Updated on 2023/12/26

 
MIYASE Kouhei
 
Scopus Paper Info  
Total Paper Count: 0  Total Citation Count: 0  h-index: 8

Citation count denotes the number of citations in papers published for a particular year.

Affiliation
Faculty of Computer Science and Systems Engineering Department of Computer Science and Networks
Job
Associate Professor
External link

Research Interests

  • ATPG

  • Low Power Testing

  • Fault Diagnosis

  • Motion analysis for sports

  • LSI Testing

Research Areas

  • Informatics / Computer system

Undergraduate Education

  • 2002.03   Kyushu Institute of Technology   Faculty of Computer Science and Systems Engineering   Department of Computer Science and Electronics   Graduated   Japan

Post Graduate Education

  • 2005.03   Kyushu Institute of Technology   Graduate School, Division of Information Engineering   Doctoral Program   Completed   Japan

Degree

  • Kyushu Institute of Technology  -  Doctor of Information Engineering   2005.03

Biography in Kyutech

  • 2019.04
     

    Kyushu Institute of Technology   Faculty of Computer Science and Systems Engineering   Department of Computer Science and Networks   Associate Professor  

  • 2016.04
    -
    2019.03
     

    Kyushu Institute of Technology   Faculty of Computer Science and Systems Engineering   Department of Creative Informatics   Associate Professor  

  • 2014.04
    -
    2016.03
     

    Kyushu Institute of Technology   Faculty of Computer Science and Systems Engineering   Department of Creative Informatics   Assistant Professor  

  • 2008.04
    -
    2014.03
     

    Kyushu Institute of Technology   Faculty of Computer Science and Systems Engineering   Department of Computer Science and Electronics   Assistant Professor  

  • 2007.04
    -
    2008.03
     

    Kyushu Institute of Technology   School of Computer Science and Systems Engineering   Assistant Professor  

Biography before Kyutech

  • 2005.04 - 2007.03   独立行政法人科学技術振興機構研究成果活用プラザ   研究員   Japan

Academic Society Memberships

  • 2007.04   The Institute of Electronics, Information and Communication Engineers   Japan

  • 2007.04   The Institute of Electrical and Electronics Engineers, Inc.   United States

  • 2007.04   Information Processing Society of Japan   Japan

Research Career

  • センサー技術を用いたスポーツ技術向上に関する研究

    センサー、マイコン、スポーツ、野球

    研究期間: 2014.08  - 

  • On Application of Test Relaxation of Test Vectors

    LSI Testing,ATPG,X-Identification,Low Power Testing,Fault Diagnosis

    研究期間: 2007.04  - 

Papers

  • Fine-Grained Built-In Self-Repair Techniques for NAND Flash Memories Reviewed International journal

    Lu S.K., Tseng S.C., Miyase K.

    Proceedings - International Test Conference   2022-September   391 - 399   2022.09

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    Authorship:Last author   Language:English   Publishing type:Research paper (international conference proceedings)

    DOI: 10.1109/ITC50671.2022.00047

    DOI: 10.1109/ITC50671.2022.00047

    Scopus

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  • A Practical Online Error Detection Method for Functional Safety Using Three-Site Implications Reviewed International journal

    Ioki K., Kai Y., Miyase K., Kajihara S.

    Proceedings - International Test Conference   2022-September   63 - 72   2022.09

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    Language:English   Publishing type:Research paper (international conference proceedings)

    DOI: 10.1109/ITC50671.2022.00013

    DOI: 10.1109/ITC50671.2022.00013

    Scopus

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  • Fault Resilience Techniques for Flash Memory of DNN Accelerators Reviewed International journal

    Lu S.K., Wu Y.S., Hong J.H., Miyase K.

    Proceedings - 2022 IEEE International Test Conference in Asia, ITC-Asia 2022   1 - 6   2022.08

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    Authorship:Last author   Language:English   Publishing type:Research paper (international conference proceedings)

    DOI: 10.1109/ITCAsia55616.2022.00011

    DOI: 10.1109/ITCAsia55616.2022.00011

    Scopus

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  • Effective Switching Probability Calculation to Locate Hotspots in Logic Circuits Reviewed International journal

    Utsunomiya T., Hoshino R., Miyase K., Lu S.K., Wen X., Kajihara S.

    Proceedings - 2022 IEEE International Test Conference in Asia, ITC-Asia 2022   43 - 48   2022.08

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    Authorship:Corresponding author   Language:English   Publishing type:Research paper (international conference proceedings)

    DOI: 10.1109/ITCAsia55616.2022.00018

    DOI: 10.1109/ITCAsia55616.2022.00018

    Scopus

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  • Efficient Built-In Self-Repair Techniques with Fine-Grained Redundancy Mechanisms for NAND Flash Memories Reviewed International journal

    Shyue-Kung Lu, Shi-Chun Tseng, Kohei Miyase and Xin Dung

    Digest. of IEEE Workshop on RTL and High Level Testing ( Digest. of IEEE Workshop on RTL and High Level Testing )   Session 3-1   2021.11

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    Language:English   Publishing type:Research paper (conference, symposium, etc.)

    オンライン開催  

  • Evaluation of Power Consumption with Logic Simulation and Placement Information for At-Speed Testing Reviewed International journal

    Taiki Utsunomiya, Kohei Miyase, Ryu Hoshino, Shyue-Kung Lu, Xiaoqing Wen, Seiji Kajihara

    Digest. of IEEE Workshop on RTL and High Level Testing ( Digest. of IEEE Workshop on RTL and High Level Testing )   Session 2-2   2021.11

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    Authorship:Corresponding author   Language:English   Publishing type:Research paper (conference, symposium, etc.)

    オンライン開催  

  • On the efficacy of scan chain grouping for mitigating IR-drop-induced test data corruption Reviewed International journal

    Zhang Y., Holst S., Wen X., Miyase K., Kajihara S., Qian J.

    IEICE Transactions on Information and Systems   E104D ( 6 )   816 - 827   2021.01

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    Language:English   Publishing type:Research paper (scientific journal)

    DOI: 10.1587/transinf.2020EDP7042

    Scopus

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  • Fault-Aware Dependability Enhancement Techniques for Phase Change Memory Reviewed International journal

    Lu S.K., Li H.P., Miyase K., Hsu C.L., Sun C.T.

