研究者詳細 - 温　暁青

論文 - 温　暁青

分割表示269 件中 201 - 220 件目／全件表示 >>

CAT (Critical-Area-Targeted): A New Paradigm for Reducing Yield Loss Risk in At-Speed Scan Testing 招待有り査読有り国際誌

X. Wen, K. Enokimoto, K. Miyase, S. Kajihara, M. Aso, H. Furukawa

Symposium II (International Semiconductor Technology Conference & China Semiconductor Technology International Conference) 197 - 202 2010年03月

Using Launch-on-Capture for Testing BIST Designs Containing Synchronous and Asynchronous Clock Domains 査読有り国際誌

L.-T. Wang,X. Wen,S. Wu,H. Furukawa,H.-J. Chao,B. Sheu,J. Guo,and W.-B. Jone

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 29 ( 2 ) 299 - 312 2010年02月

A Path Selection Method for Delay Test Targeting Transistor Aging 査読有り国際誌

M. Noda,S. Kajihara,Y. Sato,K. Miyase,X. Wen,and Y. Miura

IEEE International Workshop on Reliability Aware System Design and Test 57 - 61 2010年01月

X-Identification According to Required Distribution for Industrial Circuits 査読有り国際誌

I. Beppu,K. Miyase,Y. Yamato,X. Wen,and S. Kajihara

IEEE Workshop on RTL and High Level Testing 76 - 81 2009年11月

CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing 査読有り国際誌

K. Enokimoto,X. Wen,Y. Yamato,K. Miyase,H. Sone,S. Kajihara,M. Aso,and H. Furukawa

IEEE Asian Test Symposium 99 - 104 2009年11月

A GA-Based Method for High-Quality X-Filling to Reduce Launch Switching Activity in At-speed Scan Testing 査読有り国際誌

Y. Yamato,X. Wen,K. Miyase,H. Furukawa,and S. Kajihara

IEEE 15th Pacific Rim International Symposium on Dependable Computing 81 - 86 2009年11月

Optimizing the Percentage of X-Bits to Reduce Switching Activity 査読有り国際誌

I. Beppu,K. Miyase,Y. Yamato,X. Wen,and S. Kajihara

IEEE Workshop on Defect and Date Driven Testing 4 Pages 2009年11月

A Novel Post-ATPG IR-Drop Reduction Scheme for At-Speed Scan Testing in Broadcast-Scan-Based Test Compression Environment 査読有り国際誌

K. Miyase,K. Noda,H. Ito,K. Hatayama,T. Aikyo,Y. Yamato,X. Wen,and S. Kajihara

IEEE/ACM International Conference on Computer Aided Design 97 - 104 2009年11月

Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment 査読有り国際誌

M.-F. Wu,J.-L. Huang,X. Wen,K. Miyase

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 28 ( 11 ) 1767 - 1776 2009年11月

シグナルインテグリティ考慮型LSIテストを目指して招待有り査読有り

温　暁青

信頼性学会誌 31 ( 7 ) 498 - 505 2009年10月

LSI回路の低キャプチャ電力テスト生成技術招待有り査読有り

温暁青

情報・システムソサイエティ誌 ( 電子情報通信学会　情報・システムソサイエティ ) 14 ( 2 ) 16 - 16 2009年08月

On Calculation of Delay Range in Fault Simulation for Test Cubes 査読有り国際誌

S. Oku,S. Kajihara,K. Miyase,X. Wen,Y. Sato

International Symposium on VLSI Design, Automation, and Test 64 - 67 2009年04月

Power-Aware Test Generation for Reducing Yield Loss Risk in At-Speed Scan Testing 招待有り査読有り国際誌

Y. Yamato,X. Wen,K. Miyase,H. Furukawa,S. Kajihara

Metrology, Reliability and Testing (International Semiconductor Technology Conference & China Semiconductor Technology International Conference) 231 - 236 2009年03月

Turbo1500: Core-Based Design for Test and Diagnosis Using IEEE Std. 1500 査読有り国際誌

L..-T. Wang,R. Apte,S. Wu,B. Sheu,K.-J. Lee,X. Wen,W.-B. Jone,C.-H. Yeh,J. Guo,J. Liu,Y.-C. Sung

IEEE Design & Test of Computers 26 ( 1 ) 26 - 35 2009年01月

On Delay Calculation in 3-valued Fault Simulation 査読有り国際誌

S. Oku,S. Kajihara,K. Miyase,X. Wen,Y. Sato

IEEE Workshop on RTL and High Level Testing 123 - 128 2008年11月

Practical Challenges in Logic BIST Implementation Case Studies 査読有り国際誌

S. Wu,H. Furukawa,B. Sheu,L.-T. Wang,H.-J. Chao,L. Yu,X. Wen,M. Murakami

IEEE Asian Test Symposium 265 - 265 2008年11月

CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme for Reducing Yield Loss Risk in At-Speed Scan Testing 査読有り国際誌

H. Furukawa,X. Wen,K. Miyase,Yuta Yamato,S. Kajihara,Patrick Girard,L.-T. Wang,M. Teharanipoor

IEEE Asian Test Symposium 397 - 402 2008年11月

Effective IR-Drop Reduction in At-Speed Scan Testing Using Distribution-Controlling X-Identification 査読有り国際誌

K. Miyase,K. Noda,H. Ito,K. Hatayama,T. Aikyo,Y. Yamato,H. Furukawa,X. Wen,S. Kajihara

IEEE/ACM International Conference on Computer Aided Design 52 - 58 2008年11月

GA-Based X-Filling for Reducing Launch Switching Activity in At-Speed Scan Testing 査読有り国際誌

Y. Yamato,X. Wen,K. Miyase,H. Furukawa,S. Kajihara

IEEE Workshop on Defect and Date Driven Testing 4 Pages 2008年10月

Identification of IR-drop Hot-spots in Defective Power Distribution Network Using TDF ATPG 査読有り国際誌

J. Ma,J. Lee,M. Tehranipoor,X. Wen,A. Crouch

IEEE Workshop on Defect and Date Driven Testing 7 Pages 2008年10月

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