論文 - 温 暁青
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Reconfigurable Fault-Tolerant Link With Bandwidth Expansion for 2.5-D Chiplet-Based Systems 査読有り 国際誌
Zhou W., Xu D., Xu S., Luo L., Chen F., Ni T., Wen X.
IEEE Transactions on Very Large Scale Integration VLSI Systems 33 ( 11 ) 3043 - 3056 2025年01月
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A Low-Cost Input-split Inverter-based Triple-Node-Upset Recoverable Latch Design 査読有り 国際誌
Bai N., Xu P., Xu Y., Yan A., Wen X., Wang S., Xia Y.
IEEE Transactions on Computer Aided Design of Integrated Circuits and Systems 45 ( 4 ) 1963 - 1974 2025年01月
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An Accelerated Newton-Based Matrix Splitting Iteration Method for Mixed-Cell-Height Circuit Legalization 査読有り 国際誌
Zhou C., Cao Y., Yang F., Wen X., Shi Q., Rong R., Yang A.
IEEE Transactions on Computer Aided Design of Integrated Circuits and Systems 45 ( 3 ) 1535 - 1548 2025年01月
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NVLIM: MTJ and CMOS-Based Nonvolatile Latch Design With Protection Against Triple-Node-Upsets for Robust Computing 査読有り 国際誌
Yan A., Zhang Y., Wang L., Huang Z., Zhang Q., Ni T., Girard P., Wen X.
IEEE Transactions on Very Large Scale Integration VLSI Systems 34 ( 1 ) 268 - 279 2025年01月
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QtNURAV: A Robust Latch Design with Quintuple Node Upset Recovery and Algorithm based Verifications for Aerospace Applications 査読有り 国際誌
Yan A., Li J., Bao H., Ni T., Huang Z., Liang B., Girard P., Wen X.
IEEE Transactions on Aerospace and Electronic Systems 61 ( 6 ) 18543 - 18554 2025年01月
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A Parallel Feedback Obfuscation Strong PUF against Machine-Learning Modeling Attacks and Lightweight Authentication Protocol 査読有り 国際誌
Huang Z., Lin Y., Wang Z., Lu Y., Liang H., Bian J., Ouyang Y., Ni T., Wen X.
IEEE Transactions on Dependable and Secure Computing 23 ( 2 ) 3051 - 3067 2025年01月
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Radiation-Hardened SRAM Designs for Self-Recovery From All Single-and Double-Node Upsets 査読有り 国際誌
Yan A., Li J., Li K., Wang W., Huang Z., Ni T., Wang Q., Girard P., Wen X.
IEEE Transactions on Device and Materials Reliability 26 ( 1 ) 167 - 177 2025年01月
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LLM-Design Platform for Thermal-Failure-Aware 3D Chiplet Layout via Iterative Parameter Analysis 査読有り 国際誌
Song T., Wang S., Wen X.
Proceedings 2025 IEEE 34th Asian Test Symposium Ats 2025 55 - 60 2025年01月
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Radiation-Resistant ZnO Thin-Film Transistor Voltage Reference 査読有り 国際誌
Bai N., Ge G., Li H., Wu Y., Yan A., Wen X.
Proceedings 2025 IEEE 34th Asian Test Symposium Ats 2025 103 - 108 2025年01月
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Software-Defined Secure Island for Testing Chiplet Systems 査読有り 国際誌
Okamoto H., Wang S., Kai H., Yotsuyanagi H., Higami Y., Ni T., Song T., Takahashi H., Wen X.
Proceedings 2025 IEEE 34th Asian Test Symposium Ats 2025 61 - 66 2025年01月
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A Robust Newton Iteration Method for Mixed-Cell-Height Circuit Legalization under Technology and Region Constraints 査読有り 国際誌
Zhou C., Cao Y., Shi Q., Wang L., Wen X.
ACM Transactions on Design Automation of Electronic Systems 29 ( 6 ) 2024年09月
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MURLAV: A Multiple-Node-Upset Recovery Latch and Algorithm-Based Verification Method 査読有り 国際誌
Yan A. (合肥工業大学), Li Z., Gao Z., Zhang J., Huang Z., Ni T., Cui J., Wang X., Girard P., Wen X.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 43 ( 7 ) 2205 - 2214 2024年07月
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A new die-level flexible design-for-test architecture for 3D stacked ICs 査読有り 国際誌
Zhang Q., Zhan W., Wen X.
Integration 97 2024年07月
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Efficient design approaches to CMOS full adder circuits 査読有り 国際誌
Yan A., Bao H., Jiang W., Cui J., Huang Z., Wen X.
Microelectronics Journal 149 2024年07月
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IDLD: Interlocked Dual-Circle Latch Design with Low Cost and Triple-Node-Upset-Recovery for Aerospace Applications 査読有り 国際誌
Yan A., Dong C., Guo X., Song J., Cui J., Ni T., Girard P., Wen X.
Proceedings of the ACM Great Lakes Symposium on VLSI, GLSVLSI 19 - 24 2024年06月
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A Low-Area Overhead and Low-Delay Triple-Node-Upset Self-Recoverable Design Based on Stacked Transistors 査読有り 国際誌
Xu H., Li J., Ma R., Liang H. (合肥工業大学), Liu C., Wang S., Wen X.
IEEE Transactions on Device and Materials Reliability 24 ( 2 ) 302 - 312 2024年06月
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FeMPIM: A FeFET-Based Multifunctional Processing-in-Memory Cell 査読有り 国際誌
Yan A., Chen Y., Gao Z., Ni T., Huang Z., Cui J., Girard P., Wen X.
IEEE Transactions on Circuits and Systems II: Express Briefs 71 ( 4 ) 2299 - 2303 2024年04月
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SwinT-ILT: Swin Transformer embedding end-To-end mask optimization model 査読有り 国際誌
Xu H., Qi P., Tang F., Ma R., Liang H., Huang Z., Wen X.
Journal of Micro/Nanopatterning, Materials and Metrology 23 ( 1 ) 2024年01月
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Nonvolatile Latch Designs With Node-Upset Tolerance and Recovery Using Magnetic Tunnel Junctions and CMOS 査読有り 国際誌
Yan A., Wang L., Cui J., Huang Z., Ni T., Girard P., Wen X.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 32 ( 1 ) 116 - 127 2024年01月
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Test Point Selection for Multi-Cycle Logic BIST using Multivariate Temporal-Spatial GCNs 査読有り 国際誌
Wang S., Wei S., Okamoto H., Nishikawa T., Kai H., Higami Y., Yotsuyanagi H., Ma R., Ni T., Takahashi H., Wen X.
Proceedings Itc Asia 2024 8th IEEE International Test Conference in Asia 2024年01月