論文 - 温 暁青
-
Incremental learning strategies for improved detection of unknown defects in wafer maps with limited samples 査読有り 国際誌
Ni T., Jiang W., Liang H., Wen X., Nie M.
Computers in Industry 175 2026年02月
-
Design and verification of a robust near-memory computing architecture for image fusion tasks 査読有り 国際誌
Yan A. (Heifei University of Technology), Bao H. (Heifei University of Technology), Cui J. (Heifei University of Technology), Waris H., Li J. (Heifei University of Technology), Wen X.
Microelectronics Journal 168 2026年02月
-
A Highly Robust and Low-Cost Multiple Node Upset Resilient Fast Latch for Radiation Applications 査読有り 国際誌
Bai N., Wang F., Xu Y., Wang S., Wen X.
IEEE Transactions on Aerospace and Electronic Systems 62 4411 - 4421 2026年01月
-
ACDRL: Aging-Mitigated C-Elements Based Double-Node-Upset-Recoverable Latch for Long-Term Reliability Enhancement 査読有り 国際誌
Dong C. (Heifei University of Technology), Yan A. (Heifei University of Technology), Guo X. (Heifei University of Technology), Pei Z. (Heifei University of Technology), Wang Q. (Heifei University of Technology), Huang Z. (Heifei University of Technology), Girard P., Wen X.
IEEE Transactions on Aerospace and Electronic Systems 62 6645 - 6652 2026年01月
-
Algorithm-Aided Design and Verification for Multiple-Node-Upset-Recovery Latches 査読有り 国際誌
Pei Z., Li J., Waris H., Younis M.S., Yan A., Deng J., Gui Y., Wen X.
Proceedings IEEE International Symposium on Circuits and Systems 4063 - 4067 2026年01月
-
Automated Co-Optimization Framework of Feature Selection and Ensemble Learning for Wafer Yield Prediction 査読有り 国際誌
Ni T., Wu H., Cheng M., Bian J., Wang S., Wen X., Nie M.
IEEE Transactions on Automation Science and Engineering 23 11245 - 11257 2026年01月
-
FN2LD: FeFET-based nonvolatile and node-upset-recovery latch designs with cost optimization 査読有り 国際誌
Yan A. (Heifei University of Technology), Jiang W. (Heifei University of Technology), Wang H. (Heifei University of Technology), Kang B. (Heifei University of Technology), Huang Z. (Heifei University of Technology), Ni T., Wen X., Girard P.
Microelectronics Journal 167 2026年01月
-
Locating Hotspots based on Switching Probability Calculation and Functional Analysis with Partial Truth Table 査読有り 国際誌
OGATA Yuusei, YAMASHITA Tomoya, MIYASE Kohei, LU Shyue-Kung, WEN Xiaoqing
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences ( 一般社団法人 電子情報通信学会 ) advpub ( 0 ) 1638 - 1648 2026年01月
-
Low-Delay, High-Robustness DNU Self-Healing Latch Based on the C-Element Feedback Loop 査読有り 国際誌
Bai N., Xu P., Xu Y., Wen X.
IEEE Transactions on Aerospace and Electronic Systems 62 5974 - 5985 2026年01月
-
RMC PUF: A Highly Reliable PUF Architecture Based on Recursive Markov Chain Obfuscation 査読有り 国際誌
Huang Z., Yang Z., Sun X., Lu Y., Bian J., Ouyang Y., Ni T., Wen X.
IEEE Transactions on Very Large Scale Integration VLSI Systems 34 ( 8 ) 2558 - 2570 2026年01月
-
A Challenge-Response Remapping Reliability Enhancement Method for APUF Based on Adjacent Challenge-Bit Flipping 査読有り 国際誌
Lin Y., Gao B., Bian J., Liang H., Huang Z., Wen X.
IEEE Internet of Things Journal 2026年01月
-
A method for integrated circuit trimming focused on separation of trim codes 査読有り 国際誌
Zhan W., Zhou Y., Zheng J., Wen X.
Microelectronics Reliability 174 2025年11月
-
A lightweight general PUF framework for resisting machine learning attacks 査読有り 国際誌
Ni T., Li F., Huang Z., Yan A., Wang S., Wen X., Nie M., Bian J.
Integration 104 2025年09月
-
SASL-JTAG+: An Enhanced Lightweight and Secure JTAG Authentication Mechanism for IoT Systems with Diverse Devices 査読有り 国際誌
OKAMOTO Hisashi, WEI Shaoqi, WANG Senling, KAI Hiroshi, TAKAHASHI Hiroshi, HIGAMI Yoshinobu, SHIMIZU Akihiro, NI Tianming, WEN Xiaoqing
Journal of Communications ( Engineering and Technology Publishing ) 20 ( 2 ) 214 - 220 2025年04月
-
An enhanced interlocked feedback structure-based dual-node upset resilient latch 査読有り 国際誌
Bai N., Liu Z., Wen X., Xu Y., Wang Y., Chen J., Zhu W.
Microelectronics Journal 157 2025年03月
-
A Method for Grading Failure Rates Within the Dynamic Effective Space of Integrated Circuits After Testing 査読有り 国際誌
Zhan W., Zhou Y., Zheng J., Cai X., Zhang Q., Wen X.
Applied Sciences Switzerland 15 ( 4 ) 2025年02月
-
TUTPFL: Triple Node Upset-Tolerant and Single-Event Transient-Filtered Low-Power Latch With HSPICE and FPGA-Based Verifications 査読有り 国際誌
Yan A. (合肥工業大学), Zhang J., Xu X., Li H., Bai N., Huang Z., Wang X., Wen X., Girard P.
IEEE Transactions on Very Large Scale Integration VLSI Systems 33 ( 10 ) 2783 - 2794 2025年01月
-
RHT_NoC: A Reconfigurable Hybrid Topology Architecture for Chiplet-Based Multicore System 査読有り 国際誌
Xu D., Zhou W., Huang Z., Liang H. (合肥工業大学), Wen X.
IEEE Transactions on Very Large Scale Integration VLSI Systems 33 ( 8 ) 2104 - 2117 2025年01月
-
SASL-JTAG+: An Enhanced Lightweight and Secure JTAG Authentication Mechanism for IoT Systems with Diverse Devices 査読有り 国際誌
Okamoto H., Wei S., Wang S., Kai H., Takahashi H., Higami Y., Shimizu A., Ni T., Wen X.
Journal of Communications 20 ( 2 ) 214 - 220 2025年01月
-
Segmentation-Enhanced Overlapped Defect Identification for Multipatterns Wafer Maps 査読有り 国際誌
Ni T., Jiang W., Liang H. (合肥工業大学), Wen X., Nie M.
IEEE Transactions on Instrumentation and Measurement 74 2025年01月