研究者詳細 - 大村　一郎

論文 - 大村　一郎

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IGBT current filamentation observation by segmented collector sensing under UIS condition 査読有り国際誌

Seiya Matsuura, Masanori Tsukuda, Ichiro Omura

11th International Conference on Integrated Power Electronics Systems (CIPS2020) ( VDE ) 2020年05月

EMI Imaging System Using Double-pulse-compose-method 査読有り国際誌

K. Matsuo, M. Tsukuda and I. Omura

11th International Conference on Integrated Power Electronics Systems (CIPS2020) ( VDE ) 2020年05月

Digital Gate Drive Control Method for Active Voltage Balancing of Series-connected IGBT Devices 査読有り国際誌

R. N. Tripathi, T. Arimoto, M. Tsukuda and I. Omura

11th International Conference on Integrated Power Electronics Systems (CIPS2020) ( VDE ) 2020年05月

Detecting Three-Phase Power Inverter Output Currents By A Single PCB Current Sensor 査読有り国際誌

B. Bat-Ochir, B. Bayarkhuu, M. Tsukuda, B. Dugarjav and I. Omura

11th International Conference on Integrated Power Electronics Systems (CIPS2020) ( VDE ) 2020年05月

Mechanism Clarification of Switching Loss and Surge Voltage / Current Reduction with Active Gate Drive for System Reliability Improvement 査読有り国際誌

Seiya Abe, Yusuke Tokita, Masanori Tsukuda, Ichiro Omura

Journal of the Institute of Industrial Applications Engineers ( IIAE ) 8 ( 2 ) 50 - 55 2020年04月

Impact of Structural Parameter Scaling on On-state Voltage in 1200V Scaled IGBTs 査読有り

Takuya Saraya, Kazuo Itou, Toshihiko Takakura, Munetoshi Fukui, Shinichi Suzuki, Kiyoshi Takeuchi, Kuniyuki, Kakushima, Takuya Hoshii, Kazuo Tsutsui, Hiroshi Iwai, Shin-ichi Nishizawa, Ichiro Omura and Toshiro Hiramoto

JJAP 2020年04月

Numerical study on the suppression of 4H-SiC PiN diodes forward bias degradation due to substrate basal plane dislocations 査読有り

Satoshi Torimi, Yoshiki Obiyama, Masanori Tsukuda, Ichiro Omura

Solid State Electronics 166 107770 2020年04月

Stop-and-Go Gate Drive Minimizing Test Cost to Find Optimum Gate Driving Vectors in Digital Gate Drivers 査読有り

Sai T., Miyazaki K., Obara H., Mannen T., Wada K., Omura I., Sakurai T., Takamiya M.

Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC 2020-March 3096 - 3101 2020年03月

記述言語：英語掲載種別：研究論文（国際会議プロシーディングス）

An active gate driving is effective to solve the trade-off between the switching loss and the current/voltage overshoot of power transistors. The test cost in the conventional digital gate drivers with four variables, however, is high, because more than 2000 measurements are required to find an optimum gate driving vector out of 64 (~1.7 x 10 ) combinations [1]. To minimize the test cost, a stop-and-go gate drive with only one variable is proposed. The switching loss and the current/voltage overshoot in turn-on/off state of IGBT of the conventional gate drive [1] and the proposed stop-and-go gate drive are measured by using a 6-bit programmable digital gate driver IC across nine conditions including different load currents (20 A, 50 A, and 80 A) and temperatures (25 °C, 75 °C, and 125 °C), and they are compared. The performance degradation of the switching loss and the current/voltage overshoot in the proposed stop-and-go gate drive over the conventional gate drive with four variables [1] is less than 8 % and 25 % across the nine conditions in turn-on/off state respectively. 4 7

DOI： 10.1109/APEC39645.2020.9124356

Scopus

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Bipolar Transistor Test Structures for Extracting　Minority Carrier Lifetime in IGBTs 査読有り