    Journal of Electronic Testing: Theory and Applications (JETTA)   2021.01

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    Language:English   Publishing type:Research paper (scientific journal)

    DOI: 10.1007/s10836-021-05961-1

    Scopus

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  • Probability of Switching Activity to Locate Hotspots in Logic Circuits Reviewed International journal

    Ryo Oba, Kohei Miyase, Ryu Hoshino, Shyue-Kung Lu, Xiaoqing Wen, Seiji Kajihara

    IEEE Workshop on RTL and High Level Testing   2020.11

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    Language:English   Publishing type:Research paper (conference, symposium, etc.)

    Virtual Workshop  

  • Design of a Triple-Node-Upset Self-Recoverable Latch for Aerospace Applications in Harsh Radiation Environments Reviewed

    Yan A., Feng X., Hu Y., Lai C., Cui J., Chen Z., Miyase K., Wen X.

    IEEE Transactions on Aerospace and Electronic Systems   56 ( 2 )   1163 - 1171   2020.04

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    Language:English   Publishing type:Research paper (scientific journal)

    DOI: 10.1109/TAES.2019.2925448

    Scopus

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  • Analyzing running form with acceleration sensor Reviewed

    Koga C., Miyase K., Tokui M.

    Digest of Technical Papers - IEEE International Conference on Consumer Electronics   2020-January   2020.01

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    Authorship:Corresponding author   Language:English   Publishing type:Research paper (international conference proceedings)

    DOI: 10.1109/ICCE46568.2020.9043124

    Scopus

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  • A static method for analyzing hotspot distribution on the LSI Reviewed

    Miyase K., Kawano Y., Lu S.K., Wen X., Kajihara S.

    Proceedings - 2019 IEEE International Test Conference in Asia, ITC-Asia 2019   73 - 78   2019.09

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    Authorship:Lead author   Language:English   Publishing type:Research paper (international conference proceedings)

    DOI: 10.1109/ITC-Asia.2019.00026

    Scopus

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  • Retention-Aware Refresh Techniques for Reducing Power and Mitigation of Data Retention Faults in DRAM Reviewed

    Lu S., Huang H., Hsu C., Sun C., Miyase K.

    Journal of Electronic Testing: Theory and Applications (JETTA)   35 ( 4 )   485 - 495   2019.08

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    Language:English   Publishing type:Research paper (scientific journal)

    DOI: 10.1007/s10836-019-05817-9

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  • Scrubbing-Based Reliability and Yield Enhancement Techniques for Flash Memory Reviewed International journal

    S. K. Lu, W. C. Tsai, C. L. Hsu, C. T. Sun, and K. Miyase

    Int'l Conf. on Advanced Technology Innovation   2019.07

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    Language:English   Publishing type:Research paper (international conference proceedings)

  • Clock-Skew-Aware Scan Chain Grouping for Mitigating Shift Timing Failures in Low-Power Scan Testing Reviewed

    Zhang Y., Wen X., Holst S., Miyase K., Kajihara S., Wunderlich H., Qian J.

    Proceedings of the Asian Test Symposium   2018-October   149 - 154   2018.12

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    Language:English   Publishing type:Research paper (international conference proceedings)

    DOI: 10.1109/ATS.2018.00037

    Scopus

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  • Progressive ECC Techniques for Phase Change Memory Reviewed

    Lu S., Li H., Miyase K.

    Proceedings of the Asian Test Symposium   2018-October   161 - 166   2018.12

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    Language:English   Publishing type:Research paper (international conference proceedings)

    DOI: 10.1109/ATS.2018.00039

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  • Adaptive ECC Techniques for Reliability and Yield Enhancement of Phase Change Memory Reviewed

    226 - 227   2018.09

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    Language:English   Publishing type:Research paper (international conference proceedings)

    DOI: 10.1109/IOLTS.2018.8474118

    Scopus

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  • Scan chain grouping for mitigating ir-drop-induced test data corruption Reviewed

    140 - 145   2018.01

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    Language:English   Publishing type:Research paper (international conference proceedings)

    DOI: 10.1109/ATS.2017.37

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  • Analysis and mitigation or IR-Drop induced scan shift-errors Reviewed

    2017-December   1 - 8   2017.12

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    Language:English   Publishing type:Research paper (international conference proceedings)

    DOI: 10.1109/TEST.2017.8242055

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  • Locating Hot Spot with Justification Techniques in a Layout Design Reviewed

    K. Miyase, Y. Kawano, X. Wen, S. Kajihara

    IEEE Workshop on RTL and High Level Testing   2017.11

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    Authorship:Corresponding author   Language:English   Publishing type:Research paper (other academic)

  • Formal Test Point Insertion for Region-based Low-Capture-Power Compact At-Speed Scan Test Reviewed

    173 - 178   2016.12

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    Language:English   Publishing type:Research paper (international conference proceedings)

    DOI: 10.1109/ATS.2016.41

    Scopus

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  • On Optimal Power-Aware Path Sensitization Reviewed

    179 - 184   2016.12

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    Language:English   Publishing type:Research paper (international conference proceedings)

    DOI: 10.1109/ATS.2016.63

    Scopus

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  • Logic-path-and-clock-path-aware at-speed scan test generation Reviewed

    E99A ( 12 )   2310 - 2319   2016.12

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    Language:English   Publishing type:Research paper (scientific journal)

    DOI: 10.1587/transfun.E99.A.2310

    Scopus

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  • SAT-Based Post-Processing for Regional Capture Power Reduction in At-Speed Scan Test Generation "jointly worked" Reviewed

    Stephan Eggersgluss, Kohei Miyase, Xiaoqing Wen

    European Test Symposium   2016.05

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    Language:English   Publishing type:Research paper (international conference proceedings)

    DOI: 10.1109/ETS.2016.7519327

    Scopus

  • Logic/Clock-Path-Aware At­Speed Scan Test Generation for Avoiding False Capture Failures and Reducing Clock Stretch "jointly worked" Reviewed

    Koji Asada, Xiaoqing Wen, Stefan Holst, Kohei Miyase, Seiji Kajihara, Michael Kochte, Eric Schneider, Hans-Joachim Wunderlich, Jun Qian

    Proc. Asian Test Symposium   1 - 6   Session 4A.   2015.11

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    Language:English   Publishing type:Research paper (international conference proceedings)

