Papers - MIYASE Kouhei
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CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing Reviewed
[17]Kazunari Enokimoto,Xiaoqing Wen,Yuta Yamato,Kohei Miyase,Hiroaki Sone,Seiji Kajihara,Masao Aso,Hiroshi Furukawa
Asian Test Symposium 99 - 104 2009.11
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X-Identification According to Required Distribution for Industrial Circuits "jointly worked" Reviewed
Isao Beppu, Kohei Miyase, Yuta Yamato, Xiaoqing Wen, Seiji Kajihara
IEEE Workshop on RTL and High Level Testing 2009.11
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Optimizing the Percentage of X-Bits to Reduce Switching Activity "jointly worked" Reviewed
Isao Beppu, Kohei Miyase, Yuta Yamato, Xiaoqing Wen, Seiji Kajihara
IEEE International Workshop on Defect and Data Driven Testing 2009.11
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Effective IR-drop Reduction in At-speed Scan Testing using Distribution-Controlling X-Identification Reviewed
Kohei Miyase,Kenji Noda,Hideaki Ito,Kazumi Hatayama,Takashi Aikyo,Yuta Yamato,Hiroshi Furukawa,Xiaoqing Wen,Seiji Kajihara
International Conference on Computer-Aided Design 52 - 58 2008.11
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A Capture-Safe Test Generation Scheme for At-Speed Scan Testing Reviewed
X. Wen,K. Miyase,S. Kajihara,H. Furukawa,Y. Yamato,A. Takashima,K. Noda,H. Ito,K. Hatayama,T. Aikyo,K.K. Saluja
European Test Symposium 55 - 60 2008.05
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On Detection of Bridge Defects with Stuck-at Tests Reviewed
Kohei Miyase,Kenta Terashima,Xiaoqing Wen,Seiji Kajihara,Sudhakar M. Reddy
IEICE Transactions on Information and Systems E91 ( 3 ) 683 - 689 2008.03
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A Novel Per-Test Fault Diagnosis Method Based on the Extended X-Fault Model for Deep-Submicron LSI Circuits Reviewed
Yuta Yamato,Yusuke Nakamura,Kohei Miyase,Xiaoqing Wen,Seiji Kajihara
IEICE Transactions on Information and Systems E91 ( 3 ) 667 - 674 2008.03
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A Novel Scheme to Reduce Power Supply Noise for High-Quality At-Speed Scan Testing Reviewed
Xiaoqing Wen,Kohei Miyase,Seiji Kajihara,Tatsuya Suzuki,Yuta Yamato,Patrick Girard,Yuji Ohsumi,Laung-Terng Wang
International Test Conference Paper25.1 2007.10
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A Method for Improving the Bridging Defect Coverage of a Transition Delay Test Set "jointly worked" Reviewed
Kohei Miyase, Xiaoqing. Wen, Seiji. Kajihara, Masahiro Yamamoto, Hiroshi Furukawa
2007 IEEE International Workshop on Current & Defect Based Testing (DBT 2007) 2007.10
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A Novel ATPG Method for Capture Power Reduction during Scan Testing Reviewed
Xiaoqing Wen,Seiji Kajihara,Kohei Miyase,Tatsuya Suzuki,Kewal K. Saluja,Laung-Terng Wang,Kozo Kinoshita
IEICE Transactions on Information and Systems E90-D ( 9 ) 1398 - 1405 2007.09
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Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing Reviewed
Xiaoqing Wen,Kohei Miyase,Tatsuya Suzuki,Seiji Kajihara,Yuji Ohsumi,Kewal K. Saluja
Design Automation Conference 527 - 532 2007.06
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A Novel Per-Test Fault Diagnosis Method Based on the Extended X-Fault Model for Deep-Submicron LSI Circuits Reviewed
Yuta Yamato,Yusuke Nakamura,Kohei Miyase,Xiaoqing Wen,Seiji Kajihara
IEICE Transactions on Information and Systems E90 ( 9 ) 1398 - 1405 2007.03