Simultaneous imaging of strain and temperature using single IR camera Reviewed

Masuda Y., Watanabe A., Omura I.

CIPS 2020 - 11th International Conference on Integrated Power Electronics Systems   565 - 569   2020.01

Infrared image correlation for thermal stress analysis of power devices Reviewed

Watanabe A., Masuda Y., Omura I.

Microelectronics Reliability   100-101   2019.09

Convolutional neural network (CNNs) based image diagnosis for failure analysis of power devices Reviewed

Watanabe A., Hirose N., Kim H., Omura I.

Microelectronics Reliability   100-101   2019.09

A power cycling degradation inspector of power semiconductor devices Reviewed

88-90   458 - 461   2018.09

Real-time imaging of temperature distribution inside a power device under a power cycling test Reviewed

76-77   490 - 494   2017.09

Failure analysis of power devices based on real-time monitoring Reviewed

55 ( 9-10 )   2032 - 2035   2015.08

Real-time failure monitoring system for high power IGBT under acceleration test up to 500 A stress Reviewed

A. Watanabe, M. Tsukuda, I. Omura

Proceedings of The 26th International Symposium on power semiconductor devices and ICS (ISPSD2014)   338 - 341   2014.06

Internal degradation monitoring of power devices during power cycling test Reviewed

A. Watanabe, M. Tsukuda, I. Omura

Proceedings of 8th International Conference on Integrated Power Electronics Systems (CIPS2014)   1 - 6   2014.02

Real time degradation monitoring system for high power IGBT module under power cycling test Reviewed

A. Watanabe, M. Tsukuda, I. Omura

Microelectronics Reliability   53 ( 9-11 )   1692 - 1696   2013.09

Real Time Failure Imaging System under Power Stress for Power Semiconductors using Scanning Acoustic Tomography (SAT) Reviewed

A. Watanabe, I. Omura

Microelectronics Reliability   52 ( 9-10 )   2081 - 2086   2012.09

Adsorption and Reaction of Calcium at the Si(111) Surface Studied by Metastable-Induced Electron Spectroscopy Reviewed

Y. Shirouzu,Y. Kaya,T. Okazaki,A. Watanabe,M. Naitoh,S. Nishigaki,T. Ikari,K. Yamada

e-Journal of Surface Science and Nanotechnology   5   89 - 93   2007.04

Hydrogen-assisted reduction of the Ni(110)(3×1)-O surface studied by metastable-induced electron spectroscopy Reviewed

T. Ikari,T. Matsuoka,K. Murakami,T. Kawamoto,K. Yamada,A. Watanabe,M. Naitoh,S. Nishigaki

Surface Science   601   4418 - 4422   2007.04

Oxidation of a cesium-covered Ni(110) surface studied by a metastable-induced electron spectroscopy Reviewed

T. Ikari,S. Arikado,K. Kameishi,H. Kawahara,K. Yamada,A. Watanabe,M. Naitoh,S. Nishigaki

Applied Surface Science   252   5424 - 5427   2006.04

Direct observation of surface potential change due to hydrogen termination of CVD diamond surface by metastable-induced electron spectroscopy Reviewed

A. Watanabe,S. Nishioka,Y. Shirouzu,K. Yamada,M. Naitoh,S. Nishigaki

Surface Science   600   3659 - 3662   2006.04

Surface structure dependent reaction of Hydrogen-assisted reduction at O/Ni(110) surfaces studied by MIES and LEED Reviewed

T. Ikari,K. Kameishi,S. Arikado,H. Kawahara,T. Matsuoka,K. Yamada,A. Watanabe,M. Naitoh,S. Nishigaki

e-Journal of Surface Science and Nanotechnology   4   170 - 173   2006.04

Hydrogen-assisted reduction of oxidized Ni(110) surfaces studied by metastable-induced electron spectroscopy