Kiyoshi Takeuchi, Munetoshi Fukui, Takuya Saraya, Kazuo Itou, Toshihiko Takakura, Shinichi Suzuki, Yohichiroh Numasawa, Naoyuki Shigyo, Kuniyuki Kakushima, Takuya Hoshii, Kazuyoshi Furukawa, Masahiro Watanabe, Hitoshi Wakabayashi, Kazuo Tsutsui, Hiroshi Iwai, Atsushi Ogura, Wataru Saito, Shin-ichi Nishizawa, Masanori Tsukuda, Ichiro Omura, Hiromichi Ohashi, and Toshiro Hiramoto

IEEE Transactions on Semiconductor Manufacturing 2020年02月

IGBT current filamentation observation by segmented collector sensing under UIS condition 査読有り

Matsuura S., Tsukuda M., Omura I.

CIPS 2020 - 11th International Conference on Integrated Power Electronics Systems 559 - 564 2020年01月

記述言語：英語掲載種別：研究論文（国際会議プロシーディングス）

Current filamentation during the avalanche period of insulated-gate bipolar transistors (IGBTs) has been investigated using various approaches including TCAD simulations and temperature distribution measurements, since the phenomena can be an origin of chip current capability lowering with the parasitic thyristor latching-up due to the strongly localized current. This paper reports, for the first time, the current filamentation is directly measured as collector currents of segmented metallization areas of an IGBT chip. The experimental results show that the filament moves across the segmented areas with couple of micro second as the transition time and the transitions are not identical for the repeated tests even the circuit condition is the same.

Scopus

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Dynamic current balancing of parallel connected IGBT devices using PCB sensor for integration in power modules 査読有り

Tripathi R.N., Tsukuda M., Omura I.

CIPS 2020 - 11th International Conference on Integrated Power Electronics Systems 101 - 105 2020年01月

記述言語：英語掲載種別：研究論文（国際会議プロシーディングス）

Dynamic current balancing is a crucial factor for parallel connected devices. It has to be considered as a prominent issue concerning the high reliability and lifetime of the power module as well as the power electronic converter system. This paper presents, dynamic current balancing among the parallel-connected discrete IGBT devices using a tiny PCB sensor that can be integrated inside a power module for system miniaturization. The output of the tiny PCB sensor is used for current peak detection to perform gate delay compensation through feedback control. Moreover, the currents are also measured using Pearson current probe for authentication of measurement and system performance using PCB sensors.

Scopus

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Digital gate drive control method for active voltage balancing of series-connected IGBT devices 査読有り

Tripathi R.N., Arimoto T., Tsukuda M., Omura I.

CIPS 2020 - 11th International Conference on Integrated Power Electronics Systems 269 - 273 2020年01月

記述言語：英語掲載種別：研究論文（国際会議プロシーディングス）

High voltage power generation and conversion are essential considering reduced system losses, consequently, lead to better power system efficiency. Series-connected power devices are used to address and satisfy the high voltage requirement of the system. However, unbalanced voltage stress distribution among the series-connected power devices is a vital concern considering the ageing of the devices, safe-operating-area (SOA) and system reliability. This paper presents, a digital gate drive control (DGDC) method for voltage balancing of series-connected IGBT devices. The proposed method dynamically controls the gate voltage to optimize the overshoot voltage as well as the voltage-stress distribution. The DGDC method is implemented for a three series-connected IGBT system to authenticate the performance.

Scopus

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Detecting three-phase power inverter output currents by a single PCB current sensor 査読有り

Bat-Ochir B.O., Bayarkhuu B., Tsukuda M., Dugarjav B., Omura I.

CIPS 2020 - 11th International Conference on Integrated Power Electronics Systems 106 - 109 2020年01月

記述言語：英語掲載種別：研究論文（国際会議プロシーディングス）

Measuring the current of a power conversion system is imperative. So, we have developed a new method of measuring a three-phase inverter’s currents of all loads with a single current sensor. We successfully tested this method on a computer simulation and an experimental setup. Which showed that the method can be integrated into power inverters. We proposed an inexpensive analog circuit suitable for capturing current information from a tiny PCB Rogowski coil. It measures the current of the power inverter’s DC supply line and resynthesizes all load currents separately. This way it will reduce the size and cost of a power conversion system’s current measuring devices.

