Faculty Profiles - WEN Xiaoqing

Papers - WEN Xiaoqing

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GPU-Accelerated Small Delay Fault Simulation Reviewed International journal

E. Schneider, S. Holst, M.-A. Kochte, X. Wen, H.-J. Wunderlich

Design and Test in Europe 1174 - 1179 2015.03

Towards Memory-Aware VLSI Simulation Algorithms for Heterogeneous Architectures Reviewed International journal

S. Holst, J. Miyazaki, X. Wen

International Symposium on Applied Engineering and Sciences 2014.12

Soft-Error Tolerant TCAMs for High-Reliability Packet Classification Reviewed International journal

IEEE Asia Pacific Conference on Circuits and Systems 471 - 474 2014.11

Data-Parallel Simulation for Fast and Accurate Timing Validation of CMOS Circuits Reviewed International journal

E. Schneider, S. Holst, X. Wen, H. Wunderlich

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD 17 - 23 2014.11

On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST Reviewed International journal

A. Tomita, X. Wen, Y. Sato, S. Kajihara, P. Girard, M. Tehranipoor, L.-T. Wang

IEICE Transactions on Information and Systems E97 ( 10 ) 2706 - 2718 2014.10

An X-Filling Method for Low-Capture-Power Scan Test Generation

Li Fuqiang, Wen Xiaoqing, Miyase Kohei, Holst Stefan, Kajihara Seiji

IEICE technical report. Dependable computing ( The Institute of Electronics, Information and Communication Engineers ) 114 ( 99 ) 15 - 20 2014.06

Language：English Publishing type：Research paper (conference, symposium, etc.)

In order to generate a low capture power test pattern, we propose an X-filling method to suppress local switching activity (LSA), which is a local signal value transition metric that has a strong correlation with IR-Drop. In this method, after having divided the layout of a circuit into unit areas and then determined the priorities of X bits in a test cube based on the LSA of each unit area, we assign to X bits appropriate logic values which are easy to propagate. Experimental results show that the proposed method can effectively reduce the LSA in unit areas.

CiNii Article

Other Link： https://ci.nii.ac.jp/naid/110009925706

Data-Parallel Switch-Level Simulation for Fast and Accurate Timing Validation of CMOS Circuits Reviewed International journal

E. Schneider, S. Holst, X. Wen, H.-J. Wunderlich

ACM Design Automation Conference Poster 2014.06

Low-power testing for 2D/3D devices and systems Reviewed International journal

235 - 277 2014.01

ATPG Enhancement Technology Reviewed International journal

IEEE Workshop on RTL and High Level Testing Paper IV.5.S 2013.11

On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST Reviewed International journal

A. Tomita, X. Wen, Y. Sato, S. Kajihara, P. Girard, M. Tehranipoor, L.-T. Wang

IEEE Asian Test Symposium 19 - 24 2013.11

Search Space Reduction for Low-Power Test Generation Reviewed International journal

IEEE Asian Test Symposium 171 - 176 2013.11

Test Pattern Modification for Average IR-drop Reduction Reviewed International journal

J. Li, W-S. Ding, H-Y. Hsieh, X. Wen

IEEE International Test Conference Poster 2013.09

A Capture-Safety Checking Metric Based on Transition-Time-Relation for At-Speed Scan Testing Reviewed International journal

K. Miyase, R. Sakai, X. Wen, M. Aso, H. Furukawa, Y. Yamato, S. Kajihara

IEICE Transaction on Information and Systems E96-D ( 9 ) 2003 - 2011 2013.09

SafeTIDE: A Technique for Transition Isolation Scan Cells Hardware Overhead Reduction Reviewed International journal

Y.-T. Lin, J.-L. Huang, X. Wen

VLSI Test Technology Workshop Paper 4.4 2013.07

Controllability Analysis of Local Switching Activity for Layout Design Reviewed International journal

K. Miyase, M. Sauer, B. Becker, X. Wen, S. Kajihara

Workshop on Design and Test Methodologies for Emerging Technologies Paper 2 2013.05

LCTI-SS: Low-Clock-Tree-Impact Scan Segmentation for Avoiding Shift Timing Failures in Scan Testing Reviewed International journal

Y. Yamato, X. Wen, M. A. Kochte, K. Miyase, S. Kajihara, L.-T. Wang

IEEE Design & Test of Computers 30 ( 4 ) 60 - 70 2013.04

On Guaranteeing Capture Safety in At-Speed Scan Testing with Broadcast-Scan-Based Test Compression Reviewed International journal

26th International Conference on VLSI Design 279 - 284 2013.01

Fault Detection with Optimum March Test Algorithm Reviewed International journal

N. Zakaria, W. Hassan, I. Halin, R. Sidek, X. Wen

Journal of Theoretical and Applied Information Technology 47 ( 1 ) 18 - 27 2013.01

Estimation of the Amount of Don't-Care Bits in Test Vectors Reviewed International journal

K. Miyase, S. Kajihara, X. Wen

IEEE Workshop on RTL and High Level Testing 2012.11

A Transition Isolation Scan Cell Design for Low Shift and Capture Power Reviewed International journal

Y.-T. Lin, J.-L Huang, X. Wen

IEEE Asian Test Symposium 107 - 112 2012.11

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Papers - WEN Xiaoqing