T. Ikari,T. Matsuoka,T. Kawamoto,K. Murakami,K. Yamada,A. Watanabe,M. Naitoh,S. Nishigaki

Proceedings of the 7th Russia-Japan seminar on semiconductor surfaces   164 - 168   2006.04

Influences of the incident He* velocity on metastable de-excitation processes at a Cs-covered Si(100) surface Reviewed

T. Ikari,N. Uchino,S. Nishioka,H. Fujiwaki,K. Yamada,A. Watanabe,M. Naitoh and S. Nishigaki

Nuclear Instruments and Methods in Physics Research   B232   88 - 93   2005.04

Field emission properties of diamond particles: Electron injection into conduction band by tunneling at thin insulating interface layer

A. Watanabe,T. Ninomiya,S. Nishigaki,M. Kitabatake

New Diamond and Frontier Carbon Technology   15   21 - 28   2005.04

Observation of electron field emission patterns from B-doped diamond films Reviewed

K. Kobashi,A. Watanabe,Y. Ando,Y. Nishibayashi,Y. Yokota,T. Hirao,K. Oura,C. Ichihara,A. Kobayashi

Diamond & Related Materials   13   2113 - 2116   2004.04

Adsorption of Ca on the Si(111) surface and its reaction with the Si substrate studied by AES and MIES

T. Inoue,N. Uchino,R. Yoshida,S. Nishioka,K. Yamada,A. Watanabe,M. Naitoh,S. Nishigaki

Proceedings of the 6th Japan-Russia Seminar on Semiconductor Surfaces   33 - 40   2004.04

Metastable-induced electron spectroscopy study of hydrogen terminated CVD diamond surface

A. Watanabe,S. Nishioka,N. Uchino,K. Yamada,M. Naitoh,S. Nishigaki

Proceedings of the 6th Japan-Russia Seminar on Semiconductor Surfaces   278 - 281   2004.04

Field emission from diamond particles studied by scanning field emission microscopy Reviewed

A. Watanabe,M. Deguchi,M. Kitabatake,S. Kono

Ultramicroscopy   95   145 - 151   2003.04

絶縁層を用いたダイヤモンド粒子伝導帯への電子注入機構

渡邉晃彦,北畠真

New Diamond   ( 69 )   24 - 25   2003.04

Field emission properties of diamond particles

A. Watanabe,M. Deguchi,M. Kitabatake

New Diamond and Frontier Carbon Technology   13   31 - 46   2003.04

Large area deposition of <100>-textured diamond films by a 60-kW microwave plasma CVD reactor Reviewed

Y. Ando,Y. Yokota,T. Tachibana,A. Watanabe,Y. Nishibayashi,K. Kobashi,T. Hirao,K. Oura

Diamond and Related Materials   11   596 - 600   2002.04

ダイヤモンドからの電子放出特性

渡邉　晃彦

第2回炭素系高機能材料シンポジウム予稿集   87 - 93   2002.04

Growth of <100> oriented polycrystalline diamond films of 6 inch diameter

Y. Yokota,Y. Ando,A. Watanabe,Y. Nishibayashi,K. Kobashi,T. Hirao,K. Oura

New Diamond and Frontier Carbon Technology   12   117 - 120   2002.04

Secondary-electron and field-emission spectroscopy/microscopy studies of chemical vapor deposition grown diamond particles Reviewed

S. Kono,T. Goto,K. Sato,T. Abukawa,M. Kitabatake,A. Watanabe,M. Deguchi

Surface Science   493   610 - 618   2001.04

Microscopic study of field emission from diamond particles Reviewed

A. Watanabe,M. Deguchi,M. Kitabatake

Diamond and Related Materials   10   818 - 823   2001.04

Diamond films grown by a 60kW microwave plasma CVD system Reviewed

T. Tachibana,Y. Ando,A. Watanabe,Y. Nishibayashi,K. Kobashi,T. Hirao,K. Oura

Diamond and Related Materials   10   1569 - 1572   2001.04

Field-emission spectroscopy/microscopy studies of chemical-vapor-deposition grown diamond particles

