Faculty Profiles - WEN Xiaoqing

Papers - WEN Xiaoqing

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Reducing Power Supply Noise in Linear-Decompressor-Based Test Data Compression Environment for At-Speed Scan Testing Reviewed International journal

M.-F. Wu,J.-L. Huang,X. Wen,K. Miyase

IEEE International Test Conference Paper 13.1 2008.10

Turbo1500: Toward Core-Based Design for Test and Diagnosis Using IEEE Std. 1500 Reviewed International journal

L.-T. Wang,R. Apte,S. Wu,B. Sheu,K.-J. Lee,X. Wen,W.-B. Jone,C.-H. Yeh,J. Guo,J. Liu,Y.-C. Sung

IEEE International Test Conference Paper 29.3 2008.10

On Optimizing Pattern Count and ATPG Time Using A Hybrid Single-Capture Scheme for Testing Scan Designs Reviewed International journal

B. Sheu,L.-T. Wang,Z. Jiang,J. Soong,S. Wu,R. Apte,X. Wen,C.-M. Li

IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems 143 - 151 2008.10

Test Strategies for Low-Power Devices Invited Reviewed International journal

C. P. Ravikumar,M. Hirech,X. Wen

Journal of Low Power Electronics 4 ( 2 ) 127 - 138 2008.08

Estimation of Delay Test Quality and Its Application to Test Generation Reviewed International journal

S. Kajihara,S. Morishima,M. Yamamoto,X. Wen,M. Fukunaga,K. Hatayama,T. Aikyo

IPSJ Transaction of System LSI Design Methodology 1 104 - 115 2008.08

A Capture-Safe Test Generation Scheme for At-Speed Scan Testing Reviewed International journal

X. Wen,K. Miyase,S. Kajihara,H. Furukawa,Y. Yamato,A. Takashima,K. Noda,H. Ito,K. Hatayama,T. Aikyo,K. K. Saluja

IEEE European Test Symposium 55 - 60 2008.05

Diagnosis of Realistic Defects Based on X-Fault Model Reviewed International journal

I. Polian,Y. Nakamura,P. Engelke,S. Spinner,K. Miyase,S. Kajihara,B. Becker,X. Wen

IEEE International Workshop on Design and Diagnostics of Electronic Circuits and Systems 263 - 266 2008.04

Test Strategies for Low-Power Devices Invited Reviewed International journal

C. P. Ravikumar,M. Hirech,X. Wen

Design Automation, and Test in Europe 728 - 733 2008.03

VirtualScan: A Test Compression Technology Using Combinational Logic and One-Pass ATPG Reviewed International journal

L.-T. Wang,X. Wen,S. Wu,Z. Wang,Z. Jiang,B. Sheu,X. Gu

IEEE Design & Test of Computers 25 ( 2 ) 122 - 130 2008.03

On Detection of Bridge Defects with Stuck-at Tests Reviewed International journal

K. Miyase,K. Terashima,X. Wen,S. Kajiihara,and S. M Reddy

IEICE Transactions on Information and Systems E91-D ( 3 ) 683 - 689 2008.03

A Novel Per-Test Fault Diagnosis Method Based On the Extended X-Fault Model for Deep-Submicron LSI Circuits Reviewed International journal

Y. Yamato,Y. Nakamura,K. Miyase,X. Wen,and S. Kajihara

IEICE Transactions on Information and Systems E91-D ( 3 ) 667 - 674 2008.03

Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing Reviewed International journal

X. Wen,K. Miyase,T. Suzuki,S. Kajiihara,L.-T. Wang,K. K. Saluja,K. Kinoshita

Journal of Electronic Testing: Theory and Applications, Special Issue on Low Power Testing 24 ( 4 ) 379 - 391 2008.01

Estimation of Delay Test Quality and Its Application to Test Generation Reviewed International journal

S. Kajihara,S. Morishima,M. Yamamoto,X. Wen,M. Fukunaga,K. Hatayama,and T. Aikyo

IEEE/ACM International Conference on Computer Aided Design 413 - 417 2007.11

A Method for Improving the Bridging Defect Coverage of a Transition Delay Test Set Reviewed International journal

K. Miyase,X. Wen,S. Kajihara,M. Haraguchi,H. Furukawa

IEEE International Workshop on Defect Based Testing 51 - 56 2007.10

A Novel Scheme to Reduce Power Supply Noise for High-Quality At-Speed Scan Testing Reviewed International journal

X. Wen,K. Miyase,S. Kajihara,T. Suzuki,Y. Yamato,P. Girard,Y. Ohsumi,and L.-T. Wang

IEEE International Test Conference 25.1 2007.10

A Novel ATPG Method for Capture Power Reduction During Scan Testing Reviewed International journal

X. Wen,S. Kajiihara,K. Miyase,T. Suzuki,K. K. Saluja,L.-T. Wang,K. Kinoshita

IEICE Transactions on Information and Systems E90-D ( 9 ) 1398 - 1405 2007.09

Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing Reviewed International journal

X. Wen,K. Miyase,T. Suzuki,S. Kajihara,Y. Ohsumi,K. K. Saluja

IEEE/ACM Design Automation Conference 527 - 532 2007.06

An Improved Method of Per-Test X-Fault Diagnosis for Deep-Submicron LSI Circuits Reviewed International journal

X. Wen,Y. Yamato,K. Miyase,S. Kajihara,L.-T. Wang,K. K. Saluja,K. Kinoshita

IEEE Workshop on RTL and High Level Testing 55 - 60 2006.11

Test Data Compression Based on Clustered Random Access Scan Reviewed International journal

Y. Hu,C. Li,J. Li,Y. Han,X. Li,W. Wang,H. Li,L.-T. Wang,X. Wen

IEEE Asian Test Symposium 231 - 236 2006.11

A Per-Test Fault Diagnosis Method Based on the X-Fault Model Reviewed International journal

X. Wen,S. Kajiihara,K. Miyase,Y. Yamato,L.-T. Wang,K. K. Saluja,K. Kinoshita

IEICE Transactions on Information and System E89-D ( 11 ) 2756 - 2765 2006.11

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Papers - WEN Xiaoqing