    インド  

    DOI: 10.1109/ATS.2015.25

    Scopus

  • A Soft-Error Tolerant TCAM Using Partial Don't-Care Keys "jointly worked" Reviewed

    Infall Syafalni, Tsutomu Sasao, Xiaoqing Wen, Stefan Holst, Kohei Miyase

    European Test Symposium   Poster Session #2   2015.05

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    Language:English   Publishing type:Research paper (other academic)

    ルーマニア  

  • Identification of High Power Consuming Areas with Gate Type and Logic Level Information "jointly worked" Reviewed

    Kohei Miyase, Matthias Sauer, Bernd Becker, Xiaoqing Wen, Seiji Kajihara

    Proc. European Test Symposium   1 - 6   Paper9.1-1   2015.05

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    Authorship:Corresponding author   Language:English   Publishing type:Research paper (international conference proceedings)

    ルーマニア  

    DOI: 10.1109/ETS.2015.7138773

    Scopus

  • Soft-error tolerant TCAMs for high-reliability packet classifications "jointly worked" Reviewed

    Infall Syafalni, Tsutomu Sasao, Xiaoqing Wen, Stefan Holst, Kohei Miyase

    2014 IEEE Asia Pacific Conference on Circuits and Systems   471 - 474   2014.11

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    Language:English   Publishing type:Research paper (international conference proceedings)

    DOI: 10.1109/APCCAS.2014.7032821

    Scopus

  • On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST "jointly worked" Reviewed

    Akihiro Tomita, Xiaoqing Wen, Yasuo Sato, Seiji Kajihara, Kohei Miyase, Stefan Holst, Patrick Girard, Mohammad Tehranipoor, Laung-Terng Wang

    IEICE Transactions on Information and Systems   97-D ( 10 )   2706 - 2718   2014.10

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    Language:English   Publishing type:Research paper (scientific journal)

    DOI: 10.1587/transinf.2014EDP7039

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    CiNii Article

  • Search Space Reduction for Low-Power Test Generation "jointly worked" Reviewed

    Kohei Miyase, Matthias Sauer, Bernd Becker, Xiaoqing Wen, Seiji Kajihara

    Asian Test Symposium   171 - 176   2013.11

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    Authorship:Corresponding author   Language:English   Publishing type:Research paper (international conference proceedings)

    台湾  

    DOI: 10.1109/ATS.2013.40

    Scopus

  • Scan-Out Power Reduction for Logic BIST "jointly worked" Reviewed

    Senling Wang, Yasuo SATO, Seiji Kajihara, Kohei Miyase

    IEICE Transactions on Information and Systems   E96-D ( 9 )   2012 - 2020   2013.09

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    Language:English   Publishing type:Research paper (scientific journal)

    DOI: 10.1587/transinf.E96.D.2012

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    CiNii Article

  • A Capture-Safety Checking Metric Based on Transition-Time-Relation for At-Speed Scan Testing "jointly worked" Reviewed

    Kohei Miyase, Ryota Sakai, Xiaoqing Wen, Masao Aso, Hiroshi Furukawa, Yuta Yamato, Seiji Kajihara

    IEICE Transactions on Information and Systems   E96-D ( 9 )   2003 - 2011   2013.09

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    Authorship:Corresponding author   Language:English   Publishing type:Research paper (scientific journal)

    DOI: 10.1587/transinf.E96.D.2003

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    CiNii Article

  • LCTI-SS: Low-Clock-Tree-Impact Scan Segmentation for Avoiding Shift Timing Failures in Scan Testing "jointly worked" Reviewed

    Yuta Yamato, Kohei Miyase, Seiji Kajihara, Xiaoqing Wen, Laung-Terng Wang, Michael A. Kochte

    IEEE Design & Test   30 ( 4 )   60 - 70   2013.07

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    Language:English   Publishing type:Research paper (scientific journal)

    DOI: 10.1109/MDT.2012.2221152

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  • On Guaranteeing Capture Safety in At-Speed Scan Testing with Broadcast-Scan-Based Test Compression Reviewed

    Kazunari Enokimoto, Xiaoqing Wen, Kohei Miyase, Jiun-Lang Huang, Seiji Kajihara, Laung-Terng Wang

    26th Intl. Conf. on VLSI Design   279 - 284   2013.01

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    Language:English   Publishing type:Research paper (international conference proceedings)

    DOI: 10.1109/VLSID.2013.201

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  • A scan-out power reduction method for multi-cycle BIST Reviewed

    272 - 277   2012.12

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    Language:English   Publishing type:Research paper (international conference proceedings)

    DOI: 10.1109/ATS.2012.50

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  • Estimating the number of Don't-Care Bits in Test Vectors "jointly worked" Reviewed

    Kohei Miyase, Seiji Kajihara, Xiaoqing Wen

    IEEE Workshop on RTL and High Level Testing   2012.11

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    Authorship:Corresponding author   Language:English   Publishing type:Research paper (other academic)

  • On Pinpoint Capture Power Management in At-Speed Scan Test Generation Reviewed

    Xiaoqing Wen, Y. Nishida, Kohei Miyase, Seiji Kajihara, Patrick Girard, Mohammad Tehranipoor, Laung-Terng Wang

    International Test Conference   Paper 6.1   2012.11

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    Language:English   Publishing type:Research paper (international conference proceedings)

    日本   新潟  

    DOI: 10.1109/TEST.2012.6401548

    Scopus

  • Low Power BIST for Scan-Shift and Capture Power "jointly worked" Reviewed

    Yasuo Sato, Senling Wang, Takaaki Kato, Kohei Miyase, Seiji Kajihara

    Asian Test Symposium   173 - 178   2012.11

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    Language:English   Publishing type:Research paper (international conference proceedings)

    日本   新潟  

    DOI: 10.1109/ATS.2012.27

    Scopus

  • A Novel Capture-Safety Checking Method for Multi-Clock Designs and Accuracy Evaluation with Delay Capture Circuits "jointly worked" Reviewed

    [28] Kohei Miyase, Masao Aso, Ryou Ootsuka, Xiaoqing Wen, Hiroshi Furukawa, Yuta Yamato, Kazunari Enokimoto, Seiji Kajihara