S. Kono,T. Goto,K. Sato,T. Abukawa,M. Kitabatake,A. Watanabe,M. Deguchi

New Diamond and Frontier Carbon Technology   11   299 - 306   2001.04

Local charge redistribution at potassium adsorption on the Si(111)7x7 surface: a scanning tunneling microscopy study Reviewed

A. Watanabe,M. Naitoh,S. Nishigaki

Applied Surface Science   144/145   548 - 553   1999.04

Field Emission from Diamond Particles

M. Kitabatake,A. Watanabe,M. Deguchi

Proceedings of ADC/FCT'99   376 - 379   1999.04

Hydrogen-induced restructuring and crater formation at Si(111) surfaces: a scanning tunneling microscopy study Reviewed

M. Naitoh,H. Shimaya,A. Watanabe,S. Nishigaki

Japanese Journal of Applied Physiscs   37   2033 - 2034   1998.04

A scanning tunneling microscopy investigation of the adsorption and clustering of potassium on the Si(111)7x7 surface Reviewed

A. Watanabe,M. Naitoh,S. Nishigaki

Japanese Journal of Applied Physics   37   3778 - 3781   1998.04

A clean GaP(001)4x2/c(8x2) surface structure studied by scanning tunneling microscopy and ion scattering spectroscopy Reviewed

M. Naitoh,A. Watanabe,A. Konishi,S. Nishigaki

Japanese Journal of Applied Physics   35   4789 - 4790   1996.04

An STM observation of silver growth on hydrogen-terminated Si(111) surfaces Reviewed

M. Naitoh,A. Watanabe,S. Nishigaki

Surface Science   357/358   140 - 144   1996.04

Hydrogen-induced reconstruction of the GaP(001) surface studied by scanning tunneling microscopy Reviewed

A. Watanabe,H. Shimaya,M. Naitoh,S. Nishigaki

Journal of Vacuum Science & Technology   B14   3599 - 3602   1996.04

Determination of Abnormality of IGBT Images Using VGG16

Toui Ogawa, Akihiko Watanabe, Ichiro Omura, Tohru Kamiya

21th International Conference on Control, Automation and Systems (ICCAS 2021)  2021.10 

DUT Temperature Coefficient and Power Cycles to Failure

Yuma Kawauchi, Kenji Akimoto, Akihiko Watanabe, Ichiro Omura

33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD2021)   2021.06 

Improved DICM with an IR Camera for Imaging of Strain and Temperature in Cross Section of to Packages

Yoshiki Masuda, Akihiko Watanabe, Ichiro Omura

33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD2021)   2021.06 

薄層SOIパワーnMOSFETとpMOSFETのホットキャリア効果の⽐較

有吉和⿇、松本 聡、渡邉晃彦

電気学会、電子デバイス・半導体電力変換合同研究会「パワーデバイス・パワーエレクトロニクスとその実装技術」 

パワーサイクル試験の高精度化に向けた研究

川内勇真、渡邉晃彦、大村一郎

電気学会、電子デバイス・半導体電力変換合同研究会「パワーデバイス・パワーエレクトロニクスとその実装技術」 

赤外線カメラを使用したパワー半導体の歪みと温度の同時モニタリング

増田貴樹、渡邉晃彦、大村一郎

電気学会、電子デバイス・半導体電力変換合同研究会「パワーデバイス・パワーエレクトロニクスとその実装技術」 

Simultaneous Monitoring of Strain and Temperature for Power Semiconductor using Single IR Camera

Y. Masuda, A. Watanabe and I. Omura

8th International Symposium on Applied Engineering and Sciences (SAES2020) 

Identification of normal and abnormal from ultrasound images of power devices using VGG16

T. Ogawa, H. Lu, A. Watanabe, I. Omura and T. Kamiya

20th International Conference on Control, Automation and Systems (ICCAS 2020)  2020.10 

