Papers - WEN Xiaoqing
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On Design for IDDQ-Based Diagnosability of CMOS Circuits Using Multiple Power Supplies Reviewed International journal
X. Wen,S. Kajihara,H. Tamamoto,K. K. Saluja,K. Kinoshita
IEICE Transactions on Information and Systems E88-D ( 4 ) 703 - 710 2005.04
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On Speed-Up of Fault Simulation for Handling Intermediate Faulty Voltages Reviewed
X. Wen, S. kajihara, H. Tamamoto, K.K. Saluja, K. Kinoshita
J88-D-I ( 4 ) 906 - 907 2005.04
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At-Speed Logic BIST for IP Cores Reviewed International journal
B. Cheon,E. Lee,L.-T. Wang,X. Wen,P. Hsu,J. Cho,J. Park,H. Chao,S. Wu
Design Automation, and Test in Europe 860 - 861 2005.03
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Fault Diagnosis for Physical Defects using Unknown Behavior Model Reviewed International journal
X. Wen,H. Tamamoto,K. K. Saluja,K. Kinoshita
Journal of Computer Science and Technology 20 ( 2 ) 187 - 194 2005.03
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Test Compression for Scan Circuits Using Scan Polarity Adjustment and Pinpoint Test Relaxation Reviewed International journal
Y. Doi,S. Kajihara,X. Wen,L. Li,and K. Chakrabarty
ACM Asian and South Pacific Design Automation Conference 59 - 64 2005.01
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On Extraction of a Cube with the Minimum Number of Literals from a Given Input Vector Reviewed International journal
K. Miyase,S. Nagayama,S. Kajihara,X. Wen,and S. M. Reddy
IEEE Workshop on RTL and High Level Testing 71 - 76 2004.11
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On Per-Test Fault Diagnosis Using the X-Fault Model Reviewed International journal
X. Wen,T. Miyoshi,S. Kajiihara,L. Wang,K. K. Saluja,and K. Kinoshita
IEEE/ACM International Conference on Computer Aided Design 633 - 640 2004.11
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VirtualScan: A New Compressed Scan Technology for Test Cost Reduction Reviewed International journal
L.-T. Wang,X. Wen,H. Furukawa,F. Hsu,S. Lin,S. Tsai,K. S. Abdel-Hafez,S. Wu
IEEE International Test Conference 916 - 925 2004.10
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ロジックBIST技術の現状と課題 Invited Reviewed
温暁青，梶原誠司
日本信頼性学会誌 ( 未設定 ) 26 ( 4 ) 252 - 262 2004.06