OMURA Ichiro

写真a

Title

Professor

Laboratory

2-4 Hibikino, Wakamatsu-ku, Kitakyushu-shi, Fukuoka

Research Fields, Keywords

Power Electronics, Power Semiconductor Devices

E-mail

E-mail address

Phone

+81-93-695-6037

Fax

+81-93-695-6037

Scopus Paper Info  
Total Paper Count: 0  Total Citation Count: 0  h-index: 14

Citation count denotes the number of citations in papers published for a particular year.

Undergraduate Education 【 display / non-display

  • 1985.03   Osaka University   Faculty of Science   Graduated   JAPAN

Post Graduate Education 【 display / non-display

  • 1987.03  Osaka University  Graduate School, Division of Science  Master's Course  Completed  JAPAN

Degree 【 display / non-display

  • Swiss Federal Institute of Technology -  Doctor of Engineering  2001.08

Biography in Kyutech 【 display / non-display

  • 2017.04
    -
    Now

    Kyushu Institute of TechnologyGraduate School of Life Science and Systems Engineering   Department of Biological Functions Engineering   Professor  

  • 2008.04
    -
    2017.03

    Kyushu Institute of TechnologyFaculty of Engineering   Department of Electrical Engineering and Electronics   Professor  

  • 2020.04
    -
    Now

    Kyushu Institute of Technology

Specialized Field (scientific research fund) 【 display / non-display

  • Power engineering/Power conversion/Electric machinery

 

Publications (Article) 【 display / non-display

  • Improved DICM with an IR camera for Imaging of Strain and Temperature in Cross Section of TO packages

    Yoshiki Masuda, Akihiko Watanabe, Ichiro Omura

    Proc. of ISPSD 2021      2021.05  [Refereed]

    DOI

  • Benchmarking of Digital Gate Driven IGBTs: New Eoff-Vsurge Trade-off Approach

    Kouji Harasaki, Masanori Tsukuda and Ichiro Omura

    Proc. of ISPSD 2021      2021.05  [Refereed]

    DOI

  • DUT Temperature Coefficient and Power Cycles to Failure

    Yuma Kawauchi, Kenji Akimoto, Akihiko Watanabe and Ichiro Omura

    Proc. of ISPSD 2021      2021.05  [Refereed]

    DOI

  • Altitude Dependent Failure Rate Calculation for High Power Semiconductor Devices in Aviation Electronics

    Srikanth Gollapudi and Ichiro Omura

    Japanese Journal of Applied Physics      2021.03  [Refereed]

    DOI

  • Study of parasitic oscillation of a multi-chip SiC MOSFET circuit based on a signal flow graph model by TCAD simulation

    Hiroshi Kono, Ichiro Omura

    Solid-State Electronics  ( Elsevier )  177   2021.03  [Refereed]

    DOI

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Publications (Books) 【 display / non-display

  • 2020年度版 薄膜作製応用ハンドブック

    監修者 權田 俊一 ( Contributor )

    (株)エヌ・ティー・エス  2020.02 ISBN: 978-4-86043-631-5

Conference Prsentations (Oral, Poster) 【 display / non-display

  • シリコンIGBT の技術動向とスケーリングIGBT

    平本俊郎, 大村一郎  [Invited]

    第68回応用物理学会春季学術講演会分科シンポジウム  2021.03  -  2021.03 

  • MOSゲート型パワー半導体におけるセルフターンオン現象の解析とモデル化

    西尾貴植, 大村一郎

    電子情報通信学会/ 電子通信エネルギー技術研究会(EE)  2021.01  -  2021.01 

  • パワーデバイス電流集中測定技術

    西尾成植, 松浦成哉, 附田正則, 大村一郎

    電気学会電子デバイス/半導体電力変換合同研究会  2020.12  -  2020.12 

  • 13kV UHV-IGBTの理論検討

    伊東篤史, 大村一郎

    電気学会電子デバイス/半導体電力変換合同研究会  2020.12  -  2020.12 

  • Cosmic Ray Failure Rate Calculation for Power Semiconductor Device for Aircraft applications

    Srikanth Gollapudi, Ichiro Omura

    電気学会電子デバイス/半導体電力変換合同研究会  2020.12  -  2020.12 

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Lectures 【 display / non-display

  • 信頼度解析の基礎

    先進パワー半導体分科会 第7回講演会 チュートリアル   2020.12.08 

  • General formula for SEB failure rate calculation for power devices

    IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia 2020 ( Virtual Conference )  2020.09 

  • Power Semiconductor Device Basics

    32nd IEEE International Conference on Microelectronic Test Structures Tutorial   2019.03.18 

  • JOINT PROJECT REPORT: POWER SEMICONDUCTOR FOR SPACE APPLICATION AND CURRENT SENSOR FOR POWER ELECTRONICS

    1st International Conference on Joint research Program in Mongolia under “Higher Engineering Education Development” Project   2019.03.11 

  • Measurement of the Electric Current Flow inside Power Modules and Chips with Tiny Sensors

    Fifth International Forum on Advanced Technologies   2019.03.08 

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