Faculty Profiles - WEN Xiaoqing

Papers - WEN Xiaoqing

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CAT (Critical-Area-Targeted): A New Paradigm for Reducing Yield Loss Risk in At-Speed Scan Testing Invited Reviewed International journal

X. Wen, K. Enokimoto, K. Miyase, S. Kajihara, M. Aso, H. Furukawa

Symposium II (International Semiconductor Technology Conference & China Semiconductor Technology International Conference) 197 - 202 2010.03

Using Launch-on-Capture for Testing BIST Designs Containing Synchronous and Asynchronous Clock Domains Reviewed International journal

L.-T. Wang,X. Wen,S. Wu,H. Furukawa,H.-J. Chao,B. Sheu,J. Guo,and W.-B. Jone

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 29 ( 2 ) 299 - 312 2010.02

A Path Selection Method for Delay Test Targeting Transistor Aging Reviewed International journal

M. Noda,S. Kajihara,Y. Sato,K. Miyase,X. Wen,and Y. Miura

IEEE International Workshop on Reliability Aware System Design and Test 57 - 61 2010.01

X-Identification According to Required Distribution for Industrial Circuits Reviewed International journal

I. Beppu,K. Miyase,Y. Yamato,X. Wen,and S. Kajihara

IEEE Workshop on RTL and High Level Testing 76 - 81 2009.11

CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing Reviewed International journal

K. Enokimoto,X. Wen,Y. Yamato,K. Miyase,H. Sone,S. Kajihara,M. Aso,and H. Furukawa

IEEE Asian Test Symposium 99 - 104 2009.11

A GA-Based Method for High-Quality X-Filling to Reduce Launch Switching Activity in At-speed Scan Testing Reviewed International journal

Y. Yamato,X. Wen,K. Miyase,H. Furukawa,and S. Kajihara

IEEE 15th Pacific Rim International Symposium on Dependable Computing 81 - 86 2009.11

Optimizing the Percentage of X-Bits to Reduce Switching Activity Reviewed International journal

I. Beppu,K. Miyase,Y. Yamato,X. Wen,and S. Kajihara

IEEE Workshop on Defect and Date Driven Testing 4 Pages 2009.11

A Novel Post-ATPG IR-Drop Reduction Scheme for At-Speed Scan Testing in Broadcast-Scan-Based Test Compression Environment Reviewed International journal

K. Miyase,K. Noda,H. Ito,K. Hatayama,T. Aikyo,Y. Yamato,X. Wen,and S. Kajihara

IEEE/ACM International Conference on Computer Aided Design 97 - 104 2009.11

Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment Reviewed International journal

M.-F. Wu,J.-L. Huang,X. Wen,K. Miyase

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 28 ( 11 ) 1767 - 1776 2009.11

シグナルインテグリティ考慮型LSIテストを目指して Invited Reviewed

温　暁青

信頼性学会誌 31 ( 7 ) 498 - 505 2009.10

LSI回路の低キャプチャ電力テスト生成技術 Invited Reviewed

温暁青

情報・システムソサイエティ誌 ( 電子情報通信学会　情報・システムソサイエティ ) 14 ( 2 ) 16 - 16 2009.08

On Calculation of Delay Range in Fault Simulation for Test Cubes Reviewed International journal

S. Oku,S. Kajihara,K. Miyase,X. Wen,Y. Sato

International Symposium on VLSI Design, Automation, and Test 64 - 67 2009.04

Power-Aware Test Generation for Reducing Yield Loss Risk in At-Speed Scan Testing Invited Reviewed International journal

Y. Yamato,X. Wen,K. Miyase,H. Furukawa,S. Kajihara

Metrology, Reliability and Testing (International Semiconductor Technology Conference & China Semiconductor Technology International Conference) 231 - 236 2009.03

Turbo1500: Core-Based Design for Test and Diagnosis Using IEEE Std. 1500 Reviewed International journal

L..-T. Wang,R. Apte,S. Wu,B. Sheu,K.-J. Lee,X. Wen,W.-B. Jone,C.-H. Yeh,J. Guo,J. Liu,Y.-C. Sung

IEEE Design & Test of Computers 26 ( 1 ) 26 - 35 2009.01

On Delay Calculation in 3-valued Fault Simulation Reviewed International journal

S. Oku,S. Kajihara,K. Miyase,X. Wen,Y. Sato

IEEE Workshop on RTL and High Level Testing 123 - 128 2008.11

Practical Challenges in Logic BIST Implementation Case Studies Reviewed International journal

S. Wu,H. Furukawa,B. Sheu,L.-T. Wang,H.-J. Chao,L. Yu,X. Wen,M. Murakami

IEEE Asian Test Symposium 265 - 265 2008.11

CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme for Reducing Yield Loss Risk in At-Speed Scan Testing Reviewed International journal

H. Furukawa,X. Wen,K. Miyase,Yuta Yamato,S. Kajihara,Patrick Girard,L.-T. Wang,M. Teharanipoor

IEEE Asian Test Symposium 397 - 402 2008.11

Effective IR-Drop Reduction in At-Speed Scan Testing Using Distribution-Controlling X-Identification Reviewed International journal

K. Miyase,K. Noda,H. Ito,K. Hatayama,T. Aikyo,Y. Yamato,H. Furukawa,X. Wen,S. Kajihara

IEEE/ACM International Conference on Computer Aided Design 52 - 58 2008.11

GA-Based X-Filling for Reducing Launch Switching Activity in At-Speed Scan Testing Reviewed International journal

Y. Yamato,X. Wen,K. Miyase,H. Furukawa,S. Kajihara

IEEE Workshop on Defect and Date Driven Testing 4 Pages 2008.10

Identification of IR-drop Hot-spots in Defective Power Distribution Network Using TDF ATPG Reviewed International journal

J. Ma,J. Lee,M. Tehranipoor,X. Wen,A. Crouch

IEEE Workshop on Defect and Date Driven Testing 7 Pages 2008.10

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Papers - WEN Xiaoqing