Papers - WEN Xiaoqing
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A Framework of High-quality Transition Fault ATPG for Scan Circuits Reviewed International journal
S. Kajihara,S. Morishima,A. Takuma,X. Wen,T. Maeda,S. Hamada,Y. Sato
IEEE International Test Conference Paper 2.1 2006.10
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A Novel and Practical Control Scheme for Inter-Clock At-Speed Testing Reviewed International journal
H. Furukawa,X. Wen,L.-T. Wang,B. Sheu,Z. Jiang,S. Wu
IEEE International Test Conference Paper 17.2 2006.10
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Compression/Scan Co-Design for Reducing Test Data Volume, Scan-in Power Dissipation, and Test Application Time Reviewed International journal
Y. Hu,Y. Han,X. Li,H. Li,X. Wen
IEICE Transactions on Information and Systems E89-D ( 10 ) 2616 - 2625 2006.10
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A Highly-Guided X-Filling Method for Effective Low-Capture-Power Scan Test Generation Reviewed International journal
X. Wen,K. Miyase,T. Suzuki,Y. Yamato,S. Kajihara,L.-T. Wang,K. K. Saluja
IEEE International Conference on Computer Design 251 - 258 2006.10
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Hybrid Fault Simulation with Compiled and Event-Driven Methods Reviewed International journal
K. Taniguchi,H. Fujii,S. Kajihara,X. Wen
IEEE International Conference on Design & Test of Integrated Systems in Nanoscale Technology 240 - 243 2006.09
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A New Method for Low-Capture-Power Test Generation for Scan Testing Reviewed International journal
X. Wen,Y. Yamashita,S. Kajiihara,L.-T. Wang,K. K. Saluja,K. Kinoshita
IEICE Transactions on Information and Systems E89-D ( 5 ) 1679 - 1686 2006.05
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A New ATPG Method for Efficient Capture Power Reduction During Scan Testing Reviewed International journal
X. Wen,S. Kajihara,K. Miyase,T. Suzuki,K. K. Saluja,L.-T. Wang,K. S. Abdel-Hafez,K. Kinoshita
IEEE VLSI Test Symposium 58 - 63 2006.04
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A Dynamic Test Compaction Procedure for High-quality Path Delay Testing Reviewed International journal
M. Fukunaga,S. Kajihara,X. Wen,T. Maeda,S. Hamada,Y. Sato
IEEE/ACM Asian and South Pacific Design Automation Conference 348 - 353 2006.01
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On Improving Defect Coverage of Stuck-at Fault Tests Reviewed International journal
K. Miyase, K. Terashima, S. Kajihara, X. Wen, S. M. Reddy
IEEE Asian Test Symposium 216 - 223 2005.12
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Compression/Scan Co-Design for Reducing Test Data Volume, Scan-In Power Dissipation and Test Application Time Reviewed International journal
Y. Hu, Y. Han, X. Li, H. Li, X. Wen
IEEE Pacific Rim International Symposium on Dependable Computing 8 - 8 2005.12
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Efficient Test Set Modification for Capture Power Reduction Reviewed International journal
X. Wen,T. Suzuki,S. Kajihara,K. Miyase,Y. Minamoto,L.-T. Wang,K. K. Saluja
Jounal of Low Power Electrnics 1 ( 3 ) 319 - 330 2005.12
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Low-Capture-Power Test Generation for Scan-Based At-Speed Testing Reviewed International journal
X. Wen,Y. Yamashita,S. Morishima,S. Kajiihara,L.-T. Wang,K. K. Saluja,K. Kinoshita
IEEE International Test Conference Paper 39.2 2005.11
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UltraScan: Using Time-Division Demultiplexing/Multiplexing (TDDM/TDM) with VirtualScan for Test Cost Reduction Reviewed International journal
S. Wu,L.-T. Wang,K. S. Abdel-Hafez,B. Sheu,F. Hsu,S. Lin,M. Chang,X. Wen
IEEE International Test Conference Paper 36.4 2005.11
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At-Speed Logic BIST Archtecture for Multiple-Clock Circuits Reviewed International journal
IEEE International Conference on Computer Design 475 - 478 2005.10
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Wrapper Scan Chains Design for Rapid and Low Power Testing of Embedded Cores Reviewed International journal
Y. Han, Y. Hu, X. Li, H. Li, A. Chandra, X. Wen
IEICE Transactions on Information and Syste E88-D ( 9 ) 2126 - 2134 2005.09
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A Method for Low-Capture-Power At-Speed Test Generation Reviewed International journal
X. Wen,Y. Yamashita,S. Morishima,S. Kajiihara,L.-T. Wang,K. K. Saluja,K. Kinoshita
IEEE Workshop on RTL and High Level Testing 40 - 49 2005.07
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On Quantifying Observability for Fault Diagnosis of VLSI Circuits Reviewed International journal
N. Toyota,X. Wen,S. Kajihara,M. Sanada
IEEE Workshop on RTL and High Level Testing 192 - 197 2005.07
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Path Delay Test Compaction with Process Variation Tolerance Reviewed International journal
S. Kajihara,M. Fukunaga,X. Wen,T. Maeda,S. Hamada,Y. Sato
IEEE/ACM Design Automation Conference 845 - 850 2005.06
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On the Extraction of a Minimum Cube to Justify Signal Line Values Reviewed International journal
K. Miyase,S. Nagayama,S. Kajihara,X. Wen,S. M. Reddy
IEEE European Test Symposium 79 - 84 2005.05
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On Low-Capture-Power Test Generation for Scan Testing Reviewed International journal
X. Wen,Y. Yamashita,S. Kajiihara,L.-T. Wang,K. K. Saluja,K. Kinoshita
IEEE VLSI Test Symposium 265 - 270 2005.05