Simultaneous Imaging of Strain and Temperature using Single IR Camera

Y. Masuda, A. Watanabe and I. Omura

11th International Conference on Integrated Power Electronics Systems (CIPS2020)  2020.03 

Development of Ultra-high-speed Chip Surface Temperature Distribution Imaging System for High Robustness Design of Power Semiconductors

薄層SOIパワーn MOSFETの高温でのACホットキャリア効果

有吉和麻

（第72回）電気・情報関係学会九州支部連合大会 

高温におけるpチャネル薄層SOIパワーMOSFETのホットキャリア効果

金田宜政

（第72回）電気・情報関係学会九州支部連合大会 

Convolutional neural network (CNNs) based image diagnosis for failure analysis of power devices

Akihiko Watanabe, Naoto Hirose, Hyoungseop Kim and Ichiro Omura

30th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF2019)  2019.09 

Infrared image correlation for thermal stress analysis of power devices

Akihiko Watanabe, Yoshiki Masuda and Ichiro Omura

30th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF2019)  2019.09 

DC Hot carrier effect of a thin-film SOI Power p-MOSFET at high temperature

6th International Symposium on Applied Engineereing and Sciences (SAES2018) 

Real-Time Monitoring for Improvement of Reliability of Power Devices

6th International Symposium on Applied Engineereing and Sciences (SAES2018) 

Combined failure analysis system by simultaneous observation of mechanical, thermal and electrical characteristics

A power cycling degradation inspector of power semiconductor devices

29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF2018) 

Device destruction during AC stree of a thin-film SOI power nMOSFET

M.Nomura

International Symposium on Applied Engineereing and Sciences (SAES2017) 

TOパッケージダイオードのリアルタイムモニタリング評価

諸岡幸一郎

先進パワー半導体分科会 第4回講演会 

Real-time imaging of temperature distribution inside a power device under a power cycling test

A. Watanabe

28th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF2017) 

Temperature Distribution Imaging inside Power Devices by Real-Time Simulation by Real-Time Simulation

A. Watanabe

2017 International Conference on Solid State Devices and Materials (SSDM2017) 

AC Hot carrier effect and PBTI of a thin-film SOI Power n-MOSFET at high temperature

M. Nomura

2017 International Conference on Solid State Devices and Materials (SSDM2017) 

An observation system for temperature distribution on power semiconductor

K. Ezaki

International Symposium on Applied Engineereing and Sciences (SAES2016) 

Real-time 2D imaging system of temperature distribution inside a power device

R. Nagao

International Symposium on Applied Engineereing and Sciences (SAES2016) 

Combined real-time monitoring system for failure prediction of power devices

A. Watanabe

International Symposium on Applied Engineereing and Sciences (SAES2016) 

Failure analysis of power devices based on real-time monitoring

A. Watanabe

26th European Symposium on Reliability of Electron Devices,　Failure Physics and Analysis (ESREF2015) 

Real-time Temperature Monitoring System inside Package of Power Devices

N. Hirata

International Symposium on Applied Engineereing and Sciences (SAES2014) 

Current imbalance measurement among chips in IGBT module with ultra-small PCB probe

H. Yamaguchi

International Symposium on Applied Engineereing and Sciences (SAES2014) 

Current distribution imaging system for power devices using tiny ferrite core sensor

H. Tomonaga

International Symposium on Applied Engineereing and Sciences (SAES2014) 

Numerical design method of multi-turn coil for wireless power transfer circuit based on electrical circuit simulation

M. Koga

International Symposium on Applied Engineereing and Sciences (SAES2014) 

Development of current imbalance measurement technique among chips in IGBT module

The Papers of Joint Technical Meeting on Electron Devices and Semiconductor Power Converter, IEE Japan  

High Speed Real-time Temperature Monitoring System inside Power Devices Package Using Infrared Radiation

N. Hirata

2014 International Conference on Solid State Devices and Materials (SSDM2014) 

Real-time failure monitoring system for high power IGBT under acceleration test up to 500 A stress

