論文 - 温 暁青
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LSI回路の低キャプチャ電力テスト生成技術 招待有り 査読有り
温暁青
情報・システムソサイエティ誌 ( 電子情報通信学会 情報・システムソサイエティ ) 14 ( 2 ) 16 - 16 2009年08月
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On Calculation of Delay Range in Fault Simulation for Test Cubes 査読有り 国際誌
S. Oku,S. Kajihara,K. Miyase,X. Wen,Y. Sato
International Symposium on VLSI Design, Automation, and Test 64 - 67 2009年04月
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Power-Aware Test Generation for Reducing Yield Loss Risk in At-Speed Scan Testing 招待有り 査読有り 国際誌
Y. Yamato,X. Wen,K. Miyase,H. Furukawa,S. Kajihara
Metrology, Reliability and Testing (International Semiconductor Technology Conference & China Semiconductor Technology International Conference) 231 - 236 2009年03月
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Turbo1500: Core-Based Design for Test and Diagnosis Using IEEE Std. 1500 査読有り 国際誌
L..-T. Wang,R. Apte,S. Wu,B. Sheu,K.-J. Lee,X. Wen,W.-B. Jone,C.-H. Yeh,J. Guo,J. Liu,Y.-C. Sung
IEEE Design & Test of Computers 26 ( 1 ) 26 - 35 2009年01月
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On Delay Calculation in 3-valued Fault Simulation 査読有り 国際誌
S. Oku,S. Kajihara,K. Miyase,X. Wen,Y. Sato
IEEE Workshop on RTL and High Level Testing 123 - 128 2008年11月
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Practical Challenges in Logic BIST Implementation Case Studies 査読有り 国際誌
S. Wu,H. Furukawa,B. Sheu,L.-T. Wang,H.-J. Chao,L. Yu,X. Wen,M. Murakami
IEEE Asian Test Symposium 265 - 265 2008年11月
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CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme for Reducing Yield Loss Risk in At-Speed Scan Testing 査読有り 国際誌
H. Furukawa,X. Wen,K. Miyase,Yuta Yamato,S. Kajihara,Patrick Girard,L.-T. Wang,M. Teharanipoor
IEEE Asian Test Symposium 397 - 402 2008年11月
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Effective IR-Drop Reduction in At-Speed Scan Testing Using Distribution-Controlling X-Identification 査読有り 国際誌
K. Miyase,K. Noda,H. Ito,K. Hatayama,T. Aikyo,Y. Yamato,H. Furukawa,X. Wen,S. Kajihara
IEEE/ACM International Conference on Computer Aided Design 52 - 58 2008年11月
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GA-Based X-Filling for Reducing Launch Switching Activity in At-Speed Scan Testing 査読有り 国際誌
Y. Yamato,X. Wen,K. Miyase,H. Furukawa,S. Kajihara
IEEE Workshop on Defect and Date Driven Testing 4 Pages 2008年10月
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Identification of IR-drop Hot-spots in Defective Power Distribution Network Using TDF ATPG 査読有り 国際誌
J. Ma,J. Lee,M. Tehranipoor,X. Wen,A. Crouch
IEEE Workshop on Defect and Date Driven Testing 7 Pages 2008年10月
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Reducing Power Supply Noise in Linear-Decompressor-Based Test Data Compression Environment for At-Speed Scan Testing 査読有り 国際誌
M.-F. Wu,J.-L. Huang,X. Wen,K. Miyase
IEEE International Test Conference Paper 13.1 2008年10月
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Turbo1500: Toward Core-Based Design for Test and Diagnosis Using IEEE Std. 1500 査読有り 国際誌
L.-T. Wang,R. Apte,S. Wu,B. Sheu,K.-J. Lee,X. Wen,W.-B. Jone,C.-H. Yeh,J. Guo,J. Liu,Y.-C. Sung
IEEE International Test Conference Paper 29.3 2008年10月
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On Optimizing Pattern Count and ATPG Time Using A Hybrid Single-Capture Scheme for Testing Scan Designs 査読有り 国際誌
B. Sheu,L.-T. Wang,Z. Jiang,J. Soong,S. Wu,R. Apte,X. Wen,C.-M. Li
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems 143 - 151 2008年10月
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Test Strategies for Low-Power Devices 招待有り 査読有り 国際誌
C. P. Ravikumar,M. Hirech,X. Wen
Journal of Low Power Electronics 4 ( 2 ) 127 - 138 2008年08月
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Estimation of Delay Test Quality and Its Application to Test Generation 査読有り 国際誌
S. Kajihara,S. Morishima,M. Yamamoto,X. Wen,M. Fukunaga,K. Hatayama,T. Aikyo
IPSJ Transaction of System LSI Design Methodology 1 104 - 115 2008年08月
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A Capture-Safe Test Generation Scheme for At-Speed Scan Testing 査読有り 国際誌
X. Wen,K. Miyase,S. Kajihara,H. Furukawa,Y. Yamato,A. Takashima,K. Noda,H. Ito,K. Hatayama,T. Aikyo,K. K. Saluja
IEEE European Test Symposium 55 - 60 2008年05月
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Diagnosis of Realistic Defects Based on X-Fault Model 査読有り 国際誌
I. Polian,Y. Nakamura,P. Engelke,S. Spinner,K. Miyase,S. Kajihara,B. Becker,X. Wen
IEEE International Workshop on Design and Diagnostics of Electronic Circuits and Systems 263 - 266 2008年04月
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Test Strategies for Low-Power Devices 招待有り 査読有り 国際誌
C. P. Ravikumar,M. Hirech,X. Wen
Design Automation, and Test in Europe 728 - 733 2008年03月
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VirtualScan: A Test Compression Technology Using Combinational Logic and One-Pass ATPG 査読有り 国際誌
L.-T. Wang,X. Wen,S. Wu,Z. Wang,Z. Jiang,B. Sheu,X. Gu
IEEE Design & Test of Computers 25 ( 2 ) 122 - 130 2008年03月
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On Detection of Bridge Defects with Stuck-at Tests 査読有り 国際誌
K. Miyase,K. Terashima,X. Wen,S. Kajiihara,and S. M Reddy
IEICE Transactions on Information and Systems E91-D ( 3 ) 683 - 689 2008年03月