    VLSI Test Symposium   197 - 202   2012.04

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    Authorship:Corresponding author   Language:English   Publishing type:Research paper (international conference proceedings)

    DOI: 10.1109/VTS.2012.6231102

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  • Additional Path Delay Fault Detection with Adaptive Test Data "jointly worked" Reviewed

    Kohei Miyase, Hiroaki Tanaka, Kazunari Enokimoto, Xiaoqing Wen, Seiji Kajihara

    IEEE Workshop on RTL and High Level Testing   2011.11

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    Authorship:Corresponding author   Language:English   Publishing type:Research paper (other academic)

  • Power-Aware Test Pattern Generation for At-Speed LOS Testing, "jointly worked" Reviewed

    Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Kohei Miyase, Xiaoqing Wen

    Asian Test Symposium   506 - 510   2011.11

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    Language:English   Publishing type:Research paper (international conference proceedings)

    インド   デリー  

    DOI: 10.1109/ATS.2011.50

    Scopus

  • Efficient BDD-based Fault Simulation in Presence of Unknown Values "jointly worked" Reviewed

    Michael A. Kochte, Sandip Kundu, Kohei Miyase, Xiaoqing Wen, Hans-Joachim Wunderlich

    Asian Test Symposium   383 - 388   2011.11

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    Language:English   Publishing type:Research paper (international conference proceedings)

    インド   デリー  

    DOI: 10.1109/ATS.2011.52

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  • Effective Launch-to-Capture Power Reduction for LOS Scheme with Adjacent-Probability-Based X-Filling, "jointly worked" Reviewed

    Kohei Miyase, Yuta Uchinodan, Kazunari Enokimoto, Yuta Yamato, Xiaoqing Wen, Seiji Kajihara, Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Arnaud Virazel

    Asian Test Symposium   90 - 95   2011.11

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    Authorship:Corresponding author   Language:English   Publishing type:Research paper (international conference proceedings)

    インド   デリー  

    DOI: 10.1109/ATS.2011.35

    Scopus

  • A Novel Scan Segmentation Design Method for Avoiding Shift Timing Failure in Scan Testing, "jointly worked" Reviewed

    Yuta Yamato, Xiaoqing Wen, Michael A. Kochte, Kohei Miyase, Seiji Kajihara, Laung-Terng Wang

    International Test Conference   Paper 12.1   Paper 12.1   2011.09

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    Language:English   Publishing type:Research paper (international conference proceedings)

    アメリカ   アナハイム  

    DOI: 10.1109/TEST.2011.6139162

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  • SAT-based Capture-Power Reduction for At-Speed Broadcast-Scan-Based Test Compression Architectures, "jointly worked" Reviewed

    Michael A. Kochte, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Kazunari Enokimoto, Hans-Joachim Wunderlich

    International Symposium on Low Power Electronics and Design   33 - 38   2011.08

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    Authorship:Corresponding author   Language:English   Publishing type:Research paper (international conference proceedings)

    日本   福岡市  

    DOI: 10.1109/ISLPED.2011.5993600

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  • Distribution-Controlled X-Identification for Effective Reduction of Launch-Induced IR-Drop in At-Speed Scan Testing, "jointly worked" Reviewed

    Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara

    IEICE Transactions on Information and Systems   E94-D ( 6 )   1216 - 1226   2011.06

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    Authorship:Corresponding author   Language:English   Publishing type:Research paper (scientific journal)

  • Mapping Test Power to Functional Power Through Smart X-Filling for LOS Scheme "jointly worked" Reviewed

    F. Wu, L.. Dilillo, A. Bosio, P. Girard, S. Pravossoudovitch, A. Virazel, M. Tehranipoor, K. Miyase, X. Wen

    IEEE International Workshop on Impact of Low-Power design on Test and Reliability   2011.05

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    Language:English   Publishing type:Research paper (other academic)

  • Power-Aware Test Generation with Guaranteed Launch Safety for At-Speed Scan Testing, "jointly worked" Reviewed

    Xiaoqing Wen, Kazunari Enokimoto, Kohei Miyase, Yuta Yamato, Michael A. Kochte, Seiji Kajihara, Patrick Girard, Mohammad Tehranipoor

    29th IEEE VLSI Test Symposium   166 - 171   2011.05

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    Language:English   Publishing type:Research paper (international conference proceedings)

    アメリカ   カリフォルニア  

    DOI: 10.1109/VTS.2011.5783778

    Scopus

  • A GA-Based X-Filling for Reducing Launch Switching Activity toward Specific Objectives in At-Speed Scan Testing, "jointly worked" Reviewed

    Yuta Yamato, Xiaoqing Wen, Kohei Miyase, Hiroshi Furukawa, Seiji Kajihara

    IEICE Transactions on Information and Systems   E94-D ( 4 )   833 - 840   2011.04

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    Language:English   Publishing type:Research paper (scientific journal)

    DOI: 10.1587/transinf.E94.D.833

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    CiNii Article

  • Transition-Time-Relation Based Capture-Safety Checking for At-Speed Scan Test Generation Reviewed

    Kohei Miyase,Xiaoqing Wen,Masao Aso,Hiroshi Furukawa,Yuta Yamato,Seiji Kajihara

    Design Automation and Test in Europe   895 - 898   2011.03

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    Language:English   Publishing type:Research paper (other academic)

    France   グルノーブル   2011.03  -  2011.03

  • X-Identification of Transition Delay Fault Tests for Launch-off Shift Scheme "jointly worked" Reviewed

    Kohei Miyase, F. Wu, L. Dilillo, A. Bosio, P. Girard, X. Wen, S. Kajihara

    IEEE Workshop on RTL and High Level Testing   2010.12

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    Authorship:Corresponding author   Language:English   Publishing type:Research paper (other academic)

  • Low-Capture-Power Post-Processing Test Vectors for Test Compression Using SAT Solver "jointly worked" Reviewed

    Kohei Miyase, Michael A. Kochte, Xiaoqing Wen, Seiji Kajihara, Hans-Joachim Wunderlich

    IEEE International Workshop on Defect and Data Driven Testing   2010.11

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    Authorship:Corresponding author   Language:English   Publishing type:Research paper (other academic)

  • On Test Pattern Compaction with Multi-Cycle and Multi-Observation Scan Test Reviewed