A. Watanabe

The 26th International Symposium on power semiconductor devices and ICS (ISPSD2014) 

Internal degradation monitoring of power devices during power cycling test

A. Watanabe

8th International Conference on Integrated Power Electronics Systems (CIPS2014) 

Real time degradation monitoring system for high power IGBT module under power cycling test

A. Watanabe

24th European Symposium on Reliability of Electron Devices,　Failure Physics and Analysis (ESREF2013) 

Failure analysis of power semiconductor devices based on real time monitoring

I. Omura

International Symposium on Applied Engineereing and Sciences (SAES2013) 

Real Time Monitoring System for Internal Process to Failure of High Power IGBT

A. Watanabe

2013 International Conference on Solid State Devices and Materials (SSDM2013) 

Real Time Failure Imaging System under Power Stress for Power Semiconductors using Scanning Acoustic Tomography (SAT)

A. Watanabe

23rd European Symposium on Reliability of Electron Devices,　Failure Physics and Analysis (ESREF2012) 

Real Time Failure Imaging of Power Semiconductors under Power Stress Using Scanning Acoustic Tomography

A. Watanabe

2012 International Conference on Solid State Devices and Materials (SSDM2012) 

MPCVD法によるダイヤモンド薄膜形成

中山泰輔

九州表面・真空研究会2012(兼第17回九州薄膜表面研究会) 

p型、n型シリコン基板上に形成した多結晶ダイヤモンド薄膜からの電界電子放出特性

渡邉晃彦

平成23年度応用物理学会九州支部学術講演会 

多結晶ダイヤモンド薄膜の光電子分光

山田健二

2011年度日本物理学会北陸支部定例学術講演会 

Field emission properties of polycrystalline diamond films deposited on p-type and n-type silicon substrates

A. Watanabe

22nd European Conference on Diamond, Diamond-Like Materials, Carbon Nanotubes and Nitrides (Diamond2011) 

準安定原子誘起電子分光法によるNiO(100)表面の電子状態の抽出

清水洋平

平成21年度応用物理学会九州支部学術講演会 

CVD法により作製したカーボンナノチューブの電界放出特性評価

上村一平

九州表面・真空研究会2009(兼)第14回九州薄膜表面研究会 

準安定原子誘起電子分光法によるNiO(100)表面電子状態の研究

香月将吾

九州表面・真空研究会2009(兼)第14回九州薄膜表面研究会 

水素終端ダイヤモンド薄膜の表面抵抗と電子放出特性の相関

中木原佳宏

九州表面・真空研究会2009(兼)第14回九州薄膜表面研究会 

Reduction Reaction of Oxidized Ni (110) Surfaces with Hydrogen Studied by Metastable-Induced Electron Spectroscopy

S. Katsuki

The 4th Vacuum and Surface Sciences Conference of Asia and Australia (VASSCAA-4) 

Thermal and field emission characteristics of polycrystalline diamond coated emitter

A. Watanabe

The 8th Japan-Russia Seminar on Semiconductor Surfaces (JRSSS-8) 

準安定原子誘起電子分光法を用いたO/Ni(110)表面における水素還元・吸着プロセスの研究

碇智徳

応用物理学会九州支部と薄膜・表面物理分科会共催による研究会、（兼）第13回九州薄膜表面研究会 

ダイヤモンド薄膜を形成したフィラメント型エミッタの電子放出

荒木祥之

平成19年度応用物理学会九州支部学術講演会 

原子状水素を用いた酸化Ni(110)表面還元反応のMIESとLEEDによる研究

川本卓磨

平成19年度応用物理学会九州支部学術講演会 

準安定ヘリウム原子の脱励起プロセスにおける速度依存性

山田健二

日本物理学会北陸支部学術講演会 

Hydrogen-assisted reduction of oxidized Ni (110) surfaces studied by metastable-induced electron spectroscopy

