Papers - BABA Akiyoshi
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Measurement of Electron Energy Distribution Obtained from Wedge Type Silicon Emitter Array Reviewed
Katsuya Higa,Akiyoshi Baba,Tanemasa Asano
2004 International Microprocesses and Nanotechnology Conference 258 - 259 2004.10
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Electrostatic Droplet Ejection Using Planar Needle Inkjet Head Reviewed
Kazunori Hakiai,Yuji Ishida,Kazunari Matsuzaki,Akiyoshi Baba,Tanemasa Asano
2004 International Microprocesses and Nanotechnology Conference 30 - 31 2004.10
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Reduction of the Gate-Oxide/poly-Si Interface Roughness by Microwave-Plasma Oxidation and Its Impact on TFT Performance Reviewed
Chihiro Shin,Akiyoshi Baba,Tanemasa Asano
2004 Int. Workshops on Active-Matrix Liquid-Crystal Displays 317 - 320 2004.08
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Ultra-High Electron Emission Efficiency from Defect Control Polyimide Tunnel Cathode Reviewed
Akiyoshi Baba,Tomoya Yoshida,Tanemasa Asano
17th International Vacuum Nanoelectronics Conference 104 - 105 2004.07
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Feasibility of Inkjet Printing for Field Electron Emitter Fabrication Reviewed
Akiyoshi Baba,Yuji Ishida,Tomoya Yoshida,Kazunori Hakiai,Kazunari Matsuzaki,Tanemasa Asano
17th International Vacuum Nanoelectronics Conference 272 - 273 2004.07
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Increase in Emission Current after High-Frequency Low-Voltage Pulses Application Observed for Gated Nano-Pillar Cathode Reviewed
Tomoya Yoshida,Akiyoshi Baba,Tanemasa Asano
17th International Vacuum Nanoelectronics Conference 258 - 259 2004.07
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Increased Emission Efficiency of Gated Cold Cathode with Carbonic Nano-Pillars Reviewed
Tomoya Yoshida,Akiyoshi Baba,Tanemasa Asano
Jpn. J. Appl. Phys. 43 ( 6B ) 3901 - 3905 2004.04
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Field Emission Characteristics of Defect-Controlled Polyimide Tunneling Cathode Reviewed
Akiyoshi Baba,Tomoya Yoshida,Tanemasa Asano
J. Vac. Sci. & Technol. B 22 ( 3 ) 1353 - 1357 2004.04
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Field Electron Emission Inkjet-Printed Carbon Black Reviewed
Akiyoshi Baba,Tomoya Yoshida,Kazunari Matsuzaki,Yuji Ishida,Tanemasa Asano
Jpn. J. Appl. Phys. 43 ( 6B ) 3923 - 3927 2004.04
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Gated Cold Cathode Array with Carbonic Nano-Pillars Formed by O2 RIE for FED Application Reviewed
Tomoya Yoshida,Akiyoshi Baba,Tanemasa Asano
10th Int. Display Workshops 1231 - 1234 2003.12
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Gate Oxide Integrity of Microwave-Plasma-Grown Silicon Oxide Reviewed
Akiyoshi Baba,Chihiro Shin,Tanemasa Asano
10th Int. Display Workshops 439 - 442 2003.12
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Planer Electrostatic Inkjet Device with Gate Electrode Reviewed
Kazunari Matsuzaki,Yuji Ishida,Atsunobu Yoshida,Akiyoshi Baba,Tanemasa Asano
2003 International Microprocesses and Nanotechnology Conference 190 - 191 2003.10
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Field Electron Emission from Carbon Black Prepared by Inkjet Printing Reviewed
Akiyoshi Baba,Tomoya Yoshida,Kazunari Matsuzaki,Yuji Ishida,Tanemasa Asano
2003 International Microprocesses and Nanotechnology Conference 300 - 301 2003.10
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Increased Emission Efficiency of Gated Cold Cathode with Carbonic Nano-Pillars Reviewed
Tomoya Yoshida,Akiyoshi Baba,Tanemasa Asano
2003 International Microprocesses and Nanotechnology Conference 188 - 189 2003.10
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Electrostatic Inkjet Head Fabricated by Anodization of Si Reviewed
Yuji Ishida,Kazunari Matsuzaki,Akiyoshi Baba,Tanemasa Asano
2003 International Microprocesses and Nanotechnology Conference 302 - 303 2003.10
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Self-Aligned Fabrication of Gated Organic Nano-Pillar Cold Cathode Reviewed
Akiyoshi Baba,Tomoya Yoshida,Tanemasa Asano
16th International Vacuum Microelectronics Conference 17 - 18 2003.07
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Field Emission Characteristics of Defect-Controlled Polyimide Tunneling Cathode Reviewed
Akiyoshi Baba,Tomoya Yoshida,Tanemasa Asano
16th International Vacuum Microelectronics Conference 267 - 268 2003.07
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Micro Field Emitter with Nano-Pillarets Formed by RIE of Photoresist Reviewed
Akiyoshi Baba,Tomoya Yoshida,Tanemasa Asano
Jpn. J. Appl. Phys 42 ( 6B ) 552 - 556 2003.04
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インクジェット法で作製したカーボンブラックからの電界電子放出
馬場昭好,吉田知也,石田雄二,浅野種正
信学技報 Technical Report of IEICE 37 - 42 2003.04
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Field Emission from Metal Particles Bound with a Photoresist Reviewed
Akiyoshi Baba,Tanemasa Asano
J. Vac. Sci. & Technol. B 21 ( 1 ) 552 - 556 2003.01