    Seiji Kajihara,Makoto Matsuzono,Hisato Yamaguchi,Yasuo Sato,Kohei Miyase,Xiaoqing Wen

    International Symposium on Communications and Information Technologies   723 - 726   2010.10

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    Language:English   Publishing type:Research paper (international conference proceedings)

    東京   2010.10  -  2010.10

    DOI: 10.1109/ISCIT.2010.5665084

    Scopus

  • On Delay Test Quality for Test Cubes Reviewed

    Shinji Oku,Seiji Kajihara,Yasuo Sato,Kohei Miyase,Xiqoqing Wen

    IPSJ Transactions on System LSI Design Methodology   3   283 - 291   2010.08

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    Language:English   Publishing type:Research paper (scientific journal)

    DOI: 10.2197/ipsjtsldm.3.283

    Scopus

    CiNii Article

  • A Study of Capture-Safe Test Generation Flow for At- Speed Testing Reviewed

    Kohei Miyase,Xiaoqing Wen,Seiji Kajihara,Yuta Yamato,Atsushi Takashima,Hiroshi Furukawa,Kenji Noda,Hideaki Ito,Kazumi Hatayama,Takashi Aikyo,Kewal K. Saluja

    IEICE Transactions on Fundamentals of Electronics   E93-A ( 7 )   1309 - 1318   2010.07

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    Language:English   Publishing type:Research paper (scientific journal)

    DOI: 10.1587/transfun.E93.A.1309

    Scopus

    CiNii Article

  • Power Reduction Through X-filling of Transition Fault Test Vector for LOS Testing "jointly worked" Reviewed

    F. Wu, L. Dilillo, A. Bosio, P. Girard, S. Pravossoudovitch, A. Virazel, M. Tehranipoor, K. Miyase, X. Wen, N. Ahmed

    International Workshop on the impact of Low-Power Design on Test and Reliability   2010.05

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    Language:English   Publishing type:Research paper (other academic)

    DOI: 10.1109/DTIS.2011.5941434

    Scopus

  • CAT (Critical-Area-Targeted): A New Paradigm for Reducing Yield Loss Risk in At-Speed Scan Testing Reviewed

    X. Wen, K. Enokimoto, K. Miyase, S. Kajihara, M. Aso, and H. Furukawa

    Symp. II (ISTC/CSTIC): Metrology, Reliability and Testing   197 - 202   2010.03

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    Language:English   Publishing type:Research paper (international conference proceedings)

    DOI: 10.1149/1.3360619

    Scopus

  • High Launch Switching Activity Reduction in At- Speed Scan Testing using CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme Reviewed

    Kohei Miyase,Xiaoqing Wen,Hiroshi Furukawa,Yuta Yamato,Seiji Kajihara,Patrick Girard,Laung-Terng Wang,Mohammad Tehranipoor

    IEICE Transactions on Information and Systems   E93-D ( 1 )   2 - 9   2010.01

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    Language:English   Publishing type:Research paper (scientific journal)

  • A GA-Based Method for High-Quality X-Filling to Reduce Launch Switching Activity in At-Speed Scan Testing Reviewed

    Yuta Yamato,Xiaoqing Wen,Kohei Miyase,Hiroshi Furukawa,Seiji Kajihara

    IEEE 15th Pacific Rim International Symposium on Dependable Computing   81 - 86   2009.11

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    Language:English   Publishing type:Research paper (international conference proceedings)

    Chaina   2009.11  -  2009.11

  • A Novel Post-ATPG IR-Drop Reduction Scheme for At-Speed Scan Testing in Broadcast-Scan-Based Test Compression Environment Reviewed

    Kohei Miyase,Yuta Yamato,Kenji Noda,Hideaki Ito,Kazumi Hatayama,Takashi Aikyo,Xiaoqing Wen,Seiji Kajihara

    International Conference on Computer-Aided Design   97 - 104   2009.11

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    Language:English   Publishing type:Research paper (international conference proceedings)

    アメリカ合衆国   San Jose   2009.11  -  2009.11

  • CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing Reviewed

    [17]Kazunari Enokimoto,Xiaoqing Wen,Yuta Yamato,Kohei Miyase,Hiroaki Sone,Seiji Kajihara,Masao Aso,Hiroshi Furukawa

    Asian Test Symposium   99 - 104   2009.11

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    Language:English   Publishing type:Research paper (international conference proceedings)

    Taiwan   2009.11  -  2009.11

  • X-Identification According to Required Distribution for Industrial Circuits "jointly worked" Reviewed

    Isao Beppu, Kohei Miyase, Yuta Yamato, Xiaoqing Wen, Seiji Kajihara

    IEEE Workshop on RTL and High Level Testing   2009.11

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    Authorship:Corresponding author   Language:English   Publishing type:Research paper (other academic)

  • Optimizing the Percentage of X-Bits to Reduce Switching Activity "jointly worked" Reviewed

    Isao Beppu, Kohei Miyase, Yuta Yamato, Xiaoqing Wen, Seiji Kajihara

    IEEE International Workshop on Defect and Data Driven Testing   2009.11

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    Authorship:Corresponding author   Language:English   Publishing type:Research paper (other academic)

  • Effective IR-drop Reduction in At-speed Scan Testing using Distribution-Controlling X-Identification Reviewed

    Kohei Miyase,Kenji Noda,Hideaki Ito,Kazumi Hatayama,Takashi Aikyo,Yuta Yamato,Hiroshi Furukawa,Xiaoqing Wen,Seiji Kajihara

    International Conference on Computer-Aided Design   52 - 58   2008.11

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    Language:English   Publishing type:Research paper (international conference proceedings)

    アメリカ合衆国   San Jose   2008.11  -  2008.11

  • A Capture-Safe Test Generation Scheme for At-Speed Scan Testing Reviewed

    X. Wen,K. Miyase,S. Kajihara,H. Furukawa,Y. Yamato,A. Takashima,K. Noda,H. Ito,K. Hatayama,T. Aikyo,K.K. Saluja

    European Test Symposium   55 - 60   2008.05

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    Language:English   Publishing type:Research paper (international conference proceedings)

    Italy   Verbania   2008.05  -  2008.05

  • On Detection of Bridge Defects with Stuck-at Tests Reviewed

    Kohei Miyase,Kenta Terashima,Xiaoqing Wen,Seiji Kajihara,Sudhakar M. Reddy

    IEICE Transactions on Information and Systems   E91 ( 3 )   683 - 689   2008.03

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    Language:English   Publishing type:Research paper (scientific journal)

