Papers - MIYASE Kouhei
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Power-Aware Test Pattern Generation for At-Speed LOS Testing, "jointly worked" Reviewed
Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Kohei Miyase, Xiaoqing Wen
Asian Test Symposium 506 - 510 2011.11
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Efficient BDD-based Fault Simulation in Presence of Unknown Values "jointly worked" Reviewed
Michael A. Kochte, Sandip Kundu, Kohei Miyase, Xiaoqing Wen, Hans-Joachim Wunderlich
Asian Test Symposium 383 - 388 2011.11
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Effective Launch-to-Capture Power Reduction for LOS Scheme with Adjacent-Probability-Based X-Filling, "jointly worked" Reviewed
Kohei Miyase, Yuta Uchinodan, Kazunari Enokimoto, Yuta Yamato, Xiaoqing Wen, Seiji Kajihara, Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Arnaud Virazel
Asian Test Symposium 90 - 95 2011.11
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A Novel Scan Segmentation Design Method for Avoiding Shift Timing Failure in Scan Testing, "jointly worked" Reviewed
Yuta Yamato, Xiaoqing Wen, Michael A. Kochte, Kohei Miyase, Seiji Kajihara, Laung-Terng Wang
International Test Conference Paper 12.1 Paper 12.1 2011.09
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SAT-based Capture-Power Reduction for At-Speed Broadcast-Scan-Based Test Compression Architectures, "jointly worked" Reviewed
Michael A. Kochte, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Kazunari Enokimoto, Hans-Joachim Wunderlich
International Symposium on Low Power Electronics and Design 33 - 38 2011.08
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Distribution-Controlled X-Identification for Effective Reduction of Launch-Induced IR-Drop in At-Speed Scan Testing, "jointly worked" Reviewed
Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara
IEICE Transactions on Information and Systems E94-D ( 6 ) 1216 - 1226 2011.06
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Mapping Test Power to Functional Power Through Smart X-Filling for LOS Scheme "jointly worked" Reviewed
F. Wu, L.. Dilillo, A. Bosio, P. Girard, S. Pravossoudovitch, A. Virazel, M. Tehranipoor, K. Miyase, X. Wen
IEEE International Workshop on Impact of Low-Power design on Test and Reliability 2011.05
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Power-Aware Test Generation with Guaranteed Launch Safety for At-Speed Scan Testing, "jointly worked" Reviewed
Xiaoqing Wen, Kazunari Enokimoto, Kohei Miyase, Yuta Yamato, Michael A. Kochte, Seiji Kajihara, Patrick Girard, Mohammad Tehranipoor
29th IEEE VLSI Test Symposium 166 - 171 2011.05
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A GA-Based X-Filling for Reducing Launch Switching Activity toward Specific Objectives in At-Speed Scan Testing, "jointly worked" Reviewed
Yuta Yamato, Xiaoqing Wen, Kohei Miyase, Hiroshi Furukawa, Seiji Kajihara
IEICE Transactions on Information and Systems E94-D ( 4 ) 833 - 840 2011.04
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Transition-Time-Relation Based Capture-Safety Checking for At-Speed Scan Test Generation Reviewed
Kohei Miyase,Xiaoqing Wen,Masao Aso,Hiroshi Furukawa,Yuta Yamato,Seiji Kajihara
Design Automation and Test in Europe 895 - 898 2011.03
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X-Identification of Transition Delay Fault Tests for Launch-off Shift Scheme "jointly worked" Reviewed
Kohei Miyase, F. Wu, L. Dilillo, A. Bosio, P. Girard, X. Wen, S. Kajihara
IEEE Workshop on RTL and High Level Testing 2010.12
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Low-Capture-Power Post-Processing Test Vectors for Test Compression Using SAT Solver "jointly worked" Reviewed
Kohei Miyase, Michael A. Kochte, Xiaoqing Wen, Seiji Kajihara, Hans-Joachim Wunderlich
IEEE International Workshop on Defect and Data Driven Testing 2010.11
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On Test Pattern Compaction with Multi-Cycle and Multi-Observation Scan Test Reviewed
Seiji Kajihara,Makoto Matsuzono,Hisato Yamaguchi,Yasuo Sato,Kohei Miyase,Xiaoqing Wen
International Symposium on Communications and Information Technologies 723 - 726 2010.10
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On Delay Test Quality for Test Cubes Reviewed
Shinji Oku,Seiji Kajihara,Yasuo Sato,Kohei Miyase,Xiqoqing Wen
IPSJ Transactions on System LSI Design Methodology 3 283 - 291 2010.08
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A Study of Capture-Safe Test Generation Flow for At- Speed Testing Reviewed
Kohei Miyase,Xiaoqing Wen,Seiji Kajihara,Yuta Yamato,Atsushi Takashima,Hiroshi Furukawa,Kenji Noda,Hideaki Ito,Kazumi Hatayama,Takashi Aikyo,Kewal K. Saluja
IEICE Transactions on Fundamentals of Electronics E93-A ( 7 ) 1309 - 1318 2010.07
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Power Reduction Through X-filling of Transition Fault Test Vector for LOS Testing "jointly worked" Reviewed
F. Wu, L. Dilillo, A. Bosio, P. Girard, S. Pravossoudovitch, A. Virazel, M. Tehranipoor, K. Miyase, X. Wen, N. Ahmed
International Workshop on the impact of Low-Power Design on Test and Reliability 2010.05
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CAT (Critical-Area-Targeted): A New Paradigm for Reducing Yield Loss Risk in At-Speed Scan Testing Reviewed
X. Wen, K. Enokimoto, K. Miyase, S. Kajihara, M. Aso, and H. Furukawa
Symp. II (ISTC/CSTIC): Metrology, Reliability and Testing 197 - 202 2010.03
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High Launch Switching Activity Reduction in At- Speed Scan Testing using CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme Reviewed
Kohei Miyase,Xiaoqing Wen,Hiroshi Furukawa,Yuta Yamato,Seiji Kajihara,Patrick Girard,Laung-Terng Wang,Mohammad Tehranipoor
IEICE Transactions on Information and Systems E93-D ( 1 ) 2 - 9 2010.01
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A GA-Based Method for High-Quality X-Filling to Reduce Launch Switching Activity in At-Speed Scan Testing Reviewed
Yuta Yamato,Xiaoqing Wen,Kohei Miyase,Hiroshi Furukawa,Seiji Kajihara
IEEE 15th Pacific Rim International Symposium on Dependable Computing 81 - 86 2009.11
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A Novel Post-ATPG IR-Drop Reduction Scheme for At-Speed Scan Testing in Broadcast-Scan-Based Test Compression Environment Reviewed
Kohei Miyase,Yuta Yamato,Kenji Noda,Hideaki Ito,Kazumi Hatayama,Takashi Aikyo,Xiaoqing Wen,Seiji Kajihara
International Conference on Computer-Aided Design 97 - 104 2009.11