Faculty Profiles - WEN Xiaoqing

Papers - WEN Xiaoqing

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On Pinpoint Capture Power Management in At-Speed Scan Test Generation Reviewed International journal

X. Wen, Y. Nishida, K. Miyase, S. Kajihara, P. Girard, M. Tehranipoor, L.-T. Wang

IEEE International Test Conference Paper 6.1 2012.11

Launch-on-Shift Test Generation for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains Reviewed International journal

S. Wu, L.-T. Wang, X. Wen, Z. Jiang, W.-B. Jone, M. S. Hsiao, L. Tan, Y. Zhang, C.-M. Li, J.-L. Huang

ACM Transactions on Design Automation of Electronic Systems 17 ( 4 ) Article No. 48 2012.10

A Transition Isolation Scan Cell Design for Low Shift and Capture Power Reviewed International journal

Y.-T. Lin, J.-L. Huang, X. Wen

VLSI Test Technology Workshop 2012.07

Power-Aware Testing: The Next Stage Invited Reviewed International journal

X. Wen

IEEE European Test Symposium Invited Talk 2012.05

Authorship：Corresponding author Language：English Publishing type：Research paper (international conference proceedings)

France Annecy 2012.05.28 - 2012.06.01

DOI： 10.1109/ETS.2012.6233000

Scopus

Other Link： https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84864686941&origin=inward

A Novel Capture-Safety Checking Method for Multi-Clock Designs and Accuracy Evaluation with Delay Capture Circuits Reviewed International journal

K. Miyase, M. Aso, R. Ootsuka, X. Wen, H. Furukawa, Y. Yamato, K, Enokimoto, S. Kajihara

IEEE VLSI Test Symposium 197 - 202 2012.04

Layout-Aware Pattern Evaluation and Analysis for Power-Safe Application of TDF Patterns Reviewed International journal

H. Salmani, W. Zhao, M. Tehranipoor, S. Chacravarty, P. Girard, X. Wen

ASP Journal of Lower Power Electronics 8 ( 2 ) 248 - 258 2012.04

Fault Detection with Optimum March Test Algorithm Reviewed International journal

N.A. Zakaria, W.Z.W. Hasan, I.A. Halin, R.M. Sidek, X. Wen

IEEE International Conference on Intelligent Systems, Modeling and Simulation Paper S8 2012.02

Testing static single cell faults using static and dynamic data background Reviewed International journal

N.A. Zakaria, W.Z.W. Hasan, I.A. Halin, R.M. Sidek, X. Wen

IEEE Student Conference on Research and Development 1 - 6 2011.12

Additional Path Delay Fault Detection with Adaptive Test Data Reviewed International journal

K. Miyase, H. Tanaka, K. Enokimoto, X. Wen, S. Kajihara

IEEE Workshop on RTL and High Level Testing 31 - 34 2011.11

Effective Launch Power Reduction for Launch-Off-Shift Scheme with Adjacent-Probability-Based X-Filling Reviewed International journal

K. Miyase, U. Uchinodan, K. Enokimoto, Y. Yamato, X. Wen, S. Kajihara, F. Wu, L. Dilillo, A. Bosio, P. Girard

IEEE Asian Test Symposium 90 - 95 2011.11

Power-Aware Test Pattern Generation for At-Speed LOS Testing Reviewed International journal

A. Bosio, L. Dilillo, P. Girard, A. Todri, A. Virazel, K. Miyase, X. Wen

IEEE Asian Test Symposium 506 - 510 2011.11

Efficient BDD-based Fault Simulation in Presence of Unknown Values Reviewed International journal

M. A. Kochte, S. Kundu, K. Miyase, X. Wen, H.-J. Wunderlich

IEEE Asian Test Symposium 383 - 388 2011.11

Towards the Next Generation of Low-Power Test Technologies Reviewed International journal

X. Wen

IEEE International Conference on ASIC Paper 1E-1 2011.10

Architectures for Testing 3D Chips Using Time-Division Demultiplexing/Multiplexing Reviewed International journal

L.-T. Wang, N. A. Touba, M. S. Hsiao, J.-L. Huang, C.-M. Li, S. Wu, X. Wen, M. Bhattarai, F. Li, Z. Jiang

IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits Paper 5.4 2011.09

A Novel Scan Segmentation Design Method for Avoiding Shift Timing Failure in Scan Testing Reviewed International journal

IEEE International Test Conference Paper 12.1 2011.09

Clock-Gating-Aware Low Launch WSA Test Pattern Generation for At-Speed Scan Testing Reviewed International journal

Y.-T. Lin, J.-L. Huang, X. Wen

IEEE International Test Conference Paper 2.3 2011.09

SAT-based Capture-Power Reduction for At-Speed Broadcast-Scan-Based Test Compression Architectures Reviewed International journal

M. A. Kochte, K. Miyase, X. Wen, S. Kajihara, Y. Yamato, K. Enokimoto, H.-J. Wunderlich

IEEE International Symposium on Low Power Electronics and Design 33 - 38 2011.08

低消費電力LSIのための低消費電力テスト技術 Invited Reviewed

温暁青

情報・システムソサイエティ誌 ( 電子情報通信学会　情報・システムソサイエティ ) 16 ( 2 ) 10 - 11 2011.08

VLSI Testing and Test Power Reviewed International journal

X. Wen

Workshop on Low Power System on Chip Paper 4.1 2011.07

Distribution-Controlled X-Identification for Effective Reduction of Launch-Induced IR-Drop in At-Speed Scan Testing Reviewed International journal

K. Miyase, K. Noda, H. Ito, K. Hatayama, T. Aikyo, Y. Yamato, H. Furukawa, X. Wen, S. Kajihara

IEICE Transactions on Information and Systems E94-D ( 6 ) 1216 - 1226 2011.06

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Papers - WEN Xiaoqing