  • A Novel Per-Test Fault Diagnosis Method Based on the Extended X-Fault Model for Deep-Submicron LSI Circuits Reviewed

    Yuta Yamato,Yusuke Nakamura,Kohei Miyase,Xiaoqing Wen,Seiji Kajihara

    IEICE Transactions on Information and Systems   E91 ( 3 )   667 - 674   2008.03

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    Language:English   Publishing type:Research paper (scientific journal)

  • A Novel Scheme to Reduce Power Supply Noise for High-Quality At-Speed Scan Testing Reviewed

    Xiaoqing Wen,Kohei Miyase,Seiji Kajihara,Tatsuya Suzuki,Yuta Yamato,Patrick Girard,Yuji Ohsumi,Laung-Terng Wang

    International Test Conference   Paper25.1   2007.10

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    Language:English   Publishing type:Research paper (international conference proceedings)

    アメリカ合衆国   2007.10  -  2007.10

  • A Method for Improving the Bridging Defect Coverage of a Transition Delay Test Set "jointly worked" Reviewed

    Kohei Miyase, Xiaoqing. Wen, Seiji. Kajihara, Masahiro Yamamoto, Hiroshi Furukawa

    2007 IEEE International Workshop on Current & Defect Based Testing (DBT 2007)   2007.10

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    Authorship:Corresponding author   Language:English   Publishing type:Research paper (other academic)

  • A Novel ATPG Method for Capture Power Reduction during Scan Testing Reviewed

    Xiaoqing Wen,Seiji Kajihara,Kohei Miyase,Tatsuya Suzuki,Kewal K. Saluja,Laung-Terng Wang,Kozo Kinoshita

    IEICE Transactions on Information and Systems   E90-D ( 9 )   1398 - 1405   2007.09

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    Language:English   Publishing type:Research paper (scientific journal)

  • Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing Reviewed

    Xiaoqing Wen,Kohei Miyase,Tatsuya Suzuki,Seiji Kajihara,Yuji Ohsumi,Kewal K. Saluja

    Design Automation Conference   527 - 532   2007.06

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    Language:English   Publishing type:Research paper (international conference proceedings)

    アメリカ合衆国   2007.06  -  2007.06

  • A Novel Per-Test Fault Diagnosis Method Based on the Extended X-Fault Model for Deep-Submicron LSI Circuits Reviewed

    Yuta Yamato,Yusuke Nakamura,Kohei Miyase,Xiaoqing Wen,Seiji Kajihara

    IEICE Transactions on Information and Systems   E90 ( 9 )   1398 - 1405   2007.03

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    Language:English   Publishing type:Research paper (scientific journal)

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Publications (Books)

  • 情報工学基礎実験

    九州工業大学情報工学部情報工学基礎実験運営委員会(Joint author)

    学術図書出版社  2019.09  ( ISBN:978-4-7806-0781-9

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    Total pages:8   Responsible for pages:pp.54-61   Language:Japanese

Conference Prsentations (Oral, Poster)

  • 信号値遷移確率を用いた高消費電力エリア特定技術の計算処理評価に関する研究

    Kohei Miyase

    電子情報通信学会技術研究報告  2022.03  IEICE

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    Event date: 2022.03.01   Language:Japanese   Country:Japan  

  • メモリのサイズおよび形状に起因するロジック部の高消費電力エリア特定に関する研究

    高藤大輝, 星野龍, 宮瀬紘平, 温暁青, 梶原誠司

    電子情報通信学会技術研究報告, DC2020-72, pp. 18-23 

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    Event date: 2021.02   Language:Japanese  

  • Evaluation of probability of switching activity for each area of logic circuit

    Ryo OBA, Ryu HOSHINO, Kohei MIYASE, Xiaoqing WEN, Seiji KAJIHARA

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    Event date: 2020.11.17   Language:Japanese  

  • メモリ搭載LSIに対するロジック部の消費電力解析に関する研究

    児玉優也, 宮瀬紘平, 高藤大輝, 温暁青, 梶原誠司

    電子情報通信学会技術研究報告, vol. 119, no. 420, DC2019-93 

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    Event date: 2020.02   Language:Japanese  

  • LSIの高消費電力エリアに対する信号値遷移制御率向上に関する研究

    史傑, 宮瀬紘平, 温暁青, 梶原誠司

    電子情報通信学会技術研究報告, vol. 119, no. 420, DC2019-94 

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    Event date: 2020.02   Language:Japanese  

  • 加速度センサーを用いたランニングフォームの解析に関する研究

    古賀千裕, ホルストシュテファン, 宮瀬紘平, 得居雅人

    第80回FTC研究会 

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    Event date: 2019.01   Language:Japanese  

  • 正当化操作を用いたレイアウト上のホットスポット特定に関する研究

    河野雄大, 宮瀬紘平, 温暁青, 梶原誠司

    信学技報, 2018-02-DC 

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    Event date: 2018.02.20   Language:Japanese  

  • ランニングフォームに対する動作解析システムに関する研究

    松原健人,池松拓磨,宮瀬紘平,ホルスト シュテファン,得意雅人

    第78回FTC研究会 

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    Event date: 2018.01   Language:Japanese  

  • On Avoiding Test Data Corruption by Optimal Scan Chain Grouping

    Y. Zhang, S. Holst, X. Wen, K. Miyase, S. Kajihara, and J. Qian

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    Event date: 2017.11.07   Language:English  

  • 電源ネットワークに対するIR-Dropの影響範囲特定に関する研究

    宮瀬紘平

    DC研究会 

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    Event date: 2017.02.21   Language:Japanese  

  • Logic-Path-and-Clock-Path-Aware At-Speed Scan Test Generation

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    Event date: 2016.02   Language:English  

  • 実速度スキャンテスト生成におけるキャプチャ電力安全性保証及びクロックストレッチ削減について

    浅田浩嗣

    第74回FTC研究会  FTC研究会

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    Event date: 2016.01.21 - 2016.02   Language:English  

  • A Behavior Analysis System with Sensor "jointly worked"

    74th FTC workshop 

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    Event date: 2016.01.21 - 2016.01.23   Language:Japanese  

