Papers - WEN Xiaoqing
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A Sextuple Cross-Coupled SRAM Cell Protected against Double-Node Upsets Reviewed
Yan A., Chen Y., Zhou J., Cui J., Ni T., Wen X., Girard P.
Proceedings of the Asian Test Symposium 2020-November 2020.11
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Logic Fault Diagnosis of Hidden Delay Defects Reviewed
Holst S., Kampmann M., Sprenger A., Reimer J.D., Hellebrand S., Wunderlich H.J., Wen X.
Proceedings - International Test Conference 2020-November 2020.11
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Non-Intrusive Online Distributed Pulse Shrinking-Based Interconnect Testing in 2.5D IC Reviewed
Ni T., Chang H., Song T., Xu Q., Huang Z., Liang H., Yan A., Wen X.
IEEE Transactions on Circuits and Systems II: Express Briefs 67 ( 11 ) 2657 - 2661 2020.11
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Design of double-upset recoverable and transient-pulse filterable latches for low-power and low-orbit aerospace applications Reviewed
Yan A., Chen Y., Xu Z., Chen Z., Cui J., Huang Z., Girard P., Wen X.
IEEE Transactions on Aerospace and Electronic Systems 56 ( 5 ) 3931 - 3940 2020.10
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Design of a Highly Reliable SRAM Cell with Advanced Self-Recoverability from Soft Errors Reviewed
Dou Z., Yan A., Zhou J., Hu Y., Chen Y., Ni T., Cui J., Girard P., Wen X.
Proceedings - 2020 IEEE International Test Conference in Asia, ITC-Asia 2020 35 - 40 2020.09
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A Novel Low-Cost TMR-Without-Voter Based HIS-Insensitive and MNU-Tolerant Latch Design for Aerospace Applications Reviewed
Yan A., Xu Z., Yang K., Cui J., Huang Z., Girard P., Wen X.
IEEE Transactions on Aerospace and Electronic Systems 56 ( 4 ) 2666 - 2676 2020.08
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HITTSFL: Design of a cost-effective HIS-Insensitive TNU-Tolerant and SET-Filterable latch for safety-critical applications Reviewed
Yan A., Feng X., Zhao X., Zhou H., Cui J., Ying Z., Girard P., Wen X.
Proceedings - Design Automation Conference 2020-July 2020.07
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Information Assurance through Redundant Design: A Novel TNU Error-Resilient Latch for Harsh Radiation Environment Reviewed
Yan A., Hu Y., Cui J., Chen Z., Huang Z., Ni T., Girard P., Wen X.
IEEE Transactions on Computers 69 ( 6 ) 789 - 799 2020.06
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Design of a Triple-Node-Upset Self-Recoverable Latch for Aerospace Applications in Harsh Radiation Environments Reviewed
Yan A., Feng X., Hu Y., Lai C., Cui J., Chen Z., Miyase K., Wen X.
IEEE Transactions on Aerospace and Electronic Systems 56 ( 2 ) 1163 - 1171 2020.04
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Quadruple Cross-Coupled Dual-Interlocked-Storage-Cells-Based Multiple-Node-Upset-Tolerant Latch Designs Reviewed
Yan A., Ling Y., Cui J., Chen Z., Huang Z., Song J., Girard P., Wen X.
IEEE Transactions on Circuits and Systems I: Regular Papers 67 ( 3 ) 879 - 890 2020.03
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Dual-interlocked-storage-cell-based double-node-upset self-recoverable flip-flop design for safety-critical applications Reviewed
Yan A., Xu Z., Cui J., Ying Z., Huang Z., Liang H., Girard P., Wen X.
Proceedings - IEEE International Symposium on Circuits and Systems 2020-October 2020.01
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Design of a Sextuple Cross-Coupled SRAM Cell with Optimized Access Operations for Highly Reliable Terrestrial Applications Reviewed
Yan A., Wu Z., Zhou J., Hu Y., Chen Y., Ying Z., Wen X., Girard P.
Proceedings of the Asian Test Symposium 2019-December 55 - 60 2019.12
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Targeted partial-shift for mitigating shift switching activity hot-spots during scan test Reviewed
Holst S., Shi S., Wen X.
Proceedings of IEEE Pacific Rim International Symposium on Dependable Computing, PRDC 2019-December 124 - 129 2019.12
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Novel Radiation Hardened Latch Design with Cost-Effectiveness for Safety-Critical Terrestrial Applications Reviewed
Yan A., Wu Z., Lu L., Chen Z., Song J., Ying Z., Girard P., Wen X.
Proceedings of the Asian Test Symposium 2019-December 43 - 48 2019.12
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Variation-aware small delay fault diagnosis on compressed test responses Reviewed
Holst S., Schneider E., Kochte M.A., Wen X., Wunderlich H.J.
Proceedings - International Test Conference 2019-November 2019.11
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A fault-tolerant MPSoC for CubeSats Reviewed International journal
Fuchs C., Chou P., Wen X., Murillo N., Furano G., Holst S., Tavoularis A., Lu S., Plaat A., Marinis K.
2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019 2019.10
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A static method for analyzing hotspot distribution on the LSI Reviewed
Miyase K., Kawano Y., Lu S., Wen X., Kajihara S.
Proceedings - 2019 IEEE International Test Conference in Asia, ITC-Asia 2019 73 - 78 2019.09
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A novel triple-node-upset-tolerant CMOS latch design using single-node-upset-resilient cells Reviewed International journal
Song Z., Yan A., Cui J., Chen Z., Li X., Wen X., Lai C., Huang Z., Liang H.
Proceedings - 2019 IEEE International Test Conference in Asia, ITC-Asia 2019 139 - 144 2019.09
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Power-Aware Testing for Low-Power VLSI Circuits Invited Reviewed International journal
X. Wen
15th IEEE Int'l Conf. on Electron Devices and Solid-State Cirucits Paper S12-1 2019.06
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Small Delay Fault Diagnosis with Compacted Responses Reviewed International journal
S. Holst, E. Schneider, M. A. Kochte, X. Wen, H.-J. Wunderlich
Poster at ACM Design Automation Conf. 2019.06