
IEEE International Symposium on Electromagnetic Compatibility 2014-December 125 - 128 2014年01月
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Reduction of common-mode excitation on a differential transmission line bend by imbalance control 査読有り
Matsushima Tohlu, Wada Osami
IEICE Communications Express ( 一般社団法人 電子情報通信学会 ) 3 ( 10 ) 295 - 299 2014年01月
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A method of common-mode reduction based on imbalance difference model for differential transmission line bend 査読有り
Matsushima T., Wada O.
IEEE International Symposium on Electromagnetic Compatibility 338 - 341 2013年12月
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屈曲差動線路におけるコモンモード発生抑制のための平衡度制御 (環境電磁工学) 査読有り
松嶋 徹, 和田 修己
電子情報通信学会技術研究報告 = IEICE technical report : 信学技報 ( 一般社団法人電子情報通信学会 ) 113 ( 101 ) 5 - 10 2013年06月
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Impedance balance control for suppression of fluctuation on ground voltage in LSI package 査読有り
Maeda M., Matsushima T., Wada O.
EMC COMPO 2013 Proceedings - 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits 134 - 137 2013年01月
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Substrate noise reduction based on impedance balance using tunable resistances 査読有り
Nakamura A., Maeda M., Matsushima T., Wada O.
EMC COMPO 2013 Proceedings - 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits 33 - 36 2013年01月
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Improvement of reproducibility of DPI method to quantify RF conducted immunity of LDO regulator 査読有り
Matsushima T., Ikehara N., Hisakado T., Wada O.
EMC COMPO 2013 Proceedings - 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits 59 - 62 2013年01月
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Common-mode noise reduction using floating conductor in LSI package 査読有り
Matsushima T., Mabuchi Y., Hisakado T., Wada O.
2012 IEEE Electrical Design of Advanced Packaging and Systems Symposium, EDAPS 2012 105 - 108 2012年12月
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Experimental verification of signal integrity deterioration due to package-common-mode resonance 査読有り
Nishimoto T., Asai R., Matsushima T., Hisakado T., Wada O.
IEEE International Symposium on Electromagnetic Compatibility 2012年12月
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Degradation of signal integrity due to package-common-mode resonance caused by external conductive noise in power supply system 査読有り
Matsushima T., Asai R., Nishimoto T., Wada O.
cccc2012 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2012 - Proceedings 85 - 88 2012年08月
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Verification of common-mode-current prediction method based on imbalance difference model for single-channel differential signaling system 査読有り
Matsushima T., Wada O., Watanabe T., Toyota Y., Koga L.
cccc2012 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2012 - Proceedings 409 - 412 2012年08月
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Power supply current analysis of micro-controller with considering the program dependency 査読有り
Wada O., Saito Y., Nomura K., Sugimoto Y., Matsushima T.
Proceedings of the 8th International Workshop on Electromagnetic Compatibility of Integrated Circuits 2011, EMC COMPO 2011 93 - 98 2011年12月
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SI/PI degradation due to package-common-mode resonance caused by parasitic capacitance between package and PCB 査読有り
Matsushima T., Hirayama N., Hisakado T., Wada O.
Proceedings of the 8th International Workshop on Electromagnetic Compatibility of Integrated Circuits 2011, EMC COMPO 2011 213 - 218 2011年12月
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Prediction of EMI from two-channel differential signaling system based on imbalance difference model 査読有り
Matsushima T., Watanabe T., Toyota Y., Koga R., Wada O.
IEEE International Symposium on Electromagnetic Compatibility 413 - 418 2010年12月
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Calculation of common-mode radiation from single-channel differential signaling system using imbalance difference model 査読有り
Matsushima T., Watanabe T., Toyota Y., Koga R., Wada O.
IEICE Transactions on Communications E93-B ( 7 ) 1739 - 1745 2010年01月
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Suppression of guard-trace resonance by matched termination for reducing common-mode radiation 査読有り
Watanabe T., Matsushima T., Toyota Y., Wada O., Koga R.
IEICE Transactions on Communications E93-B ( 7 ) 1746 - 1753 2010年01月
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Linear equivalent circuit and current sources model including separation resistances in the ground connection for multiple power-supply pin LSI 査読有り
Saito Y., Yasuhara M., Mabuchi Y., Matsushima T., Hisakado T., Wada O.
IEEJ Transactions on Electronics, Information and Systems 130 ( 11 ) 2010年01月