Scopus

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Robust Gate Driving Vectors to Load Current and Temperature Variations for Digital Gate Drivers 査読有り

Toru Sai, Koutaro Miyazaki, Hidemine Obara, Tomoyuki Mannen, Keiji Wada, Ichiro Omura, Takayasu Sakurai and Makoto Takamiya

4th IEEE International Future Energy Electronics Conference (IFEEC 2019), Special Session 2019年11月

Power energy cost reduction effects by applying optimized long-term storage battery operation strategy 査読有り

Yuasa K., Omura I., Ueshima M., Babasaki T.

8th International Conference on Renewable Energy Research and Applications, ICRERA 2019 107 - 112 2019年11月

記述言語：英語掲載種別：研究論文（国際会議プロシーディングス）

In this paper, we propose an optimized storage battery operation strategy by considering the long-term variability of the net load with photovoltaics. We derive the power energy cost reduction effects from the proposed strategy that was applied by numerical analysis. From the numerical analysis results, we report that the strategy is more advantageous than conventional strategies.

DOI： 10.1109/ICRERA47325.2019.8996953

Scopus

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Optimized Storage Battery Operation Strategy by Considering Long-term Variabilitty of a Net Load with Photovoltaics 査読有り

Yuasa K., Ueshima M., Babasaki T., Omura I.

2019 IEEE 4th International Future Energy Electronics Conference, IFEEC 2019 2019年11月

記述言語：英語掲載種別：研究論文（国際会議プロシーディングス）

In this paper, we propose an optimized storage battery operation strategy by considering the long-term variability of net loads with photovoltaics. We derive the power energy cost reduction effects in the case of applying the proposed strategy under storage parity conditions by numerical analysis. From the results, we report that the proposed strategy is more advantageous than conventional methods.

DOI： 10.1109/IFEEC47410.2019.9014973

Scopus

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Examination of correction method of long-term solar radiation forecasts of numerical weather prediction 査読有り

Ueshima M., Babasaki T., Yuasa K., Omura I.

8th International Conference on Renewable Energy Research and Applications, ICRERA 2019 113 - 117 2019年11月

記述言語：英語掲載種別：研究論文（国際会議プロシーディングス）

To optimize operation plans for storage batteries with solar power systems, it is necessary to predict solar radiation for up to one week with high accuracy. However, it is known that the further a prediction system forecasts into the future, the lower the prediction accuracy. In this paper, we report on the results of testing a method for correcting the solar radiation prediction value statistically from a numerical weather prediction model by using the tendency of past error occurrence for predicting seven days ahead.

DOI： 10.1109/ICRERA47325.2019.8997070

Scopus

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Switching of 3300v scaled igbt by 5v gate drive 査読有り

Hiramoto T., Satoh K., Matsudai T., Saito W., Kakushima K., Hoshii T., Furukawa K., Watanabe M., Shigyo N., Wakabayashi H., Tsutsui K., Sarava T., Iwai H., Ogura A., Nishizawa S., Omura I., Ohash H., Itou K., Takakura T., Fukui M., Suzuki S., Takeuchi K., Tsukuda M., Numasawa Y.

Proceedings of International Conference on ASIC 2019年10月

記述言語：英語掲載種別：研究論文（国際会議プロシーディングス）

In this work, the switching of 3300V IGBTs by 5V gate drive voltage has been successfully demonstrated for the first time. IGBT was designed based on a scaling principle. Comparing with conventional 15V-driven non-scaled IGBTs, the tum-off tail current of the scaled devices significantly decreased. The improvement of E-{\mathrm{off}} vs V-{\mathrm{cesat}} relationship by 35% was achieved.

DOI： 10.1109/ASICON47005.2019.8983633

Scopus

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Peak Minimisation based Gate Delay Compensation for Active Current Balancing of Parallel IGBT System 査読有り

Ravi Nath Tripathi, Masanori Tsukuda, Ichiro Omura

Microelectronics Reliability 101-101 113426 2019年09月

Infrared image correlation for thermal stress analysis of power devices 査読有り

Akihiko Watanabe, Yoshiki Masuda and Ichiro Omura

Microelectronics Reliability 101-101 113414 2019年09月

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