研究者詳細 - 温　暁青

論文 - 温　暁青

分割表示269 件中 221 - 240 件目／全件表示 >>

Reducing Power Supply Noise in Linear-Decompressor-Based Test Data Compression Environment for At-Speed Scan Testing 査読有り国際誌

M.-F. Wu,J.-L. Huang,X. Wen,K. Miyase

IEEE International Test Conference Paper 13.1 2008年10月

Turbo1500: Toward Core-Based Design for Test and Diagnosis Using IEEE Std. 1500 査読有り国際誌

L.-T. Wang,R. Apte,S. Wu,B. Sheu,K.-J. Lee,X. Wen,W.-B. Jone,C.-H. Yeh,J. Guo,J. Liu,Y.-C. Sung

IEEE International Test Conference Paper 29.3 2008年10月

On Optimizing Pattern Count and ATPG Time Using A Hybrid Single-Capture Scheme for Testing Scan Designs 査読有り国際誌

B. Sheu,L.-T. Wang,Z. Jiang,J. Soong,S. Wu,R. Apte,X. Wen,C.-M. Li

IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems 143 - 151 2008年10月

Test Strategies for Low-Power Devices 招待有り査読有り国際誌

C. P. Ravikumar,M. Hirech,X. Wen

Journal of Low Power Electronics 4 ( 2 ) 127 - 138 2008年08月

Estimation of Delay Test Quality and Its Application to Test Generation 査読有り国際誌

S. Kajihara,S. Morishima,M. Yamamoto,X. Wen,M. Fukunaga,K. Hatayama,T. Aikyo

IPSJ Transaction of System LSI Design Methodology 1 104 - 115 2008年08月

A Capture-Safe Test Generation Scheme for At-Speed Scan Testing 査読有り国際誌

X. Wen,K. Miyase,S. Kajihara,H. Furukawa,Y. Yamato,A. Takashima,K. Noda,H. Ito,K. Hatayama,T. Aikyo,K. K. Saluja

IEEE European Test Symposium 55 - 60 2008年05月

Diagnosis of Realistic Defects Based on X-Fault Model 査読有り国際誌

I. Polian,Y. Nakamura,P. Engelke,S. Spinner,K. Miyase,S. Kajihara,B. Becker,X. Wen

IEEE International Workshop on Design and Diagnostics of Electronic Circuits and Systems 263 - 266 2008年04月

Test Strategies for Low-Power Devices 招待有り査読有り国際誌

C. P. Ravikumar,M. Hirech,X. Wen

Design Automation, and Test in Europe 728 - 733 2008年03月

VirtualScan: A Test Compression Technology Using Combinational Logic and One-Pass ATPG 査読有り国際誌

L.-T. Wang,X. Wen,S. Wu,Z. Wang,Z. Jiang,B. Sheu,X. Gu

IEEE Design & Test of Computers 25 ( 2 ) 122 - 130 2008年03月

On Detection of Bridge Defects with Stuck-at Tests 査読有り国際誌

K. Miyase,K. Terashima,X. Wen,S. Kajiihara,and S. M Reddy

IEICE Transactions on Information and Systems E91-D ( 3 ) 683 - 689 2008年03月

A Novel Per-Test Fault Diagnosis Method Based On the Extended X-Fault Model for Deep-Submicron LSI Circuits 査読有り国際誌

Y. Yamato,Y. Nakamura,K. Miyase,X. Wen,and S. Kajihara

IEICE Transactions on Information and Systems E91-D ( 3 ) 667 - 674 2008年03月

Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing 査読有り国際誌

X. Wen,K. Miyase,T. Suzuki,S. Kajiihara,L.-T. Wang,K. K. Saluja,K. Kinoshita

Journal of Electronic Testing: Theory and Applications, Special Issue on Low Power Testing 24 ( 4 ) 379 - 391 2008年01月

Estimation of Delay Test Quality and Its Application to Test Generation 査読有り国際誌

S. Kajihara,S. Morishima,M. Yamamoto,X. Wen,M. Fukunaga,K. Hatayama,and T. Aikyo

IEEE/ACM International Conference on Computer Aided Design 413 - 417 2007年11月

A Method for Improving the Bridging Defect Coverage of a Transition Delay Test Set 査読有り国際誌

K. Miyase,X. Wen,S. Kajihara,M. Haraguchi,H. Furukawa

IEEE International Workshop on Defect Based Testing 51 - 56 2007年10月

A Novel Scheme to Reduce Power Supply Noise for High-Quality At-Speed Scan Testing 査読有り国際誌

X. Wen,K. Miyase,S. Kajihara,T. Suzuki,Y. Yamato,P. Girard,Y. Ohsumi,and L.-T. Wang

IEEE International Test Conference 25.1 2007年10月

A Novel ATPG Method for Capture Power Reduction During Scan Testing 査読有り国際誌

X. Wen,S. Kajiihara,K. Miyase,T. Suzuki,K. K. Saluja,L.-T. Wang,K. Kinoshita

IEICE Transactions on Information and Systems E90-D ( 9 ) 1398 - 1405 2007年09月

Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing 査読有り国際誌

X. Wen,K. Miyase,T. Suzuki,S. Kajihara,Y. Ohsumi,K. K. Saluja

IEEE/ACM Design Automation Conference 527 - 532 2007年06月

An Improved Method of Per-Test X-Fault Diagnosis for Deep-Submicron LSI Circuits 査読有り国際誌

X. Wen,Y. Yamato,K. Miyase,S. Kajihara,L.-T. Wang,K. K. Saluja,K. Kinoshita

IEEE Workshop on RTL and High Level Testing 55 - 60 2006年11月

Test Data Compression Based on Clustered Random Access Scan 査読有り国際誌

Y. Hu,C. Li,J. Li,Y. Han,X. Li,W. Wang,H. Li,L.-T. Wang,X. Wen

IEEE Asian Test Symposium 231 - 236 2006年11月

A Per-Test Fault Diagnosis Method Based on the X-Fault Model 査読有り国際誌

X. Wen,S. Kajiihara,K. Miｙase,Y. Yamato,L.-T. Wang,K. K. Saluja,K. Kinoshita

IEICE Transactions on Information and Systems E89-D ( 11 ) 2756 - 2765 2006年11月

　前のページ - 次のページ　

<温 暁青>

論文 - 温 暁青

<温　暁青>

論文 - 温　暁青