論文 - 温 暁青
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TPDICE and SIM based 4-node-upset completely hardened latch design for highly robust computing in harsh radiation 査読有り
Yan A., Ding L., Shan C., Cai H., Chen X., Wei Z., Huang Z., Wen X.
Proceedings - IEEE International Symposium on Circuits and Systems 2021-May 2021年01月
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On the efficacy of scan chain grouping for mitigating IR-drop-induced test data corruption 査読有り 国際誌
Zhang Y., Holst S., Wen X., Miyase K., Kajihara S., Qian J.
IEICE Transactions on Information and Systems ( 一般社団法人 電子情報通信学会 ) E104D ( 6 ) 816 - 827 2021年01月
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Parallel DICE Cells and Dual-Level CEs based 3-Node-Upset Tolerant Latch Design for Highly Robust Computing 査読有り 国際誌
Yan A., Zhai Z., Wang L., Zhang J., Cui N., Ni T., Wen X.
Proceedings - 2021 IEEE International Test Conference in Asia, ITC-Asia 2021 2021年01月
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LSI Testing: A Core Technology to a Successful LSI Industry 招待有り 査読有り 国際誌
Wen X.
Proceedings of International Conference on ASIC 2021年01月
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GoodFloorplan: Graph Convolutional Network and Reinforcement Learning Based Floorplanning 査読有り 国際誌
Xu Q., Geng H., Chen S., Yuan B., Zhuo C., Kang Y., Wen X.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 41 ( 10 ) 3492 - 3502 2021年01月
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Fortune: A New Fault-Tolerance TSV Configuration in Router-based Redundancy Structure 査読有り 国際誌
Xu Q., Ni T., Geng H., Chen S., Yu B., Kang Y., Wen X.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 41 ( 10 ) 3182 - 3187 2021年01月
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A Sextuple Cross-Coupled Dual-Interlocked-Storage-Cell based Multiple-Node-Upset Self-Recoverable Latch 査読有り 国際誌
Yan A., Qian K., Cui J., Cui N., Ni T., Huang Z., Wen X.
2021 IEEE/ACM International Symposium on Nanoscale Architectures, NANOARCH 2021 2021年01月
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A Reliable and Low-Cost Flip-Flop Hardened against Double-Node-Upsets 査読有り 国際誌
Yan A., Cao A., Qian K., Ding L., He Z., Fan Z., Wen X.
Proceedings - 2021 8th International Conference on Dependable Systems and Their Applications, DSA 2021 734 - 736 2021年01月
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Novel Speed-and-Power-Optimized SRAM Cell Designs with Enhanced Self-Recoverability from Single- And Double-Node Upsets 査読有り 国際誌
Yan A., Chen Y., Hu Y., Zhou J., Ni T., Cui J., Girard P., Wen X.
IEEE Transactions on Circuits and Systems I: Regular Papers 67 ( 12 ) 4684 - 4695 2020年12月
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A Sextuple Cross-Coupled SRAM Cell Protected against Double-Node Upsets 査読有り
Yan A., Chen Y., Zhou J., Cui J., Ni T., Wen X., Girard P.
Proceedings of the Asian Test Symposium 2020-November 2020年11月
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Logic Fault Diagnosis of Hidden Delay Defects 査読有り
Holst S., Kampmann M., Sprenger A., Reimer J.D., Hellebrand S., Wunderlich H.J., Wen X.
Proceedings - International Test Conference 2020-November 2020年11月
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Non-Intrusive Online Distributed Pulse Shrinking-Based Interconnect Testing in 2.5D IC 査読有り 国際誌
Ni T., Chang H., Song T., Xu Q., Huang Z., Liang H., Yan A., Wen X.
IEEE Transactions on Circuits and Systems II: Express Briefs 67 ( 11 ) 2657 - 2661 2020年11月
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Design of double-upset recoverable and transient-pulse filterable latches for low-power and low-orbit aerospace applications 査読有り
Yan A., Chen Y., Xu Z., Chen Z., Cui J., Huang Z., Girard P., Wen X.
IEEE Transactions on Aerospace and Electronic Systems 56 ( 5 ) 3931 - 3940 2020年10月
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Design of a Highly Reliable SRAM Cell with Advanced Self-Recoverability from Soft Errors 査読有り
Dou Z., Yan A., Zhou J., Hu Y., Chen Y., Ni T., Cui J., Girard P., Wen X.
Proceedings - 2020 IEEE International Test Conference in Asia, ITC-Asia 2020 35 - 40 2020年09月
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A Novel Low-Cost TMR-Without-Voter Based HIS-Insensitive and MNU-Tolerant Latch Design for Aerospace Applications 査読有り
Yan A., Xu Z., Yang K., Cui J., Huang Z., Girard P., Wen X.
IEEE Transactions on Aerospace and Electronic Systems 56 ( 4 ) 2666 - 2676 2020年08月
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HITTSFL: Design of a cost-effective HIS-Insensitive TNU-Tolerant and SET-Filterable latch for safety-critical applications 査読有り
Yan A., Feng X., Zhao X., Zhou H., Cui J., Ying Z., Girard P., Wen X.
Proceedings - Design Automation Conference 2020-July 2020年07月
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Information Assurance through Redundant Design: A Novel TNU Error-Resilient Latch for Harsh Radiation Environment 査読有り
Yan A., Hu Y., Cui J., Chen Z., Huang Z., Ni T., Girard P., Wen X.
IEEE Transactions on Computers 69 ( 6 ) 789 - 799 2020年06月
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Design of a Triple-Node-Upset Self-Recoverable Latch for Aerospace Applications in Harsh Radiation Environments 査読有り
Yan A., Feng X., Hu Y., Lai C., Cui J., Chen Z., Miyase K., Wen X.
IEEE Transactions on Aerospace and Electronic Systems 56 ( 2 ) 1163 - 1171 2020年04月
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Quadruple Cross-Coupled Dual-Interlocked-Storage-Cells-Based Multiple-Node-Upset-Tolerant Latch Designs 査読有り 国際誌
Yan A., Ling Y., Cui J., Chen Z., Huang Z., Song J., Girard P., Wen X.
IEEE Transactions on Circuits and Systems I: Regular Papers 67 ( 3 ) 879 - 890 2020年03月
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Dual-interlocked-storage-cell-based double-node-upset self-recoverable flip-flop design for safety-critical applications 査読有り
Yan A., Xu Z., Cui J., Ying Z., Huang Z., Liang H., Girard P., Wen X.
Proceedings - IEEE International Symposium on Circuits and Systems 2020-October 2020年01月