原子状水素を用いた酸化Ni(110)表面還元反応のMIESとLEEDによる研究

村上和大

応用物理学会九州支部「新規な薄膜・表面現象とその応用の最前線」（兼）第12回九州薄膜・表面研究会 

ダイヤモンド・エミッタの試作と電子放出特性

正清義悟

応用物理学会九州支部「新規な薄膜・表面現象とその応用の最前線」（兼）第12回九州薄膜・表面研究会 

水素によるO/Ni(110)表面還元反応の基板温度依存性－MIESとLEEDによる研究

村上和大

平成18年度応用物理学会九州支部学術講演会 

Si(111)表面上のCa吸着と反応の準安定原子誘起電子分光法による研究

白水康雄

平成18年度応用物理学会九州支部学術講演会 

CVDダイヤモンド表面の水素終端による電子親和力変化：MIES/UPSによる観察

渡邉晃彦

平成18年度応用物理学会九州支部学術講演会 

Hydrogen-assisted reduction of oxidized Ni(110) surfaces studied by metastable-induced electron spectroscopy

T. Ikari

The 7th Russia-Japan Seminar on Semiconductor Surfaces (RJSSS-7) 

Adsorption and reaction of calcium at the Si(111) surface studied by metastable-induced electron spectroscopy

Y. Shirouzu

The 7th Russia-Japan Seminar on Semiconductor Surfaces (RJSSS-7) 

Hydrogen-assisted reduction of the Ni(110)(3×1)-O surface studied by MIES and LEED

T. Ikari

The 24th European Conference on Surface Science (ECOSS24) 

水素によるO/Ni(110)表面還元反応の基板温度依存性―MIESとLEEDによる研究

川本卓磨

応用物理学会九州支部「新規な薄膜・表面とその応用の最前線に関する研究会」（兼）第11回九州薄膜・表面研究会 

Ca吸着Si(111)表面電子状態のMIESによる研究

嘉屋旨哲

応用物理学会九州支部「新規な薄膜・表面とその応用の最前線に関する研究会」（兼）第11回九州薄膜・表面研究会 

水素ガスによるO/Ni(110)表面の還元反応：MIESとLEEDによる研究

松岡利幸

平成17年度応用物理学会九州支部学術講演会 

Ca/Si(111)表面反応のMIESとLEEDによる研究

白水康雄

平成17年度応用物理学会九州支部学術講演会 

水素終端CVDダイヤモンド表面の準安定原子誘起分光法による研究

渡辺晃彦

第19回ダイヤモンドシンポジウム 

Surface structure dependent reaction of Hydrogen-assisted reduction at O/Ni(110) surfaces studied by MIES and LEED

T. Ikari

International Symposium on Surface Science and Nanotechnology (ISSS-4) 

準安定励起原子を用いた半導体表面の電子状態抽出

山田健二

平成17年度電気関係学会北陸支部連合大会 

Direct observation of surface potential change due to hydrogen termination of CVD diamond surface by metastable-induced electron spectroscopy

A. Watanabe

The 23rd European Conference on Surface Science (ECOSS23) 

Oxidation of a cesium-covered Ni(110) surface studied by a metastable-induced electron spectroscopy

T. Ikari

13th International Congress on Thin Films/ 8th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures 

水素曝露されたO/Ni(110)表面のMIESによる表面電子状態抽出

川原宏樹

応用物理学会九州支部「薄膜・表面の新規な現象とその応用の最前線に関する研究会」（兼）第10回九州薄膜・表面研究会 

水素原子吸着によるダイヤモンド表面ポテンシャルの変化：UPS/MIESの同時計測による研究

西岡信介

応用物理学会九州支部「薄膜・表面の新規な現象とその応用の最前線に関する研究会」（兼）第10回九州薄膜・表面研究会 

Si(100)表面上のCa吸着とCaシリサイド薄膜形成プロセス

吉田亮

応用物理学会九州支部「薄膜・表面の新規な現象とその応用の最前線に関する研究会」（兼）第10回九州薄膜・表面研究会 

水素終端CVDダイヤモンド表面電子状態の準安定原子誘起電子分光法による研究

渡邉晃彦

第1回「水素をモデレータとしたナノ電子デバイス要素技術の開発および応用研究」プロジェクト研究報告会 

酸素吸着Ni(110)表面の水素による還元反応：準安定原子誘起分光と低速電子線回折による研究

碇智徳

第1回「水素をモデレータとしたナノ電子デバイス要素技術の開発および応用研究」プロジェクト研究報告会 

Influences of the incident He* velocity on the metastable de-excitation process at surfaces and the resultant electron spectra

