Papers - MIYASE Kouhei
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Fine-Grained Built-In Self-Repair Techniques for NAND Flash Memories Reviewed International journal
Lu S.K., Tseng S.C., Miyase K.
Proceedings - International Test Conference 2022-September 391 - 399 2022.09
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A Practical Online Error Detection Method for Functional Safety Using Three-Site Implications Reviewed International journal
Ioki K., Kai Y., Miyase K., Kajihara S.
Proceedings - International Test Conference 2022-September 63 - 72 2022.09
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Fault Resilience Techniques for Flash Memory of DNN Accelerators Reviewed International journal
Lu S.K., Wu Y.S., Hong J.H., Miyase K.
Proceedings - 2022 IEEE International Test Conference in Asia, ITC-Asia 2022 1 - 6 2022.08
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Effective Switching Probability Calculation to Locate Hotspots in Logic Circuits Reviewed International journal
Utsunomiya T., Hoshino R., Miyase K., Lu S.K., Wen X., Kajihara S.
Proceedings - 2022 IEEE International Test Conference in Asia, ITC-Asia 2022 43 - 48 2022.08
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Efficient Built-In Self-Repair Techniques with Fine-Grained Redundancy Mechanisms for NAND Flash Memories Reviewed International journal
Shyue-Kung Lu, Shi-Chun Tseng, Kohei Miyase and Xin Dung
Digest. of IEEE Workshop on RTL and High Level Testing ( Digest. of IEEE Workshop on RTL and High Level Testing ) Session 3-1 2021.11
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Evaluation of Power Consumption with Logic Simulation and Placement Information for At-Speed Testing Reviewed International journal
Taiki Utsunomiya, Kohei Miyase, Ryu Hoshino, Shyue-Kung Lu, Xiaoqing Wen, Seiji Kajihara
Digest. of IEEE Workshop on RTL and High Level Testing ( Digest. of IEEE Workshop on RTL and High Level Testing ) Session 2-2 2021.11
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On the efficacy of scan chain grouping for mitigating IR-drop-induced test data corruption Reviewed International journal
Zhang Y., Holst S., Wen X., Miyase K., Kajihara S., Qian J.
IEICE Transactions on Information and Systems E104D ( 6 ) 816 - 827 2021.01
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Fault-Aware Dependability Enhancement Techniques for Phase Change Memory Reviewed International journal
Lu S.K., Li H.P., Miyase K., Hsu C.L., Sun C.T.
Journal of Electronic Testing: Theory and Applications (JETTA) 2021.01
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Probability of Switching Activity to Locate Hotspots in Logic Circuits Reviewed International journal
Ryo Oba, Kohei Miyase, Ryu Hoshino, Shyue-Kung Lu, Xiaoqing Wen, Seiji Kajihara
IEEE Workshop on RTL and High Level Testing 2020.11
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Design of a Triple-Node-Upset Self-Recoverable Latch for Aerospace Applications in Harsh Radiation Environments Reviewed
Yan A., Feng X., Hu Y., Lai C., Cui J., Chen Z., Miyase K., Wen X.
IEEE Transactions on Aerospace and Electronic Systems 56 ( 2 ) 1163 - 1171 2020.04
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Analyzing running form with acceleration sensor Reviewed
Koga C., Miyase K., Tokui M.
Digest of Technical Papers - IEEE International Conference on Consumer Electronics 2020-January 2020.01
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A static method for analyzing hotspot distribution on the LSI Reviewed
Miyase K., Kawano Y., Lu S.K., Wen X., Kajihara S.
Proceedings - 2019 IEEE International Test Conference in Asia, ITC-Asia 2019 73 - 78 2019.09
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Retention-Aware Refresh Techniques for Reducing Power and Mitigation of Data Retention Faults in DRAM Reviewed
Lu S., Huang H., Hsu C., Sun C., Miyase K.
Journal of Electronic Testing: Theory and Applications (JETTA) 35 ( 4 ) 485 - 495 2019.08
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Scrubbing-Based Reliability and Yield Enhancement Techniques for Flash Memory Reviewed International journal
S. K. Lu, W. C. Tsai, C. L. Hsu, C. T. Sun, and K. Miyase
Int'l Conf. on Advanced Technology Innovation 2019.07
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Clock-Skew-Aware Scan Chain Grouping for Mitigating Shift Timing Failures in Low-Power Scan Testing Reviewed
Zhang Y., Wen X., Holst S., Miyase K., Kajihara S., Wunderlich H., Qian J.
Proceedings of the Asian Test Symposium 2018-October 149 - 154 2018.12
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Progressive ECC Techniques for Phase Change Memory Reviewed
Lu S., Li H., Miyase K.
Proceedings of the Asian Test Symposium 2018-October 161 - 166 2018.12
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Adaptive ECC Techniques for Reliability and Yield Enhancement of Phase Change Memory Reviewed
226 - 227 2018.09
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Scan chain grouping for mitigating ir-drop-induced test data corruption Reviewed
140 - 145 2018.01
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Analysis and mitigation or IR-Drop induced scan shift-errors Reviewed
2017-December 1 - 8 2017.12
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Locating Hot Spot with Justification Techniques in a Layout Design Reviewed
K. Miyase, Y. Kawano, X. Wen, S. Kajihara
IEEE Workshop on RTL and High Level Testing 2017.11