  • A Method to Identify High Test Power Areas in Layout Design

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    Event date: 2015.06   Language:Japanese  

  • 低キャプチャ電力スキャンテスト生成のためのX埋め込み手法

    李 富強, 温 暁青, 宮瀬 紘平, ホルスト シュテファン, 梶原 誠司

    DC研究会 

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    Event date: 2014.06   Language:English  

  • パターンマージングによる遷移遅延故障用テストのパス遅延故障検出能力向上手法

    田中広彬

    電子情報通信学会技術研究報告 

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    Event date: 2012.02   Language:Japanese  

  • 低電力BISTにおけるシフトトグル率低減手法について

    加藤隆明

    電子情報通信学会技術研究報告 

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    Event date: 2012.02   Language:Japanese  

  • 実速度スキャンテストにおける高品質なキャプチャ安全性保障型テスト生成について

    西田優一朗

    第66回FTC研究会 

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    Event date: 2012.01   Language:Japanese  

  • フィールドテストの環境モニタ用回路の試作評価

    三宅庸資

    第66回FTC研究会 

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    Event date: 2012.01   Language:Japanese  

  • New Test Partition Approach for Segmented Testing with Lower System Failure Rate

    Senling Wang

    第66回FTC研究会 

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    Event date: 2012.01   Language:English  

  • マルチサイクルテスト構造を用いたキャプチャ電力の低減

    山口久登

    電子情報通信学会技術研究報告 

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    Event date: 2011.11   Language:Japanese  

  • テストベクトル変換手法を用いた低消費電力LOS実速度テスト

    宮瀬紘平

    電子情報通信学会技術研究報告 

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    Event date: 2011.06   Language:Japanese  

  • 実速度スキャンテストベクトルに対する遷移タイミング考慮キャプチャ安全性判定

    九州工業大学 坂井

    電子情報通信学会技術研究報告 DC2010-60 

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    Event date: 2011.02   Language:Japanese  

  • 実速度テストに対する品質考慮ドントケア判定

    九州工業大学 河野

    第64回FTC研究会資料 

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    Event date: 2011.01   Language:Japanese  

  • 熱モニタ用リングオシレータの評価機構とTEG設計

    九州工業大学 井上

    第64回FTC研究会資料 

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    Event date: 2011.01   Language:Japanese  

  • 信号値遷移削減のためのドントケア判定率の最適化に関する研究

    電子情報通信学会技術研究報告 VLD2009-55 

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    Event date: 2009.12   Language:Japanese  

  • 実速度スキャンテストにおけるクリティカルエリア特化型IR-Drop削減手法

    九州工業大学 榎元

    第62回電気関係学会九州支部連合大会 

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    Event date: 2009.09   Language:Japanese  

  • ブロードキャストスキャン圧縮環境下における実速度テストに対するIR-Drop削減Post-ATPG手法

    本人

    第61回FTC研究会資料 

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    Event date: 2009.07   Language:Japanese  

  • 部分X分解によるX故障モデルを用いた故障診断手法の高速化

    本人

    電子情報通信学会技術研究報告 DC2009-76 

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    Event date: 2009.02   Language:Japanese  

  • 実速度スキャンテストにおけるキャプチャセーフテスト生成手法について

    高嶋敦之

    電子情報通信学会技術研究報告, DC2008-30(VLD2008-62) 

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    Event date: 2008.11   Language:Japanese  

  • 実速度スキャンテストにおけるキャプチャ時消費電力削減手法

    情報システム専攻 新田和彦

    第58回FTC研究会資料 

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    Event date: 2008.04   Language:Japanese  

  • 実速度スキャンテストにおけるキャプチャ時の低消費電力テスト生成手法について

    情報創成工学専攻 福澤友晶

    電子情報通信学会技術研究報告 

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    Event date: 2007.04   Language:Japanese  

  • Per-Test X故障診断手法の診断分解能向上について

    情報創成工学専攻 大谷雅志

    LSIテスティングシンポジウム2007 

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    Event date: 2007.04   Language:Japanese  

  • LSI回路のX故障による Per-Test 故障診断手法の拡張について

    情報創成工学専攻 中村優介

    電子情報通信学会技術研究報告 

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    Event date: 2007.04   Language:Japanese  

  • A Transition Delay Test Generation Method for Capture Power Reduction during At-Speed Scan Testing

    Microelectronics Assembling And Packaging & Reverse Trade Show 

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    Event date: 2007.04   Language:English  

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Lectures

  • 加速度センサーを用いたアスリートの動作解析

    電子情報通信学会 機能集積情報システム研究会  2020.10  電子情報通信学会・ディペンダブルコンピューティング研究専門委員会

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    Language:Japanese   Presentation type:Invited lecture   Venue:広島市立大学 サテライトキャンパス  

  • Post-ATPG Test Modification

    Kolloquium Universitat Passau Fakultat fur Informatik und Mathematik  2012.05  Universitat Passau Fakultat fur Informatik und Mathematik

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    Presentation type:Special lecture  

  • LSIの消費電力テスト

    日本大学生産工学部数理情報工学科  2010.10  日本大学生産工学部数理情報工学科

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    Presentation type:Special lecture   Venue:千葉県習志野市  

Press

  • 13年秋以来九工大白星

    平賀, 宮瀬

    西日本スポーツ(新聞)  2015.05.10

  • 九工大13年秋以来勝利

    平賀, 宮瀬

    西日本新聞  2015.05.10

Grants-in-Aid for Scientific Research

  • 市民ランナーの安全で効率良いランニングフォーム学習支援システムの構築

    Grant number:16K01644  2016.04 - 2019.03   基盤研究(C)

  • 次世代低電力LSI創出のための誤テスト回避型高品質テスト方式に関する研究

    Grant number:15K12003  2015.04 - 2018.03   挑戦的萌芽研究

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    次世代低電力LSI創出のための誤テスト回避型高品質テスト方式に関する研究を実施する。

  • 体内埋込み型医療機器向けLSI回路のための極低電力自己テスト方式に関する研究

    Grant number:25280016  2013.04 - 2017.03   基盤研究(B)

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    高い信頼性が必要不可欠である体内埋込み型医療機器向けLSI回路のための、電力に関わる問題を解決可能な極低電力自己テスト方式に関する研究