T. Ikari

15th International workshop on inelastic ion surface collisions 

Metastable-induced electron spectroscopy study of hydrogen terminated CVD diamond surface

A. Watanabe

The 6th Japan-Russia Seminar on Semiconductor Surfaces (JRSSS-6) 

Adsorption of Ca on the Si(111) surface and its reaction with the Si substrate studied by AES and MIES

T. Inoue

The 6th Japan-Russia Seminar on Semiconductor Surfaces (JRSSS-6) 

Si(111)面上でのカルシウムシリサイド薄膜成長様式の研究

井上高志

応用物理学会九州支部「機能性薄膜の作製と新規表面・界面現象に関するワークショップ」（兼）第9回九州薄膜・表面研究会 

ダイヤモンド－金属基板界面における電子注入機構

渡邉晃彦

応用物理学会九州支部「機能性薄膜の作製と新規表面・界面現象に関するワークショップ」（兼）第9回九州薄膜・表面研究会 

Observation of electron field emission patterns from B-doped diamond films

K. Kobashi

The 9th International Conference on New Diamond Science and Technology (ICNDST-9) 

表面スピン電子密度分析のためのヘリウム準安定原子ビームのスピン偏極化

亀井浩太

平成15年度物理学会九州支部例会 

準安定原子脱励起スペクトルの表面ーHe*相対速度依存性

内野直喜

平成15年度物理学会九州支部例会 

Field emission properties of diamond particles: Electron injection into the conduction band by tunneling at thin insulating layer

A. Watanabe

Applied Diamond Conference/Frontier Carbon Technology Conference 2003 (ADC/FCT2003) 

ダイヤモンド粒子からの電界電子放出機構

渡邉晃彦

第8回九州薄膜表面研究会 

ダイヤモンド粒子の伝導帯への電子注入とその電界電子放出特性

渡邉晃彦

第50回応用物理学会学術講演会 

ダイヤモンドの電子デバイス応用

九州工業大学次世代パワーエレクトロニクス研究センター 第1回 研究会  2017.10 

リアルタイム・シミュレーション：赤外線カメラと同期したデバイス内部温度解析

NPERC-J 第2回ワークショップ：「新しいグリーンエレクトロニクスの創生を目指して」NPERC-J が描く2025 年のパワーエレクトロニクス  2015.11 

パワーデバイス用高信頼化評価技術：リアルタイム故障モニタリングシステム

北九州市学研都市第14回産学連携フェア、産学官連携研究開発成果発表会  2014.10 

パワーデバイス故障の原因に迫る新しい評価技術

北九州市学研都市第14回産学連携フェア、産総研・九工大・北九州市によるセミナー  2014.10 

パワーエレクトロニクスのユビキタス化を支える故障メカニズム特定技術

第5回次世代ユビキタス・パワーエレクトロニクスのための信頼性科学ワークショップ  2014.01 

パワーデバイス高信頼性技術

北九州市学研都市第13回産学連携フェア、産総研・九工大・北九州市によるセミナー  2013.10 

その他の環境エレクトロニクス研究紹介

北九州市学研都市第12回産学連携フェア、産総研・九工大・北九州市によるセミナー  2012.10 

産業応用工学会   全国大会2018 (現地担当委員長)  

2017.09 - 2018.09

産業応用工学会   全国大会2017 (出版委員長)  

2017.05 - 2017.09