  • 先端LSIテスト手法に対応した設計フロー最適化に関する研究

    Grant number:25730031  2013.04 - 2016.03   若手研究(B)

  • 高品質・低コストLSIの創出に貢献する論理スイッチング均衡型テストに関する研究

    Grant number:24650022  2012.04 - 2015.03   挑戦的萌芽研究

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    高品質・低コストLSIの創出には、LSI内の論理値が変化するスイッチングを制御する必要がある。論理スイッチングを均衡させることを目的にして様々な手法を研究開発する。

  • 高速LSIの信号伝搬速度検査対象経路の正確性および網羅性向上に関する研究

    Grant number:23700061  2011.04 - 2013.03   若手研究(B)

  • 次世代低消費電力LSI回路のための電力調整型テスト方式に関する研究

    Grant number:22300017  2010.04 - 2013.03   基盤研究(B)

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Contracts

  • 機能安全に適した耐故障設計のための コンカレント論理BIST等に関する研究

    2022.07 - 2023.03

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    Grant type:Joint research

  • High Dependable Design and Test Techniques for SoC including Embedded Flash Memory

    2017.08 - 2018.03

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    Grant type:Other joint research

  • 加速度・角速度センサーを用いた動作模倣ガイドシステム開発に関する研究

    2014.08 - 2015.07

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    Grant type:Joint research

  • 次世代LSI対応テストパタン生成のための設計フロー構築に関する研究

    2011.08 - 2012.07

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    Grant type:Joint research

  • High-Accuracy Power/Noise-Aware Test Generation

    2008.07 - 2009.03

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    Grant type:Joint research

Career of Research abroad

  • Diagnosis of Low Power LSI

    University of Passau  Project Year:  2014.11 - 2015.02

  • 先端LSIに対する多目的検査用入力データ生成システム構築に関する研究

    University of Freiburg  Project Year:  2012.10.01 - 2013.03.31

Award for Educational Activities

  • 令和3年度 Lectures of the Year

    九州工業大学情報工学部   2022.06.20

  • 平成30年度 Lectures of the Year

    九州工業大学情報工学部   2019.06.26

Activities of Academic societies and Committees

  • The Institute of Electrical and Electronics Engineers, Inc.   IEEE Asian Test Symposium (2025) Finance chair  

    2023.03 - 2025.12

  • The Institute of Electrical and Electronics Engineers, Inc.   Asia and South Pacific Design Automation Conference 2025, Publication co-chair  

    2023.03 - 2025.01

  • The Institute of Electrical and Electronics Engineers, Inc.   IEEE Fukuoka Chapter CAS Vice chair  

    2022.01

  • The Institute of Electrical and Electronics Engineers, Inc.   International Test Conference in Asia 2023, local chair  

    2022.01 - 2023.09

  • The Institute of Electrical and Electronics Engineers, Inc.   Asia and South Pacific Design Automation Conference 2023, Publication co-chair  

    2021.03 - 2023.01

  • The Institute of Electrical and Electronics Engineers, Inc.   IEEE Fukuoka Chapter CAS Treasurer/Secretary  

    2020.02 - 2021.12

  • The Institute of Electrical and Electronics Engineers, Inc.   Asia and South Pacific Design Automation Conference 2020, TPC chair  

    2019.07 - 2020.01

  • The Institute of Electrical and Electronics Engineers, Inc.   IEEE Asian Test Symposium (2021) Secretary  

    2019.03 - 2021.11

  • The Institute of Electrical and Electronics Engineers, Inc.   Asia and South Pacific Design Automation Conference 2021, Publication co-chair  

    2019.03 - 2021.01

  • The Institute of Electrical and Electronics Engineers, Inc.   IEEE Workshop on RTL and High Level Testing (2019) Program co-chair  

    2018.11 - 2019.12

  • The Institute of Electrical and Electronics Engineers, Inc.   Asia and South Pacific Design Automation Conference 2019, TPC chair  

    2018.08 - 2019.01

  • The Institute of Electrical and Electronics Engineers, Inc.   International Test Conference in Asia 2019, secretary  

    2017.10 - 2019.09

  • The Institute of Electrical and Electronics Engineers, Inc.   Asia and South Pacific Design Automation Conference 2018, TPC member  

    2017.08 - 2018.01

  • The Institute of Electrical and Electronics Engineers, Inc.   Asia and South Pacific Design Automation Conference 2017, TPC member  

    2016.08 - 2017.01

  • The Institute of Electrical and Electronics Engineers, Inc.   Asia and South Pacific Design Automation Conference 2016, TPC member  

    2015.08 - 2016.01

  • The Institute of Electrical and Electronics Engineers, Inc.   Asia and South Pacific Design Automation Conference 2015, TPC member  

    2014.08 - 2015.01

  • The Institute of Electrical and Electronics Engineers, Inc.   IEEE Asian Test Symposium (2016) Local Arrangement Chair  

    2014.07 - 2016.12

  • The Institute of Electrical and Electronics Engineers, Inc.   Asia and South Pacific Design Automation Conference 2014, TPC member  

    2013.08 - 2014.01

  • Information Processing Society of Japan  

    2011.04 - 2015.03

  • The Institute of Electronics, Information and Communication Engineers  

    2010.08

  • The Institute of Electrical and Electronics Engineers, Inc.   IEEE 21th IEEE Asian Test Symposium (2012) Publicity Chair  

    2010.07 - 2012.11

  • The Institute of Electrical and Electronics Engineers, Inc.   IEEE 13th IEEE Workshop on RTL and High Level Testing (2012) Publicity Chair  

    2010.07 - 2012.11

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Social activity outside the university

  • 全九州大学野球協会代表監督会書記

    Role(s):Organizing member

    2021.02

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    Audience: College students

    Type:Other

  • 九州六大学福岡六大学九州地区野球連盟小委員会委員

    2017.10 - 2020.03

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    Type:Other

    九州・沖縄の野球発展および円滑な試合運営のための小委員会委員

  • 福岡六大学野球連盟 理事

    2014.09

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    Type:Other

  • 全九州大学野球協会常任委員

    Role(s):Organizing member

    2014.08 - 2021.12

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    Type:Other

    九州の大学野球の運営

  • 九州工業大学硬式野球部 監督

    2014.06

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    Type:Other